Resistive switching characteristics of ZnO–graphene quantum dots and their use as an active component of an organic memory cell with one diode-one resistor architecture

2015 ◽  
Vol 18 ◽  
pp. 77-83 ◽  
Author(s):  
Yongsung Ji ◽  
Sang-A Lee ◽  
An-Na Cha ◽  
Munju Goh ◽  
Sukang Bae ◽  
...  
2015 ◽  
Vol 25 ◽  
pp. 225-231 ◽  
Author(s):  
Shawkat Ali ◽  
Jinho Bae ◽  
Chong Hyun Lee ◽  
Kyung Hyun Choi ◽  
Yang Hoi Doh

2019 ◽  
Vol 30 (25) ◽  
pp. 255701 ◽  
Author(s):  
Artem I Ivanov ◽  
Nadezhda A Nebogatikova ◽  
Igor A Kotin ◽  
Svetlana A Smagulova ◽  
Irina V Antonova

Author(s):  
Yongbian Kuang ◽  
Ru Huang ◽  
Dake Wu ◽  
Yu Tang ◽  
Zhe Yu ◽  
...  

2018 ◽  
Vol 81 (2) ◽  
pp. 20101 ◽  
Author(s):  
Weijie Duan ◽  
Zhenxing Liu ◽  
Yang Zhang

Resistive switching random access memory (RRAM) has attracted great attention due to its outstanding performance for the next generation non-volatile memory. However, the unexpected failure behaviors seriously hinder the further studies and applications of this new memory device. In this work, the bipolar resistive switching characteristics in Pt/CdS/Cu2O/FTO cells are investigated. The CdS inter-layer is used to suppress the failure behavior in set process. Comparing to the Pt/Cu2O/FTO cell, the switching process in Pt/CdS/Cu2O/FTO cell is not affected even at a high set voltage and the failure behavior is eliminated effectively. Therefore, this work proposes a feasible approach to solve the failure problem in RRAM.


2021 ◽  
Vol 118 (1) ◽  
pp. 013501
Author(s):  
Yiwei Duan ◽  
Haixia Gao ◽  
Jingshu Guo ◽  
Mei Yang ◽  
Zhenxi Yu ◽  
...  

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