In situ study of the formation of NiSi2 nanoplates and Ni nanocrystals embedded in a Si(001) wafer and in a deposited Ni-doped SiO2 thin film
2015 ◽
Vol 357
◽
pp. 1268-1273
◽
Keyword(s):
In situ study of strain evolution during thin film Ti/Al(Si,Cu) reaction using synchrotron radiation
2002 ◽
Vol 64
(1-4)
◽
pp. 81-89
◽
2012 ◽
Vol 197
◽
pp. 224-230
◽
Keyword(s):
1994 ◽
Vol 4
(8)
◽
pp. 1239-1244
◽
Keyword(s):
Keyword(s):