Enhanced electrical properties of polycarbonate/carbon nanotube nanocomposites prepared by a supercritical carbon dioxide aided melt blending method

Polymer ◽  
2014 ◽  
Vol 55 (23) ◽  
pp. 6167-6175 ◽  
Author(s):  
John P. Quigley ◽  
Kevin Herrington ◽  
Donald G. Baird
2014 ◽  
Vol 117 (3) ◽  
pp. 1003-1017 ◽  
Author(s):  
John P. Quigley ◽  
Kevin Herrington ◽  
Michael Bortner ◽  
Donald G. Baird

2006 ◽  
Vol 9 (4) ◽  
pp. G124 ◽  
Author(s):  
Po-Tsun Liu ◽  
C. T. Tsai ◽  
T. C. Chang ◽  
K. T. Kin ◽  
P. L. Chang ◽  
...  

Polymer ◽  
2015 ◽  
Vol 59 ◽  
pp. 117-123 ◽  
Author(s):  
Laure Monnereau ◽  
Laetitia Urbanczyk ◽  
Jean-Michel Thomassin ◽  
Thomas Pardoen ◽  
Christian Bailly ◽  
...  

2013 ◽  
Vol 771 ◽  
pp. 51-54
Author(s):  
Ying Hu Li ◽  
Li Kuo Zhou ◽  
Chao Qun Li

In this work, polystyrene/ graphene nanocomposite foams were prepared using supercritical carbon dioxide. Chemically reduced graphene oxide were incorporated into PS using latex mixing. Subsequently, the nanocomposites were foamed with supercritical CO2, the foaming temperature is varied. The morphology and electrical properties of the foamed samples were discussed. It is suggested that foaming temperature has significant influence on the morphology of foams. For those samples foamed at higher temperature, foams have thin cell wall and low density even when the content of graphene is relatively high, while they possess good electrical conductivity, may be used as light weight functional materials.


2012 ◽  
Vol 06 ◽  
pp. 104-108
Author(s):  
CHIEN-MIN CHENG ◽  
MING-CHANG KUAN ◽  
KAI-HUNAG CHEN ◽  
JEN-HWAN TSAI

Electrical and physical properties of as-deposited Bi 3.9 La 0.1 Ti 2.9 V 0.1 O 12 (BLTV) ferroelectric thin films on SiO 2/ Si (100) substrates were improved by low temperature supercritical carbon dioxide fluid (SCF) process treatment. The as-deposited BLTV ferroelectric thin films were treated by SCF process which mixed with propyl alcohol and pure water. The memory windows increased in C-V curves, and the oxygen vacancy and defect in leakage current density curves were obtained after SCF process treatment. Finally, the improvement properties of as-deposited BLTV thin films after SCF process treatment were investigated by XPS, C-V, and J-E measurement. The mechanism concerning the dependence of electrical properties of the ferroelectric thin films on the SCF process was investigated and discussed.


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