Atomic force microscopy (AFM) and 3D confocal microscopy as alternative techniques for the morphological characterization of anodic TiO 2 nanoporous layers

2016 ◽  
Vol 165 ◽  
pp. 67-70 ◽  
Author(s):  
Diego P. Oyarzún ◽  
Omar E. Linarez Pérez ◽  
Manuel López Teijelo ◽  
César Zúñiga ◽  
Eduardo Jeraldo ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Confocal Microscopy ◽  
Morphological Characterization ◽  
Force Microscopy ◽  
Atomic Force ◽  
Alternative Techniques

scholarly journals Withdrawn: Atomic force microscopy in the morphological characterization of particulated matter

2007 ◽  
Author(s):  
Ma. Cristina Castañón Bautista ◽  
Abelardo Alcaráz Santillán ◽  
José Chávez Carvayar ◽  
Gerardo Cesar Díaz Trujillo
Keyword(s):  
Atomic Force Microscopy ◽  
Morphological Characterization ◽  
Force Microscopy ◽  
Atomic Force

FABRICATION AND OPTICAL AND MORPHOLOGICAL CHARACTERIZATION OF n+-ZnO/i-ZnO AND n+-ZnO/ZnSe BILAYERS USED AS OPTICAL WINDOWS IN SOLAR CELLS

2002 ◽  
Vol 09 (05n06) ◽  
pp. 1617-1621
Author(s):  
C. CALDERÓN ◽  
H. INFANTE ◽  
G. GORDILLO
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Solar Cells ◽  
Morphological Characterization ◽  
Morphological Properties ◽  
Spectral Transmittance ◽  
Optical Window ◽  
Force Microscopy ◽  
Atomic Force

This work presents results concerning the development of n +- ZnO/i-ZnO and n +- ZnO/ZnSe bilayer structures with adequate properties to be used as optical windows in solar cells based on CuInSe 2 thin films. The optical and morphological properties of each of the layers constituting the bilayer structures were studied through spectral transmittance and atomic force microscopy (AFM) measurements. The studies revealed that windows of this type allow a significant increase of the spectral range of absorbed radiation by the solar cell in comparison with those using ZnO/CdS as optical window.

Morphological characterization of Etv2 explants using fractal analysis and atomic force microscopy

2021 ◽  
pp. 104205
Author(s):  
Robert P. Adelson ◽  
Brisa Palikuqi ◽  
Zachary Weiss ◽  
Antonio Checco ◽  
Ryan Schreiner ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Fractal Analysis ◽  
Morphological Characterization ◽  
Force Microscopy ◽  
Atomic Force
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