Gate-controlled field-effect diodes and silicon-controlled rectifier for charged-device model ESD protection in advanced SOI technology

Microelectronics Reliability ◽

10.1016/j.microrel.2010.11.013 ◽

2011 ◽

Vol 51 (4) ◽

pp. 756-764 ◽

Author(s):

Shuqing Cao ◽

Jung-Hoon Chun ◽

Akram A. Salman ◽

Stephen G. Beebe ◽

Robert W. Dutton

Keyword(s):

Field Effect ◽

Device Model ◽

Charged Device Model ◽

Esd Protection ◽

Charged Device ◽

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On-Chip Charged Device Model ESD Protection Design Method Using Very Fast Transmission Line Pulse System for RF ICs

IEICE Transactions on Electronics ◽

10.1587/transele.e93.c.625 ◽

2010 ◽

Vol E93-C (5) ◽

pp. 625-630 ◽

Author(s):

Jae-Young PARK ◽

Jong-Kyu SONG ◽

Dae-Woo KIM ◽

Chang-Soo JANG ◽

Won-Young JUNG ◽

...

Keyword(s):

Transmission Line ◽

Design Method ◽

Pulse System ◽

Device Model ◽

Charged Device Model ◽

Esd Protection ◽

On Chip ◽

Charged Device ◽

Fast Transmission ◽

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Active ESD protection circuit design against charged-device-model ESD event in CMOS integrated circuits

Microelectronics Reliability ◽

10.1016/j.microrel.2007.07.095 ◽

2007 ◽

Vol 47 (9-11) ◽

pp. 1502-1505 ◽

Author(s):

Shih-Hung Chen ◽

Ming-Dou Ker

Keyword(s):

Integrated Circuits ◽

Circuit Design ◽

Cmos Integrated Circuits ◽

Device Model ◽

Charged Device Model ◽

Esd Protection ◽

Protection Circuit ◽

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Using Coupled Transmission Lines to Generate Impedance-Matched Pulses Resembling Charged Device Model ESD

IEEE Transactions on Electronics Packaging Manufacturing ◽

10.1109/tepm.2006.881767 ◽

2006 ◽

Vol 29 (3) ◽

pp. 172-178 ◽

Author(s):

T.J. Maloney ◽

S.S. Poon

Keyword(s):

Transmission Lines ◽

Device Model ◽

Charged Device Model ◽

Coupled Transmission Lines ◽

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Correlation of component human body model and charged device model qualification levels with electrical failures in electronics assembly

Journal of Electrostatics ◽

10.1016/j.elstat.2015.12.002 ◽

2016 ◽

Vol 79 ◽

pp. 38-44 ◽

Author(s):

Pasi Tamminen ◽

Leena Ukkonen ◽

Lauri Sydänheimo

Keyword(s):

Human Body Model ◽

Electronics Assembly ◽

Device Model ◽

Charged Device Model ◽

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Dynamic-Adaptive Field Induced Charged Device Model (FICDM) compact tester model

2008 9th International Conference on Solid-State and Integrated-Circuit Technology ◽

10.1109/icsict.2008.4734570 ◽

2008 ◽

Author(s):

Thorsten Weyl ◽

Dave Clarke ◽

Karl Rinne

Keyword(s):

Device Model ◽

Charged Device Model ◽

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Field Effect Resistor, a single-device-at-pad solution for ESD protection in deeply scaled SOI technology

2010 IEEE International SOI Conference (SOI) ◽

10.1109/soi.2010.5641373 ◽

2010 ◽

Author(s):

Shuqing Cao ◽

Akram A. Salman ◽

Jung-Hoon Chun ◽

Stephen G. Beebe ◽

Mario M. Pelella ◽

...

Keyword(s):

Field Effect ◽

Esd Protection ◽

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Effect of deshunting sequences of magnetic head using charged device model

Journal of Magnetism and Magnetic Materials ◽

10.1016/j.jmmm.2003.12.936 ◽

2004 ◽

Vol 272-276 ◽

pp. 2307-2309 ◽

Author(s):

A. Siritaratiwat ◽

N. Jutong ◽

C. Pupaichitkul

Keyword(s):

Magnetic Head ◽

Device Model ◽

Charged Device Model ◽

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Constant energy charged device model (CECDM) for electrostatic discharge (ESD) and semiconductor devices

IAS '95. Conference Record of the 1995 IEEE Industry Applications Conference Thirtieth IAS Annual Meeting ◽

10.1109/ias.1995.530444 ◽

2002 ◽

Author(s):

W.D. Greason ◽

S. Bulach

Keyword(s):

Electrostatic Discharge ◽

Semiconductor Devices ◽

Constant Energy ◽

Device Model ◽

Charged Device Model ◽

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Very-fast transmission line pulsing of integrated structures and the charged device model

10.1109/eosesd.1996.865129 ◽

2005 ◽

Author(s):

H. Gieser ◽

M. Haunschild

Keyword(s):

Transmission Line ◽

Device Model ◽

Charged Device Model ◽

Charged Device ◽

Integrated Structures ◽

Fast Transmission

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Charged device model (CDM) ESD challenges for laterally diffused nMOS (nLDMOS) silicon controlled rectifier (SCR) devices for high-voltage applications in standard low-voltage CMOS technology

2010 International Electron Devices Meeting ◽

10.1109/iedm.2010.5703483 ◽

2010 ◽

Author(s):

A. Griffoni ◽

S.-H. Chen ◽

S. Thijs ◽

D. Linten ◽

M. Scholz ◽

...

Keyword(s):

High Voltage ◽

Low Voltage ◽

Cmos Technology ◽

Device Model ◽

Charged Device Model ◽

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