Deformation mechanisms and mechanical performances of architected mechanical metamaterials with gyroid topologies: Synchrotron X-ray radiation in-situ compression experiments and 3D image based finite element analysis

2021 ◽  
pp. 101229
Author(s):  
Wenxia Hu ◽  
Xiaofei Cao ◽  
Xiaoqiang Zhang ◽  
Zhixin Huang ◽  
Zihao Chen ◽  
...  
Keyword(s):  
Finite Element Analysis ◽  
Finite Element ◽  
Deformation Mechanisms ◽  
3D Image ◽  
Element Analysis ◽  
X Ray ◽  
Mechanical Metamaterials ◽  
Mechanical Performances

scholarly journals Effect of Argon-Purged Cooling on Generating Residual Stress in Oxide Scale Formed on Si-Containing Steels Examined by In Situ X-ray Diffraction and Finite Element Analysis

2020 ◽  
Vol 61 (1) ◽  
pp. 136-141
Author(s):  
Koji Sasaki ◽  
Kazushi Hayashi ◽  
Mikako Takeda ◽  
Shohei Nakakubo ◽  
Yohei Yamada ◽  
...  
Keyword(s):  
Residual Stress ◽  
Finite Element Analysis ◽  
Finite Element ◽  
Oxide Scale ◽  
X Ray Diffraction ◽  
Element Analysis ◽  
X Ray

Comparison of Stresses in Al Lines Under Various Passivations

1997 ◽  
Vol 473 ◽  
Author(s):  
S. Lee ◽  
J. C. Bravman ◽  
P. A. Flinn ◽  
T. N. Marffib
Keyword(s):  
Finite Element Analysis ◽  
Finite Element ◽  
Stress Relaxation ◽  
High Voltage ◽  
Thermal Stresses ◽  
Test Results ◽  
Element Analysis ◽  
X Ray

ABSTRACTThermal stresses in pure Al lines passivated with a baseline 1000Å oxide and additional passivations of 0.5μm oxide, 1μm polymer, or 0.5μm, 1μm, or 2μ nitride were analyzed. Results from finite element analysis and X-ray measurements were compared, and samples were examined in a high voltage SEM for stress voids. For unvoided samples, calculated and measured results showed good correlation, while results for the voided samples showed little correlation due to stress relaxation through voiding. Initial in-situ electromigration test results showed that electromigration voids can occur at stress void sites.

Evaluation of Strain Measurement in a Die-to-Interposer Chip Using In Situ Synchrotron X-Ray Diffraction and Finite-Element Analysis

2013 ◽  
Vol 43 (1) ◽  
pp. 52-56 ◽  
Author(s):  
Hsueh-Hsien Hsu ◽  
Tz-Cheng Chiu ◽  
Tao-Chih Chang ◽  
Shin-Yi Huang ◽  
Hsin-Yi Lee ◽  
...  
Keyword(s):  
Finite Element Analysis ◽  
Finite Element ◽  
Strain Measurement ◽  
X Ray Diffraction ◽  
Element Analysis ◽  
X Ray

Finite element analysis of a scanning x‐ray microscope micropositioning stage

1992 ◽  
Vol 63 (1) ◽  
pp. 591-594 ◽  
Author(s):  
H. T. H. Chen ◽  
W. Ng ◽  
R. L. Engelstad
Keyword(s):  
Finite Element Analysis ◽  
Finite Element ◽  
Element Analysis ◽  
X Ray
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