Effects of nitrogen plasma irradiation during the growth process after buffer layer growth on the characteristics of hexagonal InN films grown on Si (111) by electron–cyclotron resonance plasma-assisted molecular-beam epitaxy

2007 ◽  
Vol 301-302 ◽  
pp. 504-507 ◽  
Author(s):  
Tokuo Yodo ◽  
Teruya Shimada ◽  
Sumito Tagawa ◽  
Yoshiyuki Harada
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