Non-destructive determination of the coating film thickness by X-ray powder diffractometry and correlation with the dissolution behavior of film-coated tablets

ABSTRACTRutherford backscattering spectrometry (RBS) is used to characterize the stoichiometry of graphite intercalation compounds (GIC). Specific application is made to several stages of different donor and acceptor compounds and to commensurate and incommensurate intercalants. A deviation from the theoretical stoichiometry is measured for most of the compounds using this non-destructive method. Within experimental error, the RBS results agree with those obtained from analysis of the (00ℓ) x-ray diffractograms and weight uptake measurements on the same samples.

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Characterization and Control of Copper CMP with Optoacoustic Metrology

MRS Proceedings ◽

10.1557/proc-671-m3.9 ◽

2001 ◽

Vol 671 ◽

Author(s):

Michael Gostein ◽

Paul Lefevre ◽

Alex A. Maznev ◽

Michael Joffe

Keyword(s):

Film Thickness ◽

Spatial Resolution ◽

Chemical Mechanical Polishing ◽

High Spatial Resolution ◽

Mechanical Polishing ◽

Length Measurement ◽

And Control ◽

Non Destructive

ABSTRACTWe discuss applications of optoacoustic film thickness metrology for characterization of copper chemical-mechanical polishing (CMP). We highlight areas where the use of optoacoustics for CMP characterization provides data complementary to that obtained by other techniques because of its ability to directly measure film thickness with high spatial resolution in a rapid, non-destructive manner. Examples considered include determination of planarization length, measurement of film thickness at intermediate stages of polish, and measurement of arrays of metal lines.

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Determination of 239Pu and 240Pu isotope ratio for a nuclear bomb particle using X-ray spectrometry in conjunction with γ-ray spectrometry and non-destructive α-particle spectrometry

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ◽

10.1016/j.nima.2009.08.066 ◽

2009 ◽

Vol 610 (2) ◽

pp. 515-521 ◽

Cited By ~ 3

Author(s):

R. Pöllänen ◽

K. Ruotsalainen ◽

H. Toivonen

Keyword(s):

Isotope Ratio ◽

X Ray ◽

Nuclear Bomb ◽

Γ Ray ◽

Non Destructive

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Standardisation of X-Ray Powder Diffraction Methods

Materials Science Forum ◽

10.4028/www.scientific.net/msf.443-444.31 ◽

2004 ◽

Vol 443-444 ◽

pp. 31-34

Author(s):

Giovanni Berti ◽

Rob Delhez ◽

S. Norval ◽

B. Peplinski ◽

E. Tolle ◽

...

Keyword(s):

Technical Committee ◽

Non Destructive Testing ◽

X Ray Diffraction ◽

Destructive Testing ◽

X Ray ◽

Standard Documents ◽

And Control ◽

Non Destructive ◽

Research Centres

This paper outlines the standardisation process for the XRPD method that is currently being considered by a Working Group (WG10) of Technical Committee 138 "Non-destructive Testing" of the European Committee for Standardisation CEN. Several Standard Documents are on the verge of being released. These documents concern the general principles of (X-ray) diffraction, its terminology, and the basic procedures applied. Another document concerns the instruments used and it offers procedures to characterise and control the performance of an X-ray diffractometer properly. It is intended to issue Standard Documents on specific methods, e.g. determination of residual stresses. In fact work is in progress on this subject. The Standard Documents can be used by industry, government organisations, and research centres with activities related to safety, health and the environment, as well as for educational purposes.

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X-Ray Diffraction Determination of Metallurgical Damage in Turbo Blower Rotor Shafts

MRS Proceedings ◽

10.1557/proc-142-171 ◽

1988 ◽

Vol 142 ◽

Author(s):

John F. Porter ◽

Dan O. Morehouse ◽

Mike Brauss ◽

Robert R. Hosbons ◽

John H. Root ◽

...

Keyword(s):

Residual Stress ◽

Hole Drilling ◽

X Ray Diffraction ◽

X Ray ◽

Turbo Blower ◽

Diffraction Determination ◽

Defence Research ◽

Stress Profiles ◽

Non Destructive

AbstractStudies have been ongoing at Defence Research Establishment Atlantic on the evaluation of non-destructive techniques for residual stress determination in structures. These techniques have included neutron diffraction, x-ray diffraction and blind-hole drilling. In conjunction with these studies, the applicability of these procedures to aid in metallurgical and failure analysis investigations has been explored. The x-ray diffraction technique was applied to investigate the failure mechanism in several bent turbo blower rotor shafts. All examinations had to be non-destructive in nature as the shafts were considered repairable. It was determined that residual stress profiles existed in the distorted shafts which strongly indicated the presence of martensitic microstuctures. These microstructures are considered unacceptable for these shafts due to the potential for cracking or in-service residual stress relaxation which could lead to future shaft distortion.

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Determination of Ultra-Thin Carbon Coating Thickness by X-ray Fluorescence Technique

Advances in X-ray Analysis ◽

10.1154/s0376030800020644 ◽

1988 ◽

Vol 32 ◽

pp. 331-339

Author(s):

R. L. White ◽

T. C. Huang

Keyword(s):

Film Thickness ◽

Carbon Coating ◽

Layer Structure ◽

Carbon Film ◽

Calibration Procedure ◽

High Precision Measurement ◽

X Ray ◽

Thin Carbon ◽

Counting Time

AbstractA tcchniquc for high-precision measurement of carbon thin-film thickness using X-ray fluorescence (XRF) is described. A quadratic calibration procedure is used for carbon thin films on silicon. Measurement of carbon-film thickness in a double-layer structure of carbon and CoCrX alloy is complicated by interference effects from the underlying layer. The dependence of the relative precision in measuring thickness (σT/T) on the counting time has been derived. It shows that a precision of 2% for a 25-nm carbon coating can be obtained using a W/C crystal and counting time of 4 minutes. Intensity and resolution advantages provided by the recently developed Ni/C and V/C multilayer synthetic crystals are also described.

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