Fine-control-valve of halide perovskite single crystal quality for high performance X-ray detection

Abstract Hybrid halide perovskite has been recently focused on thermoelectric energy harvesting due to the cost-effective fabrication approach and ultra-low thermal conductivity. To achieve high performance, tuning of electrical conductivity is a key parameter that is influenced by grain boundary scattering and charge carrier density. The fabrication process allows tuning these parameters. We report the use of anti-solvent to enhance the thermoelectric performance of lead-free hybrid halide perovskite, CH3NH3SnI3, thin films. Thin films with anti-solvent show higher connectivity in grains and higher Sn+4 oxidation states which results in enhancing the value of electrical conductivity. Thin films were prepared by a cost-effective wet process. Structural and chemical characterizations were performed using x-ray diffraction, scanning electron microscope, and x-ray photoelectron spectroscopy. The value of electrical conductivity and the Seebeck coefficient were measured near room temperature. The high value of power factor (1.55 µW/m.K2 at 320 K) was achieved for thin films treated with anti-solvent.

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Low Defect Density Bulk AlN Substrates for High Performance Electronics and Optoelectronics

Materials Science Forum ◽

10.4028/www.scientific.net/msf.717-720.1287 ◽

2012 ◽

Vol 717-720 ◽

pp. 1287-1290 ◽

Cited By ~ 18

Author(s):

Balaji Raghothamachar ◽

Rafael Dalmau ◽

Baxter Moody ◽

H. Spalding Craft ◽

Raoul Schlesser ◽

...

Keyword(s):

Single Crystal ◽

Basal Plane ◽

High Performance ◽

Defect Density ◽

Vapor Transport ◽

Physical Vapor Transport ◽

Threading Dislocations ◽

Crystalline Perfection ◽

X Ray

Using the physical vapor transport (PVT) method, single crystal boules of AlN have been grown and wafers sliced from them have been characterized by synchrotron white beam X-ray topography (SWBXT) in conjunction with optical microscopy. X-ray topographs reveal that the wafers contain dislocations that are inhomogeneously distributed with densities varying from as low as 0 cm-2 to as high as 104 cm-2. Two types of dislocations have been identified: basal plane dislocations and threading dislocations, both having Burgers vectors of type 1/3<112-0> indicating that their origin is likely due to post-growth deformation. In some cases, the dislocations are arranged in low angle grain boundaries. However, large areas of the wafers are nearly dislocation-free and section X-ray topographs of these regions reveal the high crystalline perfection.

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High Performance X-ray to Current Converters Fabricated Via Sintering or Melting of a Metal-halide Perovskite

10.29363/nanoge.ngfm.2019.142 ◽

2019 ◽

Author(s):

Gebhard J. Matt ◽

Ievgen Levchuk ◽

Judith Knüttel ◽

Shreetu Shrestha ◽

Johannes Dallmann ◽

...

Keyword(s):

High Performance ◽

Metal Halide ◽

X Ray ◽

Metal Halide Perovskite ◽

Halide Perovskite

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High-sensitivity X-ray imaging of a lead halide perovskite single-crystal scintillator

Optics Letters ◽

10.1364/ol.45.000355 ◽

2020 ◽

Vol 45 (2) ◽

pp. 355 ◽

Cited By ~ 3

Author(s):

Qiang Xu ◽

Wenyi Shao ◽

Yang Li ◽

Zhichao Zhu ◽

Bo Liu ◽

...

Keyword(s):

Single Crystal ◽

High Sensitivity ◽

X Ray ◽

X Ray Imaging ◽

Crystal Scintillator ◽

Halide Perovskite ◽

Lead Halide

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Large Lead‐Free Perovskite Single Crystal for High‐Performance Coplanar X‐Ray Imaging Applications

Advanced Optical Materials ◽

10.1002/adom.202000814 ◽

2020 ◽

Vol 8 (19) ◽

pp. 2000814 ◽

Cited By ~ 1

Author(s):

Yucheng Liu ◽

Yunxia Zhang ◽

Zhou Yang ◽

Jian Cui ◽

Haodi Wu ◽

...

Keyword(s):

Single Crystal ◽

High Performance ◽

Lead Free ◽

X Ray ◽

X Ray Imaging

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High Performance X-ray to Current Converters Fabricated Via Sintering or Melting of a Metal-halide Perovskite

10.29363/nanoge.nfm.2019.142 ◽

2019 ◽

Author(s):

Gebhard J. Matt ◽

Ievgen Levchuk ◽

Judith Knüttel ◽

Shreetu Shrestha ◽

Johannes Dallmann ◽

...

Keyword(s):

High Performance ◽

Metal Halide ◽

X Ray ◽

Metal Halide Perovskite ◽

Halide Perovskite

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High-performance compact-multi-crystal analyzer for X-ray diffractometer scans

Journal of Applied Crystallography ◽

10.1107/s0021889809008966 ◽

2009 ◽

Vol 42 (3) ◽

pp. 485-489 ◽

Cited By ~ 2

Author(s):

Hideo Toraya

Keyword(s):

Single Crystal ◽

High Performance ◽

Logarithmic Spiral ◽

Perfect Crystal ◽

X Ray ◽

Crystal Analyzer ◽

Order Of Magnitude ◽

Position Sensitive ◽

Diffraction Patterns ◽

Lattice Planes

A new high-performance diffracted-beam analyzer consisting of multiple pieces of a perfect crystal is proposed. The pieces of Ge(111) crystal are set so that their crystal lattice planes coincide with tangent planes of a logarithmic spiral function. Each piece of the crystal works in the same manner as a single-crystal analyzer. An X-ray beam diffracted from a specimen is diffracted successively by individual crystals of the analyzer, and these diffracted beams are detected separately by a one-dimensional position-sensitive detector. If the analyzer consists of, for example, ten pieces of crystal, ten diffraction patterns can be observed in a single diffractometer scan, and they can be integrated into a single diffraction pattern. Thus the resulting intensity becomes greater by one order of magnitude, while the angular resolution is the same as that of a single-crystal analyzer. The geometrical aspects of the analyzer are described, and some experimental results are given.

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