Guanidinium cation doped (Gua)x(MA)1−xPbI3 single crystal for high performance X-ray detector

2021 ◽  
pp. 165234
Author(s):  
WanFu Wang ◽  
Qiang Xu
Keyword(s):  
Single Crystal ◽  
High Performance ◽  
X Ray ◽  
Guanidinium Cation

Triple‐Cation and Mixed‐Halide Perovskite Single Crystal for High‐Performance X‐ray Imaging

2021 ◽  
Vol 33 (8) ◽  
pp. 2006010
Author(s):  
Yucheng Liu ◽  
Yunxia Zhang ◽  
Xuejie Zhu ◽  
Jiangshan Feng ◽  
Ioannis Spanopoulos ◽  
...  
Keyword(s):  
Single Crystal ◽  
High Performance ◽  
X Ray ◽  
X Ray Imaging ◽  
Halide Perovskite

Fine-control-valve of halide perovskite single crystal quality for high performance X-ray detection

2021 ◽  
Author(s):  
Weijun Li ◽  
Huayang Li ◽  
Jinmei Song ◽  
Chunjie Guo ◽  
Huimao Zhang ◽  
...  
Keyword(s):  
Single Crystal ◽  
High Performance ◽  
Control Valve ◽  
Crystal Quality ◽  
X Ray ◽  
Fine Control ◽  
Halide Perovskite

Low Defect Density Bulk AlN Substrates for High Performance Electronics and Optoelectronics

2012 ◽  
Vol 717-720 ◽  
pp. 1287-1290 ◽  
Author(s):  
Balaji Raghothamachar ◽  
Rafael Dalmau ◽  
Baxter Moody ◽  
H. Spalding Craft ◽  
Raoul Schlesser ◽  
...  
Keyword(s):  
Single Crystal ◽  
Basal Plane ◽  
High Performance ◽  
Defect Density ◽  
Vapor Transport ◽  
Physical Vapor Transport ◽  
Threading Dislocations ◽  
Crystalline Perfection ◽  
X Ray

Using the physical vapor transport (PVT) method, single crystal boules of AlN have been grown and wafers sliced from them have been characterized by synchrotron white beam X-ray topography (SWBXT) in conjunction with optical microscopy. X-ray topographs reveal that the wafers contain dislocations that are inhomogeneously distributed with densities varying from as low as 0 cm-2 to as high as 104 cm-2. Two types of dislocations have been identified: basal plane dislocations and threading dislocations, both having Burgers vectors of type 1/3<112-0> indicating that their origin is likely due to post-growth deformation. In some cases, the dislocations are arranged in low angle grain boundaries. However, large areas of the wafers are nearly dislocation-free and section X-ray topographs of these regions reveal the high crystalline perfection.

Large Lead‐Free Perovskite Single Crystal for High‐Performance Coplanar X‐Ray Imaging Applications

2020 ◽  
Vol 8 (19) ◽  
pp. 2000814 ◽  
Author(s):  
Yucheng Liu ◽  
Yunxia Zhang ◽  
Zhou Yang ◽  
Jian Cui ◽  
Haodi Wu ◽  
...  
Keyword(s):  
Single Crystal ◽  
High Performance ◽  
Lead Free ◽  
X Ray ◽  
X Ray Imaging

High-performance compact-multi-crystal analyzer for X-ray diffractometer scans

2009 ◽  
Vol 42 (3) ◽  
pp. 485-489 ◽  
Author(s):  
Hideo Toraya
Keyword(s):  
Single Crystal ◽  
High Performance ◽  
Logarithmic Spiral ◽  
Perfect Crystal ◽  
X Ray ◽  
Crystal Analyzer ◽  
Order Of Magnitude ◽  
Position Sensitive ◽  
Diffraction Patterns ◽  
Lattice Planes

A new high-performance diffracted-beam analyzer consisting of multiple pieces of a perfect crystal is proposed. The pieces of Ge(111) crystal are set so that their crystal lattice planes coincide with tangent planes of a logarithmic spiral function. Each piece of the crystal works in the same manner as a single-crystal analyzer. An X-ray beam diffracted from a specimen is diffracted successively by individual crystals of the analyzer, and these diffracted beams are detected separately by a one-dimensional position-sensitive detector. If the analyzer consists of, for example, ten pieces of crystal, ten diffraction patterns can be observed in a single diffractometer scan, and they can be integrated into a single diffraction pattern. Thus the resulting intensity becomes greater by one order of magnitude, while the angular resolution is the same as that of a single-crystal analyzer. The geometrical aspects of the analyzer are described, and some experimental results are given.

