Environmental challenges of the intensive woody crops: The case of super high-density olive groves

Understanding how small mammals (SM) are associated with environmental characteristics in olive groves is important to identify potential threats to agriculture and assess the overall conservation value and functioning of agro-ecosystems. Here, we provide first insights on this topic applied to traditional olive groves in northeast (NE) Portugal by assessing the landscape attributes that determine SM occurrence, focusing on one species of conservation concern (Microtus cabrerae Thomas 1906) and one species often perceived as a potential pest of olives (Microtus lusitanicus Gerbe 1879). Based on SM genetic non-invasive sampling in 51 olive groves and surrounding habitats, we identified seven rodent species and one insectivore. Occupancy modelling indicated that SM were generally less detected within olive groves than in surrounding habitats. The vulnerable M. cabrerae reached a mean occupancy (95% CI) of 0.77 (0.61–0.87), while M. lusitanicus stood at 0.37 (0.24–0.52). M. cabrerae was more likely to occur in land mosaics with high density of agricultural field edges, while M. lusitanicus was more associated with high density of pastureland patches. Overall, our study suggests that the complex structure and spatial heterogeneity of traditionally managed olive grove agro-ecosystems may favor the occurrence of species-rich SM communities, possibly including well-established populations of species of conservation importance, while keeping potential pest species at relatively low occupancy rates.

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Short-term dynamics of soil chemical parameters after application ofalperujoin high-density drip-irrigated olive groves in Argentina

International Journal of Environmental Studies ◽

10.1080/00207233.2012.693290 ◽

2012 ◽

Vol 69 (4) ◽

pp. 578-588 ◽

Cited By ~ 3

Author(s):

Pablo Monetta ◽

Luis Bueno ◽

Vanina Cornejo ◽

Fernando González-Aubone ◽

Germán Babelis

Keyword(s):

High Density ◽

Chemical Parameters ◽

Short Term ◽

Olive Groves ◽

Soil Chemical Parameters

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New Missionaries

Boom A Journal of California ◽

10.1525/boom.2014.4.4.54 ◽

2014 ◽

Vol 4 (4) ◽

pp. 54-63

Author(s):

Marc Flacks

Keyword(s):

Olive Oil ◽

Oil Production ◽

High Density ◽

Small Scale ◽

Historical Information ◽

Scale Family ◽

State Senator ◽

Olive Groves ◽

Olive Industry ◽

California Olive

Featuring a wide cast of players, from small-scale family-owned operations to large corporate enterprises, Flacks reports on contemporary olive oil production in California, presenting historical information, photos, and legislative testimony. Recent efforts to establish a mature California olive industry and standards, including those of the UC Davis Olive Center, the California Olive Oil Council, and state Senator Lois Wolk are described. The involvement of Spaniards in California olive oil production, from the earliest days of the state’s history, to current efforts to expand super high density olive groves, is highlighted.

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Planar defects in ordered (Ga,In)P

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100106570 ◽

1988 ◽

Vol 46 ◽

pp. 902-903

Author(s):

S. McKernan ◽

C. B. Carter ◽

D. Bour ◽

J. R. Shealy

Keyword(s):

Electron Diffraction ◽

Vapor Phase ◽

Growth Direction ◽

High Density ◽

Ordered Structure ◽

Planar Defects ◽

Diffraction Patterns ◽

Ternary Semiconductors ◽

Anion Species ◽

Metallic Vapor

The growth of ternary III-V semiconductors by organo-metallic vapor phase epitaxy (OMVPE) is widely practiced. It has been generally assumed that the resulting structure is the same as that of the corresponding binary semiconductors, but with the two different cation or anion species randomly distributed on their appropriate sublattice sites. Recently several different ternary semiconductors including AlxGa1-xAs, Gaxln-1-xAs and Gaxln1-xP1-6 have been observed in ordered states. A common feature of these ordered compounds is that they contain a relatively high density of defects. This is evident in electron diffraction patterns from these materials where streaks, which are typically parallel to the growth direction, are associated with the extra reflections arising from the ordering. However, where the (Ga,ln)P epilayer is reasonably well ordered the streaking is extremely faint, and the intensity of the ordered spot at 1/2(111) is much greater than that at 1/2(111). In these cases it is possible to image relatively clearly many of the defects found in the ordered structure.

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Quantitative defect studies in semiconductor TEM samples prepared by low angle ion milling

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100138932 ◽

1995 ◽

Vol 53 ◽

pp. 512-513

Author(s):

L. Mulestagno ◽

J.C. Holzer ◽

P. Fraundorf

Keyword(s):

Sample Preparation ◽

Milling Time ◽

High Density ◽

Low Density ◽

Ion Milling ◽

High Quality ◽

Variable Angle ◽

Major Disadvantage ◽

Induced Defects

Due to the wealth of information, both analytical and structural that can be obtained from it TEM always has been a favorite tool for the analysis of process-induced defects in semiconductor wafers. The only major disadvantage has always been, that the volume under study in the TEM is relatively small, making it difficult to locate low density defects, and sample preparation is a somewhat lengthy procedure. This problem has been somewhat alleviated by the availability of efficient low angle milling.Using a PIPS® variable angle ion -mill, manufactured by Gatan, we have been consistently obtaining planar specimens with a high quality thin area in excess of 5 × 104 μm2 in about half an hour (milling time), which has made it possible to locate defects at lower densities, or, for defects of relatively high density, obtain information which is statistically more significant (table 1).

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Using the scanning electron microscope for failure analysis of high density magnetic media

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100126755 ◽

1987 ◽

Vol 45 ◽

pp. 392-393

Author(s):

Evelyn R. Ackerman ◽

Gary D. Burnett

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Failure Analysis ◽

High Density ◽

Magnetic Media ◽

Specific Data ◽

Retrieval Systems ◽

Operating Environments ◽

The Media ◽

Scanning Electron

Advancements in state of the art high density Head/Disk retrieval systems has increased the demand for sophisticated failure analysis methods. From 1968 to 1974 the emphasis was on the number of tracks per inch. (TPI) ranging from 100 to 400 as summarized in Table 1. This emphasis shifted with the increase in densities to include the number of bits per inch (BPI). A bit is formed by magnetizing the Fe203 particles of the media in one direction and allowing magnetic heads to recognize specific data patterns. From 1977 to 1986 the tracks per inch increased from 470 to 1400 corresponding to an increase from 6300 to 10,800 bits per inch respectively. Due to the reduction in the bit and track sizes, build and operating environments of systems have become critical factors in media reliability.Using the Ferrofluid pattern developing technique, the scanning electron microscope can be a valuable diagnostic tool in the examination of failure sites on disks.

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