A Scanning X-Ray Fluorescence Microprobe with Synchrotron Radiation

1987 ◽  
Vol 31 ◽  
pp. 495-502 ◽  
Author(s):  
Y. Gohshj ◽  
S. Aoki ◽  
A. Iida ◽  
S. Hayakawa ◽  
H. Yamaji ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Relative Concentration ◽  
Trace Element Analysis ◽  
Design Parameters ◽  
Absolute Amount ◽  
Beam Size ◽  
Element Analysis ◽  
X Ray ◽  
Better Than

SummaryA scantling X-ray fluorescence(XRF) microprobe using WoIter type 1 optics was developed, and micro and trace element analysis was carried out using synchrotron radiation up to 10 keV as an excitation source. The design parameters of the optical system and the performance of the system, such as the beam size and the intensity, are described. The MDL obtained for Mn was 6 ppm in relative concentration and about 0.1 pg in absolute amount. The estimated spatial resolution was better than 10 um.

Trace Element Analysis of Solutions at the PPB Level

1990 ◽  
Vol 34 ◽  
pp. 41-55 ◽  
Author(s):  
Carl Meltzer ◽  
Bi-Shia King
Keyword(s):  
Trace Element Analysis ◽  
Detection Limits ◽  
Solid Content ◽  
Element Analysis ◽  
Plastic Films ◽  
X Ray ◽  
Direct Excitation ◽  
Thin Plastic ◽  
Total Dissolved Solid ◽  
Better Than

We have developed a technique to determine the dissolved solid components of water and other liquids by Energy- Dispersive X-Ray Fluorescence (EDXRF) spectrometry. The liquid samples are presented to the spectrometer as small dried spots of the residue remaining after evaporation of the liquid. The dried residues are mounted on thin plastic films cemented to 35 mm plastic slide mounts. Elements from sodium through uranium are detected with detection limits less than one nanogram in favorable cases. Precision of the measurement is better than 2 % relative in favorable cases for secondary-target excitation, and is typically 5 to 10 % for direct excitation given the geometry of the instrument. Detection limits are as low as a part per billion relative to the original liquid for solutions whose total dissolved solid content is 1000 part per million or less.

Application of Synchrotron Radiation Excited X-Ray Fluorescence Analysis to Micro and Trace Element Determination

1985 ◽  
Vol 29 ◽  
pp. 427-434
Author(s):  
Atsuo lida ◽  
Yohichi Gohshi ◽  
Hideki Maezawa
Keyword(s):  
Synchrotron Radiation ◽  
Trace Element ◽  
Trace Element Analysis ◽  
Fluorescence Analysis ◽  
Light Elements ◽  
Element Analysis ◽  
Element Determination ◽  
Undulator Radiation ◽  
Silicon Compounds ◽  
X Ray

AbstractMicro and trace element analysis by X-ray fluorescence was carried out using synchrotron radiation from a bending magnet and an undulator for hard and soft X-ray excitation respectively. The minimum detection limits obtained in the hard X-ray region were less than pg, which corresponds to a spatial resolution of less than a hundred micronmeters, with a detection limit of a few ppm. Light elements such as oxygen, nitrogen and carbon in silicon compounds were analyzed by soft X-ray emission spectroscopy using undulator radiation. The minimum detectable amount of the light elements was greatly improved, since undulator radiation is very strong in intensity, and is highly collimated.

Trace Element Analysis by Synchrotron Radiation Excited XRF

1983 ◽  
Vol 27 ◽  
pp. 557-562
Author(s):  
S.T. Davies ◽  
D.K. Bowen ◽  
M. Prins ◽  
A.J.J. Bos
Keyword(s):  
Synchrotron Radiation ◽  
Trace Element ◽  
Trace Element Analysis ◽  
Science And Engineering ◽  
Element Analysis ◽  
Host Matrix ◽  
X Ray ◽  
Laser Microprobe ◽  
Fluorescence Methods ◽  
Electron Storage Rings

The ability rapidly and quantitatively to detect trace elements in a host matrix is of great importance in many areas of science and engineering. This fact is underlined by the considerable amount of effort that has been put into developing such techniques as electron probe microanalysis, proton Induced x-ray emission (Pixe), the laser microprobe mass analyser (Lamma) as well as conventional x-ray fluorescence methods. Recently the availability of electron storage rings partially or wholly dedicated to producing intense beams of synchrotron radiation has provided a new tpol to complement the above mentioned techniques. This paper reports on work at Daresbury Laboratory on synchrotron x-ray fluorescence (SXRF) fo r quantitative trace element analysis.

