The CO2 cost pass-through and environmental effectiveness in emission trading schemes

We quantify the impact of the European Emission Trading Scheme (ETS) on the two dimensions of competitiveness - production and profitability - for the iron and steel industry. Among those covered by the scheme, this sector is one of the most exposed, since it is both highly CO2-intensive and relatively open to international trade. We also examine the robustness of these results to various assumptions: marginal abatement cost curve, trade and demand elasticities, as well as pass-through rates and updating of allocation rules, of which the latter two are scarcely debated. We conclude that for this sector, competitiveness losses are small. We prove this conclusion to be robust. Hence arguments against tightening the environmental stringency of the ETS in Phase II are not justified on grounds of competitiveness loss. Our systematic sensitivity analysis allows us to identify the important assumptions for each output variable. It turns out that pass-through rates and updating rules are significant, despite being often implicit and least debated in existing analyses. © 2007 Elsevier B.V. All rights reserved.

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Carbon Finance and Emission Trading in Mexico: Building Lessons from the CDM Experience and FOMECAR (Mexican Carbon Fund)

Springer Climate - Towards an Emissions Trading System in Mexico: Rationale, Design and Connections with the Global Climate Agenda ◽

10.1007/978-3-030-82759-5_8 ◽

2021 ◽

pp. 151-167

Author(s):

Simone Lucatello ◽

José Eduardo Tovar Flores

Keyword(s):

Emission Trading ◽

Trading System ◽

Design Elements ◽

Single Top ◽

General Lesson ◽

Carbon Fund ◽

Carbon Finance ◽

Pass Through ◽

Starting Process

AbstractA more general lesson from the past decade is that climate policy and carbon initiatives such as ETS and carbon pricing are not static concepts, but are instead constantly evolving and building upon previous experiences. The vision of a single, top-down global trading system has shifted toward the reality of various single and regional trading system programmes. Building a national emission trading system in Mexico will surely pass through processes and experiences that the country has somehow undertaken from the Kyoto Protocol (KP) in 2005, particularly with the Clean Development Mechanism (CDM), the Mexican Carbon Fund (FOMECAR) and their legacy. Additional design elements or provisions must be prepared under the new ETS in Mexico: regulation will possibly include definitions, scope, compliance obligation, legal procedures and other necessary provisions such as the allocation of permits. However, in order to start the process, important questions on financing the initiative and accompanying the development of an ETS will go through a finance support scenario. Thus, who is going to finance the starting process for allocating emissions, financing bonds and other design issues for the implementation of the Mexican ETS? Who will be financing and offering technical cooperation to follow up on eligible projects for the ETS and who will be supporting education and information activities about ETS implementation? Those and other questions will be addressed in this article, in the light of international and regional experiences.

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Instrumentation for detecting channelling radiation in the high-voltage electron microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100075385 ◽

1983 ◽

Vol 41 ◽

pp. 318-319

Author(s):

J. H. Butler ◽

C. J. Humphreys

Keyword(s):

Monochromatic Light ◽

Incident Beam ◽

Laboratory Frame ◽

Relativistic Electrons ◽

Voltage Electron ◽

Dipole Emission ◽

Sinusoidal Oscillations ◽

Pass Through ◽

Incident Beam Energy ◽

Increasing Function

Electromagnetic radiation is emitted when fast (relativistic) electrons pass through crystal targets which are oriented in a preferential (channelling) direction with respect to the incident beam. In the classical sense, the electrons perform sinusoidal oscillations as they propagate through the crystal (as illustrated in Fig. 1 for the case of planar channelling). When viewed in the electron rest frame, this motion, a result of successive Bragg reflections, gives rise to familiar dipole emission. In the laboratory frame, the radiation is seen to be of a higher energy (because of the Doppler shift) and is also compressed into a narrower cone of emission (due to the relativistic “searchlight” effect). The energy and yield of this monochromatic light is a continuously increasing function of the incident beam energy and, for beam energies of 1 MeV and higher, it occurs in the x-ray and γ-ray regions of the spectrum. Consequently, much interest has been expressed in regard to the use of this phenomenon as the basis for fabricating a coherent, tunable radiation source.

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Radiation Damage, Contrast and Statistics in High Resolution Biological Electron Microscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100068291 ◽

1970 ◽

Vol 28 ◽

pp. 260-261

Author(s):

Robert M. Glaeser

Keyword(s):

High Resolution ◽

Particle Flux ◽

Unit Area ◽

Signal To Noise ◽

Resolution Image ◽

High Resolution Image ◽

Pass Through ◽

Counting Statistics ◽

The Relationship ◽

Picture Element

It is well known that a large flux of electrons must pass through a specimen in order to obtain a high resolution image while a smaller particle flux is satisfactory for a low resolution image. The minimum particle flux that is required depends upon the contrast in the image and the signal-to-noise (S/N) ratio at which the data are considered acceptable. For a given S/N associated with statistical fluxtuations, the relationship between contrast and “counting statistics” is s131_eqn1, where C = contrast; r2 is the area of a picture element corresponding to the resolution, r; N is the number of electrons incident per unit area of the specimen; f is the fraction of electrons that contribute to formation of the image, relative to the total number of electrons incident upon the object.

