Microstructural analysis of high-pressure compressed C60
2001 ◽
Vol 16
(7)
◽
pp. 1960-1966
◽
Keyword(s):
X Ray
◽
The structure and hardness of C60 bulk specimens compressed under 5.5 GPa at room temperature to 600 °C are investigated by high-resolution transmission electron microscopy, x-ray diffraction, and micro-Vickers hardness tests. A strong accumulation of the [1 1 0]tr orientation of high-pressure-treated C60 specimens was developed along the compression axis, and stacking faults and nano-sized deformation twins were introduced into the C60 specimens compressed at 450–600 °C. Curved lattice planes indicating a polymerization of C60 were observed by high resolution transmission electron microscopy (HRTEM). The polymerization of the high-pressure-compressed C60 is also supported by the computer simulation of HRTEM images.
1982 ◽
Vol 40
◽
pp. 722-723
◽
2001 ◽
Vol 145
(1-4)
◽
pp. 325-331
◽
2009 ◽
Vol 42
(6)
◽
pp. 1085-1091
◽
2006 ◽
Vol 78
(9)
◽
pp. 1651-1665
◽