Growth and comparison of high-quality MW-PECVD grown B doped diamond layers on {118}, {115} and {113} single crystal diamond substrates

2022 ◽  
pp. 108815
Author(s):  
Andrew Taylor ◽  
Simona Baluchová ◽  
Ladislav Fekete ◽  
Ladislav Klimša ◽  
Jaromír Kopeček ◽  
...  
2017 ◽  
Vol 24 (1) ◽  
pp. 103-109 ◽  
Author(s):  
Sergey Terentyev ◽  
Maxim Polikarpov ◽  
Irina Snigireva ◽  
Marco Di Michiel ◽  
Sergey Zholudev ◽  
...  

Linear parabolic diamond refractive lenses are presented, designed to withstand high thermal and radiation loads coming from upgraded accelerator X-ray sources. Lenses were manufactured by picosecond laser treatment of a high-quality single-crystal synthetic diamond. Twelve lenses with radius of curvature at parabola apex R = 200 µm, geometrical aperture A = 900 µm and length L = 1.5 mm were stacked as a compound refractive lens and tested at the ESRF ID06 beamline. A focal spot of size 2.2 µm and a gain of 20 were measured at 8 keV. The lens profile and surface quality were estimated by grating interferometry and X-ray radiography. In addition, the influence of X-ray glitches on the focusing properties of the compound refractive lens were studied.


2006 ◽  
Vol 956 ◽  
Author(s):  
William Joseph Yost

ABSTRACTThe desire to exploit the extreme properties which differentiate diamond from other, more mature wide bandgap technologies has recently been given further impetus by the development of high quality single crystal CVD diamond material [1].To realise the significant potential of diamond devices over existing device technology depends on completing a number of key objectives, in particular providing:(a). access in volume to high quality, ultra-high purity, single crystal material,(b). the capability to provide carriers by doping the material in a controlled manner,(c). the ability to process thin layers and structures.Providing access to bulk single crystal diamond (albeit not electronic grade material) has already been largely achieved and plates are commercially available for cutting applications [2]. Routes to providing suitable charge carriers are being widely investigated. Although intrinsic diamond can have exceptional electronic properties [1], in reports of both p-type and n-type diamond [3,4] the dopants are very deep (0.37 eV and 0.6 eV for boron and phosphorous respectively), which limits the realisation of conventional electronic devices operating at ambient temperatures.A series of novel devices undergone preliminary experimental evaluation. Devices made up of boron and intrinsic layers, where the boron concentration exceeds the limit of metallic conduction (>1×1020 cm−3), offer carrier diffusion at room temperature from the highly doped regions with low mobility, into adjacent regions of intrinsic material with high carrier mobility [5]. To provide the required device performance, the interface between the doped and intrinsic layers needs to be defect free and to change doping levels by several orders of magnitude in a few atomic layers.Although progress over the last few years has been rapid, there remain substantial technical challenges ahead for the realisation of large scale diamond active electronics. This paper will identify and review progress against these key issues.


MRS Bulletin ◽  
2014 ◽  
Vol 39 (6) ◽  
pp. 504-510 ◽  
Author(s):  
Matthias Schreck ◽  
Jes Asmussen ◽  
Shinichi Shikata ◽  
Jean-Charles Arnault ◽  
Naoji Fujimori

Abstract


2009 ◽  
Vol 1203 ◽  
Author(s):  
Mose Bevilacqua ◽  
Richard B. Jackman

AbstractDeep UV detection using a single crystal diamond (SCD) substrate without a homoepitaxial layer has been demonstrated using a defect passivation treatment. Despite evidence of surface damage on the SCD, the treatments lead to highly effective photoconductive devices, displaying six-orders of discrimination between deep UV and visible light and a responsivity as high as 100A/W, equivalent to an external quantum efficiency of 700, similar to the best values for devices based on high quality homoepitaxial layers. Impedance spectroscopic investigations suggest that the treatment used reduces the impact of less resistive surface material, most likely defects left from substrate polishing.


2015 ◽  
Vol 12 (3/4) ◽  
pp. 226 ◽  
Author(s):  
V.P. Popov ◽  
A.K. Gutakovskii ◽  
V.A. Antonov ◽  
S.N. Podlesnyi ◽  
I.N. Kupriyanov ◽  
...  

2014 ◽  
Vol 5 (1) ◽  
Author(s):  
Michael J. Burek ◽  
Yiwen Chu ◽  
Madelaine S. Z. Liddy ◽  
Parth Patel ◽  
Jake Rochman ◽  
...  

2010 ◽  
Author(s):  
Ian Friel ◽  
Sarah L. Geoghegan ◽  
Daniel J. Twitchen ◽  
Geoffrey A. Scarsbrook

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