Determination of dislocation density by electron backscatter diffraction and X-ray line profile analysis in ferrous lath martensite

2016 ◽  
Vol 113 ◽  
pp. 117-124 ◽  
Author(s):  
Tibor Berecz ◽  
Péter Jenei ◽  
András Csóré ◽  
János Lábár ◽  
Jenő Gubicza ◽  
...  
Keyword(s):  
Dislocation Density ◽  
Line Profile ◽  
Electron Backscatter Diffraction ◽  
Profile Analysis ◽  
Lath Martensite ◽  
Line Profile Analysis ◽  
X Ray ◽  
Electron Backscatter ◽  
Backscatter Diffraction

Comparison of electron backscatter and X-ray diffraction techniques for measuring dislocation density in Zircaloy-2

2019 ◽  
Vol 52 (2) ◽  
pp. 415-427 ◽  
Author(s):  
T. Skippon ◽  
L. Balogh ◽  
M. R. Daymond
Keyword(s):  
Dislocation Density ◽  
Electron Backscatter Diffraction ◽  
Profile Analysis ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
Density Measurements ◽  
X Ray ◽  
Ebsd Data ◽  
Electron Backscatter ◽  
Backscatter Diffraction

Two methods for measuring dislocation density were applied to a series of plastically deformed tensile samples of Zircaloy-2. Samples subjected to plastic strains ranging from 4 to 17% along a variety of loading paths were characterized using both electron backscatter diffraction (EBSD) and synchrotron X-ray line profile analysis (LPA). It was found that the EBSD-based method gave results which were similar in magnitude to those obtained by LPA and followed a similar trend with increasing plastic strain. The effects of microscope parameters and post-processing of the EBSD data on dislocation density measurements are also discussed. The typical method for estimating uncertainty in dislocation density measured via EBSD was shown to be overly conservative, and a more realistic method of determining uncertainty is presented as an alternative.

Determination of Dislocation Density in Lath Martensite by Means of Electron Backscatter Diffraction

2017 ◽  
Vol 885 ◽  
pp. 275-279 ◽  
Author(s):  
Péter János Szabó ◽  
András Csóré
Keyword(s):  
Dislocation Density ◽  
Martensitic Steel ◽  
Electron Backscatter Diffraction ◽  
Lath Martensite ◽  
Electron Backscatter ◽  
Density Values ◽  
Cold Rolled ◽  
Backscatter Diffraction ◽  
Scanning Electron

As a novel procedure for determining dislocation density, a software was improved with which data obtained by Scanning Electron Microscope (SEM) measurements can be collected and the value of superficial dislocation density can be calculated. Applying this method we investigated cold rolled lath martensitic steel samples. Besides dislocation density values, microstructure mapped by Electron Backscatter Diffraction (EBSD) will be discussed.

scholarly journals In situ synchrotron X-ray diffraction line-profile analysis of additively manufactured Ti−6Al−4V alloy under tensile deformation

2020 ◽  
Vol 321 ◽  
pp. 03026
Author(s):  
K. Yamanaka ◽  
A. Kuroda ◽  
M. Ito ◽  
M. Mori ◽  
T. Shobu ◽  
...  
Keyword(s):  
Dislocation Density ◽  
Line Profile ◽  
Tensile Deformation ◽  
Profile Analysis ◽  
High Energy ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Β Phase

In this study, the tensile deformation behavior of an electron beam melted Ti−6Al−4V alloy was examined by in situ X-ray diffraction (XRD) line-profile analysis. The as-built Ti−6Al−4V alloy specimen showed a fine acicular microstructure that was produced through the decomposition of the α′-martensite during the post-melt exposure to high temperatures. Using high-energy synchrotron radiation, XRD line-profile analysis was successfully applied for examining the evolution of dislocation structures not only in the α-matrix but also in the nanosized, low-fraction β-phase precipitates located at the interfaces between the α-laths. The results indicated that the dislocation density was initially higher in the β-phase and an increased dislocation density with increasing applied tensile strain was quantitatively captured in each constitutive phase. It can be thus concluded that the EBM Ti−6Al−4V alloy undergoes a cooperative plastic deformation between the constituent phases in the duplex microstructure. These results also suggested that XRD line-profile analysis combined with highenergy synchrotron XRD measurements can be utilized as a powerful tool for characterizing duplex microstructures in titanium alloys.

Characterization of aging behavior of precipitates and dislocations in copper-based alloys

2010 ◽  
Vol 25 (2) ◽  
pp. 104-107
Author(s):  
Shigeo Sato ◽  
Yohei Takahashi ◽  
Kazuaki Wagatsuma ◽  
Shigeru Suzuki
Keyword(s):  
Dislocation Density ◽  
Aging Time ◽  
Line Profile ◽  
Small Angle ◽  
Profile Analysis ◽  
Aging Treatment ◽  
Scattering Method ◽  
Line Profile Analysis ◽  
X Ray ◽  
X Ray Scattering

The growth of precipitates in a deformed Cu–Ni–Si alloy with an aging treatment and the rearrangement of dislocations were investigated using small-angle X-ray scattering method and XRD line-profile analysis. The small-angle X-ray scattering method was used for characterizing the growth behavior of the precipitates. The results showed that the precipitates grew gradually to a few nanometers in radius when aged under the condition that the alloy exhibited a maximum of the hardness due to precipitation hardening. The growth rate rose from the onset of the overaging, where the hardness started to decrease. The line-profile analysis of copper-based alloy diffraction peaks using modified Williamson–Hall and modified Warren–Averbach procedures yielded a variation in the dislocation densities of the alloy as a function of the aging time. The dislocation density of the alloy before the aging treatment was estimated to be 1.7×1015 m−2 and its high value was held up to the peak-aging time. With the onset of the overaging, however, the dislocation density distinctly decreased by about 1 order of magnitude indicating that a large amount of the dislocations rearranged to release the alloy from the high dislocation-density state. The results suggest that the massive rearrangement of dislocations was accompanied with coarsening of the precipitates.

