scholarly journals A 65 nm CMOS analog processor with zero dead time for future pixel detectors

Author(s):  
L. Gaioni ◽  
D. Braga ◽  
D.C. Christian ◽  
G. Deptuch ◽  
F. Fahim ◽  
...  
2013 ◽  
Vol 20 (2) ◽  
pp. 347-354 ◽  
Author(s):  
B. A. Sobott ◽  
Ch. Broennimann ◽  
B. Schmitt ◽  
P. Trueb ◽  
M. Schneebeli ◽  
...  
Keyword(s):  

2018 ◽  
Author(s):  
Davide Braga ◽  
Luigi Gaioni ◽  
David Charles Christian ◽  
Grzegorz Deptuch ◽  
Farah Fahim ◽  
...  

2019 ◽  
Vol 26 (5) ◽  
pp. 1621-1630 ◽  
Author(s):  
Gabriel Blaj

Modern photon-counting pixel detectors have enabled a revolution in applications at synchrotron light sources and beyond in the last decade. One of the limitations of the current detectors is their reduced counting linearity or even paralysis at high counting rates, due to dead-time which results in photon pile-up. Existing dead-time and pile-up models fail to reproduce the complexity of dead-time effects on photon-counting, resulting in empirical calibrations for particular detectors at best, imprecise linearization methods, or no linearization. This problem will increase in the future as many synchrotron light sources plan significant brilliance upgrades and free-electron lasers plan moving to a quasi-continuous operation mode. Presented here are the first models that use the actual behavior of the analog pre-amplifiers in spectroscopic photon-counting pixel detectors with constant current discharge (e.g. the Medipix and CPix families of detectors) to deduce more accurate analytical models and optimal linearization methods. In particular, for detectors with at least two counters per pixel, the need for calibration, or previous knowledge of the detector and beam parameters (dead-time, integration time, large sets of synchrotron filling patterns), is completely eliminated. This is summarized in several models of increasing complexity and accuracy. Finally, a general empirical approach is presented, applicable to any particular cases where the analytical approach is not sufficiently precise.


Author(s):  
JR Fryer ◽  
Z Huang ◽  
D Stirling ◽  
G. Webb

Platinum dispersed on γ-alumina is used as a reforming catalyst to convert linear hydrocarbons to cyclic aromatic products. To improve selectivity and lifetime of the catalyst, other elements are included, and we have studied the distributions of Pt/Re, and Pt/Sn, bimetallic systems on the support both before and after use in octane reforming. Often, one or both of the components are not resolvable by HREM or microanalysis as individual particles because of small size and lack of contrast on the alumina, and divergent beam microanalysis has been used to establish the presence and relationship between the two elements.In the majority of catalysts the platinum is in the form of small panicles, some of which are large enough to be resolvable in the microscope. The ABT002B microscope with Link windowless Pentafet detector, used in this work, was able to obtain a resolvable signal from particles of 2nm diameter upwards. When the beam was concentrated on to such a particle the signal was at a maximum, and as the beam diameter was diverged - at the same total beam intensity and dead time - the signal decreased as shown in Figure 1.


Author(s):  
John J. Friel

Committee E-04 on Metallography of the American Society for Testing and Materials (ASTM) conducted an interlaboratory round robin test program on quantitative energy dispersive spectroscopy (EDS). The test program was designed to produce data on which to base a precision and bias statement for quantitative analysis by EDS. Nine laboratories were sent specimens of two well characterized materials, a type 308 stainless steel, and a complex mechanical alloy from Inco Alloys International, Inconel® MA 6000. The stainless steel was chosen as an example of a straightforward analysis with no special problems. The mechanical alloy was selected because elements were present in a wide range of concentrations; K, L, and M lines were involved; and Ta was severely overlapped with W. The test aimed to establish limits of precision that could be routinely achieved by capable laboratories operating under real world conditions. The participants were first allowed to use their own best procedures, but later were instructed to repeat the analysis using specified conditions: 20 kV accelerating voltage, 200s live time, ∼25% dead time and ∼40° takeoff angle. They were also asked to run a standardless analysis.


2002 ◽  
Vol 12 (6) ◽  
pp. 385-390 ◽  
Author(s):  
J.-F. Bérar ◽  
L. Blanquart ◽  
N. Boudet ◽  
P. Breugnon ◽  
B. Caillot ◽  
...  

2016 ◽  
Vol 136 (5) ◽  
pp. 676-682 ◽  
Author(s):  
Akihiro Ishimura ◽  
Masayoshi Nakamoto ◽  
Takuya Kinoshita ◽  
Toru Yamamoto

2020 ◽  
Vol 140 (3) ◽  
pp. 175-183
Author(s):  
Kengo Kawauchi ◽  
Hayato Higa ◽  
Hiroki Watanabe ◽  
Keisuke Kusaka ◽  
Jun-ichi Itoh

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