Low-frequency noise properties of p-type GaAs/AlGaAs heterojunction detectors

Infrared Physics & Technology ◽

10.1016/j.infrared.2016.07.018 ◽

2016 ◽

Vol 78 ◽

pp. 99-104

Author(s):

Seyoum Wolde ◽

Y.F. Lao ◽

P.K.D.D.P. Pitigala ◽

A.G.U. Perera ◽

L.H. Li ◽

...

Keyword(s):

Low Frequency ◽

Frequency Noise ◽

Low Frequency Noise ◽

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Low Frequency Noise Characteristics on Al/Nb2O5/p-type Schottky Diode Fabricated by Pulsed DC Magnetron Sputtering

Molecular Crystals and Liquid Crystals ◽

10.1080/15421406.2013.853551 ◽

2013 ◽

Vol 586 (1) ◽

pp. 168-178

Author(s):

Hyun Gon Oh ◽

Kyung Soo Kim ◽

Jimi Eom ◽

Sang Jik Kwon ◽

Eou Sik Cho ◽

...

Keyword(s):

Magnetron Sputtering ◽

Schottky Diode ◽

Low Frequency ◽

Frequency Noise ◽

Low Frequency Noise ◽

Dc Magnetron Sputtering ◽

Noise Characteristics ◽

Pulsed Dc ◽

Pulsed Dc Magnetron Sputtering ◽

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Double Barrier Height Nature of Ti/p-Type Strained Si-On-Insulator Schottky Diode and Its Low Frequency Noise Characteristics

Journal of Nanoscience and Nanotechnology ◽

10.1166/jnn.2017.14748 ◽

2017 ◽

Vol 17 (10) ◽

pp. 7107-7114 ◽

Author(s):

I Jyothi ◽

Hoon-Ki Lee ◽

V Janardhanam ◽

Sung-Nam Lee ◽

Chel-Jong Choi

Keyword(s):

Barrier Height ◽

Schottky Diode ◽

Low Frequency ◽

Frequency Noise ◽

Low Frequency Noise ◽

Double Barrier ◽

Strained Si ◽

Noise Characteristics ◽

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Low frequency noise in hydrogenated p-type amorphous silicon thin films

Journal of Non-Crystalline Solids ◽

10.1016/j.jnoncrysol.2017.01.014 ◽

2017 ◽

Vol 459 ◽

pp. 176-183 ◽

Author(s):

V.C. Lopes ◽

A.J. Syllaios ◽

C.L. Littler

Keyword(s):

Amorphous Silicon ◽

Low Frequency ◽

Frequency Noise ◽

Low Frequency Noise ◽

Silicon Thin Films ◽

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Low-Frequency Noise Properties in P-Type SnO Thin-Film Transistors

Journal of Nanoscience and Nanotechnology ◽

10.1166/jnn.2016.13513 ◽

2016 ◽

Vol 16 (11) ◽

pp. 11381-11385 ◽

Author(s):

Chan-Yong Jeong ◽

Jeong-Hwan Lee ◽

Yong-Jin Choi ◽

Chang-Woo Lee ◽

Sang-Hun Song ◽

...

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Low Frequency ◽

Frequency Noise ◽

Low Frequency Noise ◽

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Excess low-frequency noise in PtSi on p-type Si Schottky diodes

IEEE Transactions on Electron Devices ◽

10.1109/16.65750 ◽

1991 ◽

Vol 38 (1) ◽

pp. 160-166 ◽

Author(s):

J.M. Mooney

Keyword(s):

Schottky Diodes ◽

Low Frequency ◽

Frequency Noise ◽

Low Frequency Noise ◽

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ON-WAFER LOW FREQUENCY NOISE INVESTIGATION OF THE 0.35 µm n AND p TYPE MOSFETS, DEPENDENCE UPON THE GATE GEOMETRY

Noise in Physical Systems and 1/F Fluctuations ◽

10.1142/9789812811165_0035 ◽

2001 ◽

Author(s):

P. SAKALAS ◽

H. ZIRATH ◽

A. LITWIN ◽

M. SCHRÖTER

Keyword(s):

Low Frequency ◽

Frequency Noise ◽

Low Frequency Noise ◽

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Degradation of low frequency noise in SiGe- and SiGeC-surface channel p-type metal-oxide-semiconductor field effect transistor due to consuming the Si cap

Applied Physics Letters ◽

10.1063/1.2819071 ◽

2007 ◽

Vol 91 (23) ◽

pp. 233505 ◽

Author(s):

R. Yang ◽

Y. Z. Xiong ◽

W. Y. Loh ◽

J. D. Ye ◽

M. B. Yu ◽

...

Keyword(s):

Metal Oxide ◽

Field Effect ◽

Field Effect Transistor ◽

Low Frequency ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Frequency Noise ◽

Low Frequency Noise ◽

Effect Transistor ◽

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Influence of device scaling on low-frequency noise in SOI tri-gate N- and p-type Si nanowire MOSFETs

2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC) ◽

10.1109/essderc.2013.6818878 ◽

2013 ◽

Author(s):

M. Koyama ◽

M. Casse ◽

R. Coquand ◽

S. Barraud ◽

G. Ghibaudo ◽

...

Keyword(s):

Low Frequency ◽

Frequency Noise ◽

Low Frequency Noise ◽

Si Nanowire ◽

Device Scaling ◽

Nanowire Mosfets ◽

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Improvement of Low Frequency Noise of p-type GaN by Surface Chlorination Treatment

ECS Meeting Abstracts ◽

10.1149/ma2009-01/21/875 ◽

2009 ◽

Keyword(s):

Low Frequency ◽

Frequency Noise ◽

Low Frequency Noise ◽

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Low frequency noise characteristics in p-Type MOSFET with multilayer WSe2 channel and Al2O3 back gate dielectric

2017 IEEE 12th International Conference on ASIC (ASICON) ◽

10.1109/asicon.2017.8252490 ◽

2017 ◽

Author(s):

Hui Shen ◽

Huiwen Yuan ◽

Sitong Bu ◽

Mingyue He ◽

Daming Huang

Keyword(s):

Gate Dielectric ◽

Low Frequency ◽

Frequency Noise ◽

Low Frequency Noise ◽

Back Gate ◽

Noise Characteristics ◽

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