Determination of lamella thickness distributions in isotactic polypropylene by X-ray line profile analysis

Polymer ◽  
2010 ◽  
Vol 51 (18) ◽  
pp. 4195-4199 ◽  
Author(s):  
Florian Spieckermann ◽  
Harald Wilhelm ◽  
Michael Kerber ◽  
Erhard Schafler ◽  
Gerald Polt ◽  
...  
Keyword(s):  
Line Profile ◽  
Isotactic Polypropylene ◽  
Profile Analysis ◽  
Line Profile Analysis ◽  
X Ray ◽  
Lamella Thickness

Internal Dislocation Density in Deformed GlidCop from X-Ray Line Profile Analysis

2021 ◽  
Vol 1016 ◽  
pp. 1223-1228
Author(s):  
Mutsumi Sano ◽  
Sunao Takahashi ◽  
Ayumi Shiro ◽  
Takahisa Shobu ◽  
Kengo Nakada
Keyword(s):  
Dislocation Density ◽  
Line Profile ◽  
Fine Particles ◽  
Profile Analysis ◽  
Compressive Strain ◽  
Strain Range ◽  
Line Profile Analysis ◽  
X Ray ◽  
Dislocation Densities ◽  
Ultra Fine Particles

Dislocation densities of GLIDCOP®, dispersion-strengthened copper with ultra-fine particles of aluminum oxide, were evaluated by employing the X-ray line profile analysis using the modified Williamson-Hall and modified Warren-Averbach methods. X-ray diffraction profiles for GlidCop samples with compressive strains applied at 200oC were measured with synchrotron radiation. The dislocation densities of GlidCop with compressive strain ranging from 0.6 to 4.3% were in the order of 3.2 × 1014–5.8 × 1014 m-2. The dislocation density increased with increasing the compressive strain within the measured strain range.

scholarly journals Dislocation density and Burgers vector population in fiber-textured Ni thin films determined by high-resolution X-ray line profile analysis

2012 ◽  
Vol 45 (1) ◽  
pp. 61-70 ◽  
Author(s):  
Gábor Csiszár ◽  
Karen Pantleon ◽  
Hossein Alimadadi ◽  
Gábor Ribárik ◽  
Tamás Ungár
Keyword(s):  
Thin Films ◽  
High Resolution ◽  
Dislocation Density ◽  
Line Profile ◽  
Profile Analysis ◽  
Domain Size ◽  
Line Profile Analysis ◽  
Burgers Vector ◽  
X Ray ◽  
Vector Population

Nanocrystalline Ni thin films have been produced by direct current electrodeposition with different additives and current density in order to obtain 〈100〉, 〈111〉 and 〈211〉 major fiber textures. The dislocation density, the Burgers vector population and the coherently scattering domain size distribution are determined by high-resolution X-ray diffraction line profile analysis. The substructure parameters are correlated with the strength of the films by using the combined Taylor and Hall–Petch relations. The convolutional multiple whole profile method is used to obtain the substructure parameters in the different coexisting texture components. A strong variation of the dislocation density is observed as a function of the deposition conditions.

Evaluation of Microstructural Characteristics in Low-Cycle Fatigued Austenitic Stainless Steel Using X-Ray Line Profile Analysis

2018 ◽  
Vol 941 ◽  
pp. 376-381
Author(s):  
Masayoshi Kumagai ◽  
Masatoshi Kuroda ◽  
Koichi Akita ◽  
Masayuki Kamaya ◽  
Shinichi Ohya
Keyword(s):  
Stainless Steel ◽  
Dislocation Density ◽  
Line Profile ◽  
Stress Amplitude ◽  
Profile Analysis ◽  
Life Time ◽  
Line Profile Analysis ◽  
Microstructural Characteristics ◽  
X Ray ◽  
Dislocation Densities

X-ray line profile analysis was performed to evaluate the microstructural characteristics of low-cycle fatigued austenitic stainless steel, AISI 316. Strains were frequently applied to the specimens with three levels of the total strain ranges, 0.01, 0.02, and 0.03. The dislocation densities at the number of cycles for each strain condition were obtained by X-ray line profile analysis. In the case that the strain range was small, that is Δε = 0.01, dislocation densities were slightly increased until 53% of life time with the cycles, and then decreased. In the case that the strain ranges were 0.02 and 0.03, the dislocation densities were steeply increased during the first stage of the life time until around 10%. However, the variations after n/Nf≃ 10% were different each other. In the case of Δε = 0.02, dislocation density did not increase significantly until the end of the life. But in the case of Δε = 0.03, the dislocation density monotonously increased until the end of the life. These tendencies agreed with the variations of stress amplitude. The relationship between dislocation density and stress amplitude could be expressed as Δσ/2 = 1.14ρ1/2+ 207 (Δσ [MPa], ρ1/2[m−2]).

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