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A New High Intensity Grid Cap for RCA-EMU-3 Electron Microscopes

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100101323 ◽

1968 ◽

Vol 26 ◽

pp. 316-317

Author(s):

George Christov ◽

Bolivar J. Lloyd

Keyword(s):

Electron Beam ◽

Electron Microscope ◽

High Voltage ◽

High Intensity ◽

Electron Gun ◽

Tungsten Filament ◽

Fluorescent Screen ◽

Electron Microscopes ◽

Pass Through ◽

Ground Potential

A new high intensity grid cap has been designed for the RCA-EMU-3 electron microscope. Various parameters of the new grid cap were investigated to determine its characteristics. The increase in illumination produced provides ease of focusing on the fluorescent screen at magnifications from 1500 to 50,000 times using an accelerating voltage of 50 KV.The EMU-3 type electron gun assembly consists of a V-shaped tungsten filament for a cathode with a thin metal threaded cathode shield and an anode with a central aperture to permit the beam to course the length of the column. The cathode shield is negatively biased at a potential of several hundred volts with respect to the filament. The electron beam is formed by electrons emitted from the tip of the filament which pass through an aperture of 0.1 inch diameter in the cap and then it is accelerated by the negative high voltage through a 0.625 inch diameter aperture in the anode which is at ground potential.

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Immunocytochemical localization of p65 with one-nanometer gold particles following silver development

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010015719x ◽

1989 ◽

Vol 47 ◽

pp. 1042-1043

Author(s):

Richard W. Burry ◽

Diane M. Hayes

Keyword(s):

Plasma Membrane ◽

Bovine Serum Albumin ◽

Calf Serum ◽

Specific Protein ◽

Immunocytochemical Localization ◽

Electron Microscopic ◽

Gold Particles ◽

Pass Through ◽

Label Distribution ◽

Phosphate Buffered Saline

Electron microscopic (EM) immunocytochemistry localization of the neuron specific protein p65 could show which organelles contain this antigen. Antibodies (Ab) labeled with horseradish peroxidase (HRP) followed by chromogen development show a broad diffuse label distribution within cells and restricting identification of organelles. Particulate label (e.g. 10 nm colloidal gold) is highly desirable but not practical because penetration into cells requires destroying the plasma membrane. We report pre-embedding immunocytochemistry with a particulate marker, 1 nm gold, that will pass through membranes treated with saponin, a mild detergent.Cell cultures of the rat cerebellum were fixed in buffered 4% paraformaldehyde and 0.1% glutaraldehyde (Glut.). The buffer for all incubations and rinses was phosphate buffered saline with: 1% calf serum, 0.2% saponin, 0.1% gelatin, 50 mM glycine 1 mg/ml bovine serum albumin, and (not in the HRP labeled cultures) 0.02% sodium azide. The monoclonal #48 to p65 was used with three label systems: HRP, 1 nm avidin gold with IntenSE M development, and 1 nm avidin gold with Danscher development.

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Is there an electron wind?

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010017712x ◽

1990 ◽

Vol 48 (4) ◽

pp. 798-799

Author(s):

L. D. Marks ◽

J. P. Zhang

Keyword(s):

Electron Microscopy ◽

High Resolution Electron Microscopy ◽

Zone Axis ◽

Electron Holography ◽

Electron Wave ◽

Small Particles ◽

Resolution Electron ◽

Pass Through ◽

Electron Wind ◽

Inelastic Scatter

A not uncommon question in electron microscopy is what happens to the momentum transferred by the electron beam to a crystal. If the beam passes through a crystal and is preferentially diffracted in one direction, is the momentum ’lost’ by the beam transferred to the crystal? Newton’s third law implies that this must be the case. Some experimental observations also indicate that this is the case; for instance, with small particles if the particles are supported on the top surface of a film they often do not line up on the zone axis, but if they are on the bottom they do. However, if momentum is transferred to the crystal, then surely we are dealing with inelastic scattering, not elastic scattering and is not the scattering probability different? In addition, normally we consider inelastic scatter as incoherent, and therefore the part of the electron wave that is inelastically scattered will not coherently interfere with the part of the wave that is scattered; but, electron holography and high resolution electron microscopy work so the wave passing through a specimen must be coherent with the wave that does not pass through the specimen.

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