ON-WAFER LOW FREQUENCY NOISE INVESTIGATION OF THE 0.35 µm n AND p TYPE MOSFETS, DEPENDENCE UPON THE GATE GEOMETRY
2013 ◽
Vol 586
(1)
◽
pp. 168-178
2017 ◽
Vol 17
(10)
◽
pp. 7107-7114
◽
Keyword(s):
2017 ◽
Vol 459
◽
pp. 176-183
◽
Keyword(s):
2016 ◽
Vol 16
(11)
◽
pp. 11381-11385
◽
Keyword(s):
1991 ◽
Vol 38
(1)
◽
pp. 160-166
◽
Keyword(s):