scholarly journals Visible-light beam size monitors using synchrotron radiation at CESR

2013 ◽  
Vol 703 ◽  
pp. 80-90 ◽  
Author(s):  
S.T. Wang ◽  
D.L. Rubin ◽  
J. Conway ◽  
M. Palmer ◽  
D. Hartill ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Visible Light ◽  
Light Beam ◽  
Beam Size

scholarly journals Upconversion of Broadband Infrared Radiation into Visible Light for Different Pumping Parameters

2013 ◽  
Vol 2013 ◽  
pp. 1-5 ◽  
Author(s):  
Man Nen Litvinova ◽  
Victor Krishtop ◽  
Evgeniy Tolstov ◽  
Vladimir Troilin ◽  
Larisa Alekseeva ◽  
...  
Keyword(s):  
Lithium Niobate ◽  
Visible Light ◽  
Light Beam ◽  
Infrared Radiation ◽  
Spectral Width ◽  
Uniaxial Crystal ◽  
Phase Matching ◽  
Pump Radiation ◽  
Broadband Radiation ◽  
Lithium Niobate Crystals

The influence of pump radiation parameters such as the polarization and the spectral width of infrared radiation on the conversion of broadband radiation in lithium niobate crystals was investigated. The spectra of converted radiation were calculated for two types of phase matching in the negative uniaxial crystal by taking into account the convergence of the light beam in the crystal. Experimental spectra were obtained and compared with the calculated spectra.

EFFECTS OF LIGHT BEAM SIZE ON FLUENCE DISTRIBUTION AND DEPTH OF NECROSIS IN SUPERFICIALLY APPLIED PHOTODYNAMIC THERAPY OF NORMAL RAT BRAIN

1992 ◽  
Vol 56 (3) ◽  
pp. 379-384 ◽  
Author(s):  
Qun Chen ◽  
Brian C. Wilson ◽  
Mary O. Dereski ◽  
Michael S. Patterson ◽  
Michael Chopp ◽  
...  
Keyword(s):  
Photodynamic Therapy ◽  
Rat Brain ◽  
Light Beam ◽  
Beam Size ◽  
Normal Rat

A Scanning X-Ray Fluorescence Microprobe with Synchrotron Radiation

1987 ◽  
Vol 31 ◽  
pp. 495-502 ◽  
Author(s):  
Y. Gohshj ◽  
S. Aoki ◽  
A. Iida ◽  
S. Hayakawa ◽  
H. Yamaji ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Relative Concentration ◽  
Trace Element Analysis ◽  
Design Parameters ◽  
Absolute Amount ◽  
Beam Size ◽  
Element Analysis ◽  
X Ray ◽  
Better Than

SummaryA scantling X-ray fluorescence(XRF) microprobe using WoIter type 1 optics was developed, and micro and trace element analysis was carried out using synchrotron radiation up to 10 keV as an excitation source. The design parameters of the optical system and the performance of the system, such as the beam size and the intensity, are described. The MDL obtained for Mn was 6 ppm in relative concentration and about 0.1 pg in absolute amount. The estimated spatial resolution was better than 10 um.

Determination of the electron beam size at the Kurchatov Synchrotron Radiation Source using an edge screen

2007 ◽  
Vol 1 (6) ◽  
pp. 627-629
Author(s):  
A. N. Artemiev ◽  
V. N. Korchuganov ◽  
A. G. Valentinov ◽  
V. V. Kvardakov ◽  
B. F. Kirillov ◽  
...  
Keyword(s):  
Electron Beam ◽  
Synchrotron Radiation ◽  
Radiation Source ◽  
Synchrotron Radiation Source ◽  
Beam Size

scholarly journals Brightness of synchrotron radiation from undulators and bending magnets

2015 ◽  
Vol 22 (2) ◽  
pp. 288-316 ◽  
Author(s):  
Gianluca Geloni ◽  
Vitali Kocharyan ◽  
Evgeni Saldin
Keyword(s):  
Electron Beam ◽  
Phase Space ◽  
Synchrotron Radiation ◽  
Wigner Distribution ◽  
Geometrical Optics ◽  
Single Electron ◽  
Beam Divergence ◽  
Photon Flux ◽  
Photon Flux Density ◽  
Beam Size

The maximum of the Wigner distribution (WD) of synchrotron radiation (SR) fields is considered as a possible definition of SR source brightness. Such a figure of merit was originally introduced in the SR community by Kim [(1986),Nucl. Instrum. Methods Phys. Res. A,246, 71–76]. The brightness defined in this way is always positive and, in the geometrical optics limit, can be interpreted as the maximum density of photon flux in phase space. For undulator and bending magnet radiation from a single electron, the WD function can be explicitly calculated. In the case of an electron beam with a finite emittance the brightness is given by the maximum of the convolution of a single electron WD function and the probability distribution of the electrons in phase space. In the particular case when both electron beam size and electron beam divergence dominate over the diffraction size and the diffraction angle, one can use a geometrical optics approach. However, there are intermediate regimes when only the electron beam size or the electron beam divergence dominate. In these asymptotic cases the geometrical optics approach is still applicable, and the brightness definition used here yields back once more to the maximum photon flux density in phase space. In these intermediate regimes a significant numerical disagreement is found between exact calculations and the approximation for undulator brightness currently used in the literature. The WD formalism is extended to a satisfactory theory for the brightness of a bending magnet. It is found that in the intermediate regimes the usually accepted approximation for bending magnet brightness turns out to be inconsistent even parametrically.

scholarly journals Vision: A Six-telescope Fiber-fed Visible Light Beam Combiner for the Navy Precision Optical Interferometer

2016 ◽  
Vol 128 (963) ◽  
pp. 055004 ◽  
Author(s):  
Eugenio V. Garcia ◽  
Matthew W. Muterspaugh ◽  
Gerard van Belle ◽  
John D. Monnier ◽  
Keivan G. Stassun ◽  
...  
Keyword(s):  
Visible Light ◽  
Light Beam ◽  
Optical Interferometer ◽  
Beam Combiner

Review of Transverse Beam Profile Measurements Using Synchrotron Radiation

2020 ◽  
Vol 1 (2) ◽  
pp. 13-18
Author(s):  
Emy Mulyani, J.W. Flanagan
Keyword(s):  
Synchrotron Radiation ◽  
Visible Light ◽  
Beam Profile ◽  
Electromagnetic Spectrum ◽  
Transverse Beam ◽  
X Ray ◽  
Light Region ◽  
Broad Energy Range ◽  
Practical Experiences ◽  
Non Destructive

Abstract –Synchrotron radiation (SR) is a tool for non-destructive beam diagnostics since its characters are substantially related to those of the source beam. The spectrum of SR is extremely intense and extends over a broad energy range from the infrared through the visible and ultraviolet, into the soft and hard X-ray regions of the electromagnetic spectrum. The visible light (400 – 800 nm) and X-ray (0.05 – 0.3 nm) regions are used in the beam instrumentation. In the visible light region, transverse beam profile or size diagnostics can be done by an interferometer (light is observed as a wave). Meanwhile, in the submicron beam size measurements, the X-ray SR monitor is commonly used. This paper reports the review of transverse beam profile measurements using SR covering principles and practical experiences with the technique at some accelerator facilities such as Photon Factory, Diamond Light Source, CesrTA, and SuperKEKB. Key words: accelerator, beam instrumentation, transverse beam profile, synchrotron radiation, X-ray, visible light

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