Effect of contact stiffness modulation in contact-mode AFM under subharmonic excitation

2013 ◽  
Vol 18 (10) ◽  
pp. 2916-2925 ◽  
Author(s):  
Ilham Kirrou ◽  
Mohamed Belhaq
Keyword(s):  
Contact Stiffness ◽  
Contact Mode ◽  
Subharmonic Excitation

Analysis on the Contact Mechanics between Tip and Sample in Atomic Force Acoustic Microscope Method

2013 ◽  
Vol 800 ◽  
pp. 325-329
Author(s):  
Gai Mei Zhang ◽  
Li Ping Yang ◽  
Chen Qiang ◽  
Yuan Wei ◽  
Jian Dong Lu ◽  
...  
Keyword(s):  
Contact Stiffness ◽  
Sample Surface ◽  
Acoustic Microscopy ◽  
Contact Model ◽  
Contact Theory ◽  
Ultrasonic Technique ◽  
Contact Mode ◽  
Atomic Force ◽  
Resonance Frequencies ◽  
Afm Probe

Atomic force acoustic microscopy (AFAM) is a technique combining the atomic force microscope (AFM) and ultrasonic technique, where the cantilever or the sample surface is vibrated at ultrasonic frequencies while a sample surface is scanned with the sensor tip contacting the sample. At a consequence, the amplitude of the cantilever vibration as well as the shift of the cantilever resonance frequencies contain information about local tip-sample contact stiffness and can be used as imaging quantities. It has been demonstrated to be a powerful tool for the investigation of the local elastic prosperities of sample surface. The sample is tested in the contact mode, the resonant frequency of the cantilever is measured, by which the contact stiffness is calculated based on the model of vibration of the cantilever, and then the elastic property of sample is evaluated according to the contact theory. Therefore, the contact model has an important impact on the calculation of elastic modulus. This paper analyzes the contact model between the AFM probe and the sample, and it is investigated based on finite element method (FEM) that the results of the test are affected by parameters.

Modal Interactions in Contact-Mode Atomic Force Microscopes

2006 ◽  
Author(s):  
Haider N. Arafat ◽  
Ali H. Nayfeh ◽  
Elihab M. Abdel-Rahman
Keyword(s):  
Multiple Scales ◽  
Contact Stiffness ◽  
Quality Factors ◽  
Modal Interactions ◽  
Internal Resonances ◽  
Approximate Analytical Expression ◽  
Contact Mode ◽  
Linear Coefficient ◽  
Atomic Force Microscopes ◽  
Atomic Force

Atomic force microscopes (AFM) are used to estimate material and surface properties. When using contact-mode AFM, the specimen or the probe is excited near a natural frequency of the system to estimate the linear coefficient of the contact stiffness. Because higher modes offer lower thermal noise, higher quality factors, and higher sensitivity to stiff samples, their use in this procedure is more desirable. However, these modes are candidates for internal resonances, where the energy being fed into one mode may be channeled to another mode. If such interactions are ignored, the results obtained from the probe may be distorted. The method of multiple scales is used to derive an approximate analytical expression to the probe response in the presence of two-to-one autoparametric resonance between the second and third modes. We examine characteristics of this solution in relation to a single-mode response and consider its implications in AFM measurements.

Surface roughness measurements of vanadium-contaminated fluidized cracking catalysts by atomic force microscopy

1996 ◽  
Vol 54 ◽  
pp. 866-867
Author(s):  
H. Kinney ◽  
M.L. Occelli ◽  
S.A.C. Gould
Keyword(s):  
Surface Roughness ◽  
Zeolite Y ◽  
Atomic Level ◽  
Microporous Structure ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Before And After ◽  
Roughness Measurements ◽  
Cracking Catalysts

For this study we have used a contact mode atomic force microscope (AFM) to study to topography of fluidized cracking catalysts (FCC), before and after contamination with 5% vanadium. We selected the AFM because of its ability to well characterize the surface roughness of materials down to the atomic level. It is believed that the cracking in the FCCs occurs mainly on the catalysts top 10-15 μm suggesting that the surface corrugation could play a key role in the FCCs microactivity properties. To test this hypothesis, we chose vanadium as a contaminate because this metal is capable of irreversibly destroying the FCC crystallinity as well as it microporous structure. In addition, we wanted to examine the extent to which steaming affects the vanadium contaminated FCC. Using the AFM, we measured the surface roughness of FCCs, before and after contamination and after steaming.We obtained our FCC (GRZ-1) from Davison. The FCC is generated so that it contains and estimated 35% rare earth exchaged zeolite Y, 50% kaolin and 15% binder.

Response Rates in Online Surveys With Affective Disorder Participants

2020 ◽  
Vol 228 (1) ◽  
pp. 14-24 ◽  
Author(s):  
Tanja Burgard ◽  
Michael Bošnjak ◽  
Nadine Wedderhoff
Keyword(s):  
Meta Analysis ◽  
Response Rates ◽  
Contact Mode ◽  
General Anxiety Disorder ◽  
General Anxiety ◽  
Face To Face ◽  
Survey Participation ◽  
The Mean ◽  
Design Characteristics ◽  
E Mail

Abstract. A meta-analysis was performed to determine whether response rates to online psychology surveys have decreased over time and the effect of specific design characteristics (contact mode, burden of participation, and incentives) on response rates. The meta-analysis is restricted to samples of adults with depression or general anxiety disorder. Time and study design effects are tested using mixed-effects meta-regressions as implemented in the metafor package in R. The mean response rate of the 20 studies fulfilling our meta-analytic inclusion criteria is approximately 43%. Response rates are lower in more recently conducted surveys and in surveys employing longer questionnaires. Furthermore, we found that personal invitations, for example, via telephone or face-to-face contacts, yielded higher response rates compared to e-mail invitations. As predicted by sensitivity reinforcement theory, no effect of incentives on survey participation in this specific group (scoring high on neuroticism) could be observed.

Liquid-Phase Peak Force Infrared Microscopy

2020 ◽  
Author(s):  
Haomin Wang ◽  
Joseph M. González-Fialkowski ◽  
Wenqian Li ◽  
Yan Yu ◽  
Xiaoji Xu
Keyword(s):  
Liquid Phase ◽  
Spatial Resolution ◽  
Shear Force ◽  
Polymer Surface ◽  
Surface Damage ◽  
Peak Force ◽  
Infrared Microscopy ◽  
Contact Mode ◽  
Force Microscopy ◽  
Hydrogen Deuterium

Atomic force microscopy-infrared microscopy (AFM-IR) provides a route to bypass Abbe’s diffraction limit through photothermal detections of infrared absorption. With the combination of total internal reflection, AFM-IR can operate in the aqueous phase. However, AFM-IR in contact mode suffers from surface damage from the lateral shear force between the tip and sample, and can only achieve 20~25-nm spatial resolution. Here, we develop the liquid-phase peak force infrared (LiPFIR) microscopy that avoids the detrimental shear force and delivers an 8-nm spatial resolution. The non-destructiveness of the LiPFIR microscopy enables <i>in situ</i> chemical measurement of heterogeneous materials and investigations on a range of chemical and physical transformations, including polymer surface reorganization, hydrogen-deuterium isotope exchange, and ethanol-induced denaturation of proteins. We also perform LiPFIR imaging of the budding site of yeast cell wall in the fluid as a demonstration of biological applications. LiPFIR unleashes the potential of in liquid AFM-IR for chemical nanoscopy.

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