Application of high frequency scanning acoustic microscopy for the failure analysis and reliability assessment of MEMS sensors

2016 ◽  
Vol 64 ◽  
pp. 656-659 ◽  
Author(s):  
S. Oberhoff ◽  
K. Goetz ◽  
K. Trojan ◽  
M. Zoeller ◽  
J. Glueck
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