scholarly journals Techno-economic process modelling and Monte Carlo simulation data of uncertainty quantification in field-grown plant-based manufacturing

Author(s):  
Matthew J. McNulty ◽  
Kirolos Kelada ◽  
Debashis Paul ◽  
Somen Nandi ◽  
Karen A. McDonald
Author(s):  
Neeraj Gupta

The attempt is made to characterize the photon multiplicity distribution as recorded in Photon Multiplicity Detector (PMD) as a part of the WA98 experiment for Pb-Pb interactions at 158 A GeV in terms of Negative Binomial Distribution. The free parameters n ̅ and k of the negative binomial distribution are optimized using CERN standard program MINIUTE and the errors or the parameters are calculated as given in MINOS software. The results obtained are compared with the predictions of Monte Carlo simulation data using VENUS 4.12.


2015 ◽  
Vol 123 (1) ◽  
pp. 27-33 ◽  
Author(s):  
Michela Baccini ◽  
Laura Grisotto ◽  
Dolores Catelan ◽  
Dario Consonni ◽  
Pier Alberto Bertazzi ◽  
...  

1992 ◽  
Author(s):  
Paul T. Ma ◽  
Loren C. Zumwalt ◽  
Francis C. Wang ◽  
Shirley C. Yfantis

Author(s):  
WAYAN ARTHINI ◽  
KOMANG DHARMAWAN ◽  
LUH PUTU IDA HARINI

Value at Risk (VaR) is the maximum potential loss on a portfolio based on the probability at a certain time.  In this research, portfolio VaR values calculated from historical data and Monte Carlo simulation data. Historical data is processed so as to obtain stock returns, variance, correlation coefficient, and variance-covariance matrix, then the method of Markowitz sought proportion of each stock fund, and portfolio risk and return portfolio. The data was then simulated by Monte Carlo simulation, Exact Monte Carlo Simulation and Expected Monte Carlo Simulation. Exact Monte Carlo simulation have same returns and standard deviation  with historical data, while the Expected Monte Carlo Simulation satistic calculation similar to historical data. The results of this research is the portfolio VaR  with time horizon T=1, T=10, T=22 and the confidence level of 95 %, values obtained VaR between historical data and Monte Carlo simulation data with the method exact and expected. Value of VaR from both Monte Carlo simulation is greater than VaR historical data.


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