ON-WAFER LOW FREQUENCY NOISE INVESTIGATION OF THE 0.35 µm n AND p TYPE MOSFETS, DEPENDENCE UPON THE GATE GEOMETRY

Author(s):  
P. SAKALAS ◽  
H. ZIRATH ◽  
A. LITWIN ◽  
M. SCHRÖTER
2016 ◽  
Vol 16 (11) ◽  
pp. 11381-11385 ◽  
Author(s):  
Chan-Yong Jeong ◽  
Jeong-Hwan Lee ◽  
Yong-Jin Choi ◽  
Chang-Woo Lee ◽  
Sang-Hun Song ◽  
...  

2016 ◽  
Vol 78 ◽  
pp. 99-104
Author(s):  
Seyoum Wolde ◽  
Y.F. Lao ◽  
P.K.D.D.P. Pitigala ◽  
A.G.U. Perera ◽  
L.H. Li ◽  
...  

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