High‐Performance X‐Ray Detector Based on Liquid Diffused Separation Induced Cs 3 Bi 2 I 9 Single Crystal

2021 ◽  
pp. 2101351
Author(s):  
Shunyong Wei ◽  
Shujie Tie ◽  
Kai Shen ◽  
Tixian Zeng ◽  
Jihua Zou ◽  
...  
Keyword(s):  
Single Crystal ◽  
High Performance ◽  
X Ray

High-performance single crystal CH3NH3PbI3 perovskite x-ray detector

2021 ◽  
Vol 118 (6) ◽  
pp. 063506
Author(s):  
Xiangshun Geng ◽  
Hainan Zhang ◽  
Jun Ren ◽  
Peiyi He ◽  
Peigen Zhang ◽  
...  
Keyword(s):  
Single Crystal ◽  
High Performance ◽  
X Ray

High-Performance X-ray Detector Based on Single-Crystal β-Ga2O3:Mg

2021 ◽  
Vol 13 (2) ◽  
pp. 2879-2886
Author(s):  
Jiawen Chen ◽  
Huili Tang ◽  
Bo Liu ◽  
Zhichao Zhu ◽  
Mu Gu ◽  
...  
Keyword(s):  
Single Crystal ◽  
High Performance ◽  
X Ray

Electron Microscopy of Shock Loaded Polycrystalline Beryllium

1974 ◽  
Vol 32 ◽  
pp. 506-507 ◽  
Author(s):  
J. M. Galbraith ◽  
L. E. Murr ◽  
A. L. Stevens
Keyword(s):  
Electron Microscopy ◽  
Wave Propagation ◽  
Structural Change ◽  
Single Crystal ◽  
Diffraction Pattern ◽  
Shock Loading ◽  
Slip Systems ◽  
Compression Tests ◽  
X Ray Diffraction ◽  
X Ray

Uniaxial compression tests and hydrostatic tests at pressures up to 27 kbars have been performed to determine operating slip systems in single crystal and polycrystal1ine beryllium. A recent study has been made of wave propagation in single crystal beryllium by shock loading to selectively activate various slip systems, and this has been followed by a study of wave propagation and spallation in textured, polycrystal1ine beryllium. An alteration in the X-ray diffraction pattern has been noted after shock loading, but this alteration has not yet been correlated with any structural change occurring during shock loading of polycrystal1ine beryllium.This study is being conducted in an effort to characterize the effects of shock loading on textured, polycrystal1ine beryllium. Samples were fabricated from a billet of Kawecki-Berylco hot pressed HP-10 beryllium.

Macroprobe Mode for the Study of Segregation in Steels

1990 ◽  
Vol 48 (2) ◽  
pp. 260-261
Author(s):  
Auclair Gilles ◽  
Benoit Danièle
Keyword(s):  
Mechanical Properties ◽  
Spatial Distribution ◽  
High Performance ◽  
Volume Fraction ◽  
Sheet Steel ◽  
Acquisition Time ◽  
Chemical Information ◽  
X Ray ◽  
Accurate Quantitative Analysis ◽  
Optical Micrographs

During these last 10 years, high performance correction procedures have been developed for classical EPMA, and it is nowadays possible to obtain accurate quantitative analysis even for soft X-ray radiations. It is also possible to perform EPMA by adapting this accurate quantitative procedures to unusual applications such as the measurement of the segregation on wide areas in as-cast and sheet steel products.The main objection for analysis of segregation in steel by means of a line-scan mode is that it requires a very heavy sampling plan to make sure that the most significant points are analyzed. Moreover only local chemical information is obtained whereas mechanical properties are also dependant on the volume fraction and the spatial distribution of highly segregated zones. For these reasons we have chosen to systematically acquire X-ray calibrated mappings which give pictures similar to optical micrographs. Although mapping requires lengthy acquisition time there is a corresponding increase in the information given by image anlysis.

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