thermionic vacuum arc
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2021 ◽  
pp. 1-6
Author(s):  
Suat Pat ◽  
Reza Mohammadigharehbagh ◽  
Caner Musaoglu ◽  
Soner Özen ◽  
Şadan Korkmaz

2021 ◽  
Vol 30 (1) ◽  
pp. 015006
Author(s):  
I-L Velicu ◽  
V Tiron ◽  
M-A Petrea ◽  
G Popa

2021 ◽  
Vol 43 (3) ◽  
pp. 253-253
Author(s):  
Mehmet zkan Mehmet zkan ◽  
Sercen Sadik Erdem Sercen Sadik Erdem

In this paper, silver (Ag)doped Zinc Oxide(ZnO) thin films were prepared on glass and silicon substrate by using a thermionic vacuum arc technique. The surface, structural, optical characteristics of silver doped thin films have been examined by X-Ray diffractometer (XRD), field emission scanning emission electron microscopy (FESEM), atomic force microscopy (AFM), and UV-Visible spectrophotometer. As a result of these measurements, Ag, Zn and ZnO reflection planes were determined for thin films formed on Si and glass substrate. Nano crystallites have emerged in FESEM and AFM images. The produced films have low transparency. The optical band gap values were measured by photoluminescence devices at room temperature for thin films produced on silicon and glass substrate. The band gap values are very close to 3.10 eV for Ag doped ZnO thin films. The band gap of un-doped ZnO thin film is approximately 3.3 eV. It was identified that Ag doped changes the properties of the ZnO thin film.


2021 ◽  
Vol 263 ◽  
pp. 114872
Author(s):  
Hüseyin Kaan Kaplan ◽  
Sertan Kemal Akay ◽  
Suat Pat ◽  
Mohamed Henini

2020 ◽  
Vol 9 (6) ◽  
pp. 061016
Author(s):  
Suat Pat ◽  
Nihan Akkurt ◽  
Reza Mohammadigharehbagh ◽  
Ali Olkun ◽  
Uğur Demirkol ◽  
...  

Materials ◽  
2020 ◽  
Vol 13 (7) ◽  
pp. 1796
Author(s):  
Sebastian Cozma ◽  
Rodica Vlǎdoiu ◽  
Aurelia Mandes ◽  
Virginia Dinca ◽  
Gabriel Prodan ◽  
...  

The current work aimed to characterize the morphology, chemical, and mechanical properties of Pt and PtTi thin films deposited via thermionic vacuum arc (TVA) method on glass and silicon substrates. The deposited thin films were characterized by means of a scanning electron microscope technique (SEM). The quantitative elemental microanalysis was done using energy-dispersive X-ray spectroscopy (EDS). The tribological properties were studied by a ball-on-disc tribometer, and the mechanical properties were measured using nanoindentation tests. The roughness, as well as the micro and nanoscale features, were characterized using atomic force microscopy (AFM) and transmission electron microscopy (TEM). The wettability of the deposited Pt and PtTi thin films was investigated by the surface free energy evaluation (SFE) method. The purpose of our study was to prove the potential applications of Pt-based thin films in fields, such as nanoelectronics, fuel cells, medicine, and materials science.


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