Failure analysis of steel ball in the brake operating cylinder of heavy launch vehicle

2016 ◽  
Vol 60 ◽  
pp. 353-362 ◽  
Author(s):  
Zhang Qing ◽  
Wu Xuelei ◽  
Yang Xianxue ◽  
Li Hongbiao ◽  
Feng Hao
2017 ◽  
Vol 17 (3) ◽  
pp. 505-512 ◽  
Author(s):  
Sushant K. Manwatkar ◽  
A. Bahrudheen ◽  
Shashi Bhushan Tiwari ◽  
S. V. S. Narayana Murty ◽  
P. Ramesh Narayanan

2015 ◽  
Vol 3 ◽  
pp. 1-9
Author(s):  
S.V.S. Narayana Murty ◽  
Sushant K. Manwatkar ◽  
P. Ramesh Narayanan

2014 ◽  
Vol 651-653 ◽  
pp. 24-28
Author(s):  
Cheng Nan Li ◽  
Ye Yan ◽  
Yu Hong Gai ◽  
Bao Min Li ◽  
Wei Du ◽  
...  

Based on macro morphology, metallographic microstructure, field emission scanning electron microscope observations and microhardness testing, failure analysis of the GCr15 steel balls in the ball screw pair was dealt with in this paper. The experimental results showed that small scratches and pits were evenly distributed on the surface of the A steel ball which showed features of wear failure. Characteristics of the B steel ball surface morphology were contacted to fatigue failure. Microstructure observation on the cross-section of the B steel ball showed that martensite and carbides were uneven distributed which were caused by the uneven elements distribution in the raw materials. It was the main cause of this abnormal failure. Therefore, the quality of the raw materials needed to be strictly controlled and the reasonable heat treatment process should be adopted to ensure the quality of the steel balls.


2018 ◽  
Vol 18 (3) ◽  
pp. 457-464
Author(s):  
V. Murugesan ◽  
P. S. Sreejith ◽  
M. Gopakumar ◽  
P. Damodaran ◽  
M. Premdas

2015 ◽  
Vol 830-831 ◽  
pp. 705-708 ◽  
Author(s):  
Sushant Manwatkar ◽  
S.V.S. Narayana Murty ◽  
P. Ramesh Narayanan

AISI 302 stainless steel is used for making compression springs for launch vehicle programmes. One such AISI 302 stainless steel compression spring used in flush and purge valve of liquid engine of a satellite launch vehicle failed during testing. The failure was at the second round of spring and it failed in a slanted type fracture. Detailed metallurgical analysis indicated that the failure was due to fatigue.


Author(s):  
John R. Devaney

Occasionally in history, an event may occur which has a profound influence on a technology. Such an event occurred when the scanning electron microscope became commercially available to industry in the mid 60's. Semiconductors were being increasingly used in high-reliability space and military applications both because of their small volume but, also, because of their inherent reliability. However, they did fail, both early in life and sometimes in middle or old age. Why they failed and how to prevent failure or prolong “useful life” was a worry which resulted in a blossoming of sophisticated failure analysis laboratories across the country. By 1966, the ability to build small structure integrated circuits was forging well ahead of techniques available to dissect and analyze these same failures. The arrival of the scanning electron microscope gave these analysts a new insight into failure mechanisms.


Author(s):  
Evelyn R. Ackerman ◽  
Gary D. Burnett

Advancements in state of the art high density Head/Disk retrieval systems has increased the demand for sophisticated failure analysis methods. From 1968 to 1974 the emphasis was on the number of tracks per inch. (TPI) ranging from 100 to 400 as summarized in Table 1. This emphasis shifted with the increase in densities to include the number of bits per inch (BPI). A bit is formed by magnetizing the Fe203 particles of the media in one direction and allowing magnetic heads to recognize specific data patterns. From 1977 to 1986 the tracks per inch increased from 470 to 1400 corresponding to an increase from 6300 to 10,800 bits per inch respectively. Due to the reduction in the bit and track sizes, build and operating environments of systems have become critical factors in media reliability.Using the Ferrofluid pattern developing technique, the scanning electron microscope can be a valuable diagnostic tool in the examination of failure sites on disks.


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