The atomic scale structure of nanographene platelets studied by X-ray diffraction, high-resolution transmission electron microscopy and molecular dynamics

2013 ◽  
Vol 35 ◽  
pp. 40-46 ◽  
Author(s):  
L. Hawelek ◽  
A. Kolano-Burian ◽  
J. Szade ◽  
W. Maziarz ◽  
N. Woznica ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Molecular Dynamics ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Scale Structure ◽  
Atomic Scale ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Atomic Scale Structure

A High Resolution Study of G.P. Zones in Aluminum - 4.2 at % Silver

1982 ◽  
Vol 40 ◽  
pp. 722-723 ◽  
Author(s):  
R. Gronsky
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Computer Simulations ◽  
Structural Characteristics ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Resolution Study

The phenomenon of clustering in Al-Ag alloys has been extensively studied since the early work of Guinierl, wherein the pre-precipitation state was characterized as an assembly of spherical, ordered, silver-rich G.P. zones. Subsequent x-ray and TEM investigations yielded results in general agreement with this model. However, serious discrepancies were later revealed by the detailed x-ray diffraction - based computer simulations of Gragg and Cohen, i.e., the silver-rich clusters were instead octahedral in shape and fully disordered, atleast below 170°C. The object of the present investigation is to examine directly the structural characteristics of G.P. zones in Al-Ag by high resolution transmission electron microscopy.

Microstructural analysis of high-pressure compressed C60

2001 ◽  
Vol 16 (7) ◽  
pp. 1960-1966 ◽  
Author(s):  
K. Miyazawa ◽  
H. Satsuki ◽  
M. Kuwabara ◽  
M. Akaishi
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Pressure ◽  
High Resolution ◽  
Microstructural Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Hardness Tests ◽  
Lattice Planes

The structure and hardness of C60 bulk specimens compressed under 5.5 GPa at room temperature to 600 °C are investigated by high-resolution transmission electron microscopy, x-ray diffraction, and micro-Vickers hardness tests. A strong accumulation of the [1 1 0]tr orientation of high-pressure-treated C60 specimens was developed along the compression axis, and stacking faults and nano-sized deformation twins were introduced into the C60 specimens compressed at 450–600 °C. Curved lattice planes indicating a polymerization of C60 were observed by high resolution transmission electron microscopy (HRTEM). The polymerization of the high-pressure-compressed C60 is also supported by the computer simulation of HRTEM images.

Double Periodicity Formation in EuTe/PbTe Superlattices

1995 ◽  
Vol 399 ◽  
Author(s):  
M. Shima ◽  
L. Salamanca-Riba ◽  
G. Springholz ◽  
G. Bauer
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Molecular Beam Epitaxy ◽  
Molecular Beam ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Short Period ◽  
Short Period Superlattices

ABSTRACTMolecular beam epitaxy was used to grow EuTe(x)/PbTe(y) short period superlattices with x=1-4 EuTe(111) monolayers alternating with y≈3x PbTe monolayers. The superlattices were characterized by transmission electron microscopy and high resolution x-ray diffraction. Regions with double periodicity were observed coexisting with areas of nominal periodicity. The sample with x=3.5 and y=9, for example, contains regions with double periodicity of x=7 and y=17. X-ray diffraction measurements confirm the formation of the double periodicity in these samples by the appearance of weak satellites in between the satellites of the nominal periodicity. The double periodicity in the superlattice is believed to result from interdiffusion during the growth. A model for this process is presented.

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