Monitoring of the environmental pollution by trace element analysis in tree-rings using synchrotron radiation total reflection X-ray fluorescence

2006 ◽  
Vol 61 (10-11) ◽  
pp. 1170-1174 ◽  
Author(s):  
Ana Elisa Sirito de Vives ◽  
Silvana Moreira ◽  
Sandra Maria Boscolo Brienza ◽  
Jean Gabriel Silva Medeiros ◽  
Mário Tomazello Filho ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Environmental Pollution ◽  
Trace Element ◽  
Tree Rings ◽  
Trace Element Analysis ◽  
Total Reflection ◽  
Element Analysis ◽  
X Ray

Trace element analysis on Si wafer surfaces by TXRF at the ID32 ESRF undulator beamline

1998 ◽  
Vol 5 (3) ◽  
pp. 1064-1066 ◽  
Author(s):  
Luc Ortega ◽  
Fabio Comin ◽  
Vincenzo Formoso ◽  
Andreas Stierle
Keyword(s):  
Synchrotron Radiation ◽  
Trace Element ◽  
Trace Element Analysis ◽  
Element Analysis ◽  
Double Crystal ◽  
X Ray ◽  
Double Crystal Monochromator ◽  
First Results ◽  
Set Up ◽  
Wave Methods

Synchrotron radiation total-reflection X-ray fluorescence (SR-TXRF) has been applied to the impurity analysis of Si wafers using a third-generation synchrotron radiation undulator source. A lower limit of detectability (LLD) for Ni atoms of 17 fg (1.7 × 108 atoms cm−2) has been achieved with an optical set-up based on an Si(111) double-crystal monochromator and a horizontal sample geometry. These first results are very promising for synchrotron radiation trace element analysis since we estimate that it is possible to lower the LLD by a factor of about 25 by employing appropriate optics and detectors. The use of a crystal monochromator opens new possibilities to perform absorption and scattering experiments (NEXAFS and X-ray standing-wave methods) for chemical and structural analysis of ultratrace elements.

An improved interference correction for trace element analysis

1992 ◽  
Vol 50 (2) ◽  
pp. 1646-1647
Author(s):  
John J. Donovan ◽  
Donald A. Snyder ◽  
Mark L. Rivers
Keyword(s):  
Trace Element Analysis ◽  
Accurate Estimate ◽  
Simple Expression ◽  
Standard Reference Materials ◽  
Characteristic Line ◽  
Analytical Line ◽  
Element Analysis ◽  
Electron Probe Analysis ◽  
Calculated Concentration ◽  
X Ray

We present a simple expression for the quantitative treatment of interference corrections in x-ray analysis. WDS electron probe analysis of standard reference materials illustrate the success of the technique.For the analytical line of wavelength λ of any element A which lies near or on any characteristic line of another element B, the observed x-ray counts at We use to denote x-ray counts excited by element i in matrix j (u=unknown; s=analytical standard; ŝ=interference standard) at the wavelength of the analytical line of A, λA (Fig. 1). Quantitative analysis of A requires an accurate estimate of These counts can be estimated from the ZAF calculated concentration of B in the unknown C,Bu measured counts at λA in an interference standard of known concentration of B (and containing no A), and ZAF correction parameters for the matrices of both the unknown and the interference standard at It can be shown that:

Improvement of the Detection Sensitivity of Edxrf Trace Element Analysis by Means of Efficient X-Ray Focusing Based on Strongly Curved Hopg Crystals

1995 ◽  
Vol 39 ◽  
pp. 109-117
Author(s):  
Burkhard Beckhoff ◽  
Birgit Kanngießer
Keyword(s):  
High Intensity ◽  
Focal Plane ◽  
Bragg Reflection ◽  
Pyrolytic Graphite ◽  
Trace Element Analysis ◽  
Detection Sensitivity ◽  
Element Analysis ◽  
X Ray ◽  
Wide Range ◽  
Very High

X-ray focusing based on Bragg reflection at curved crystals allows collection of a large solid angle of incident radiation, monochromatization of this radiation, and condensation of the beam reflected at the crystal into a small spatial cross-section in a pre-selected focal plane. Thus, for the Bragg reflected radiation, one can achieve higher intensities than for the radiation passing directly to the same small area in the focal plane. In that case one can profit considerably from X-ray focusing in an EDXRF arrangement. The 00 2 reflection at Highly Oriented Pyrolytic Graphite (HOPG) crystals offers a very high intensity of the Bragg reflected beam for a wide range of photon energies. Furthermore, curvature radii smaller than 10 mm can be achieved for HOPG crystals ensuring efficient X-ray focusing in EDXRF applications. For the trace analysis of very small amounts of specimen material deposited on small areas of thin-filter backings, HOPG based X-ray focusing may be used to achieve a very high intensity of monochromatic excitation radiation.

Trace element analysis via heavy ion induced X-ray fluorescence

1976 ◽  
Vol 279 (2) ◽  
pp. 160-160 ◽  
Author(s):  
R. Zeisler ◽  
J. Cross ◽  
E. A. Schweikert
Keyword(s):  
Trace Element ◽  
Trace Element Analysis ◽  
Heavy Ion ◽  
Element Analysis ◽  
X Ray
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