The role of cobalt doping on the optical and structural properties of Mn3O4 nanostructured thin films obtained by SILAR technique

2019 ◽  
Vol 128 ◽  
pp. 212-220 ◽  
Author(s):  
Ozkan Bayram ◽  
Erdal İgman ◽  
Harun Guney ◽  
Onder Simsek
Keyword(s):  
Thin Films ◽  
Structural Properties ◽  
Cobalt Doping ◽  
Nanostructured Thin Films ◽  
Silar Technique

X-ray studies on optical and structural properties of ZnO nanostructured thin films

2006 ◽  
Vol 39 (1-4) ◽  
pp. 267-274 ◽  
Author(s):  
S. Larcheri ◽  
C. Armellini ◽  
F. Rocca ◽  
A. Kuzmin ◽  
R. Kalendarev ◽  
...  
Keyword(s):  
Thin Films ◽  
Structural Properties ◽  
X Ray ◽  
Nanostructured Thin Films

Effect of RF Power on the Formation and Morphology Evolution of ZnO Nanostructured Thin Films

2012 ◽  
Vol 576 ◽  
pp. 577-581 ◽  
Author(s):  
N.D.M. Sin ◽  
Mohamad Hafiz Mamat ◽  
Mohamed Zahidi Musa ◽  
S. Ahmad ◽  
A. Abdul Aziz ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Structural Properties ◽  
Zno Thin Films ◽  
Morphology Evolution ◽  
Zno Thin Film ◽  
Rf Power ◽  
Nanostructured Thin Films ◽  
Atomic Force ◽  
Current Voltage

The effect of RF power on the formation and morphology evolution of ZnO nanostructured thin films deposited by magnetron sputtering are presented. This project focused on electrical, optical and structural properties of ZnO thin films. The effect of variation of RF power at 50 watt-250 watt at 200 °C on glass substrate of the ZnO thin films was investigated. The thin films were examined for electrical properties and optical properties using two point probe current-voltage (I-V) measurement (Keithley 2400) and UV-Vis-NIR spectrophotometer (JASCO 670) respectively. The structural properties were characterized using field emission scanning electron microscope (FESEM) (JEOL JSM 7600F) and atomic force microscope (AFM) (Park System XE-100). The IV measurement indicated that at RF power 200 watt the conductivity of ZnO thin film show the highest. All films show high UV absorption properties using UV-VIS spectrophotometer (JASCO 670). The root means square (rms) roughness for ZnO thin film were about 4 nm measured using AFM. The image form FESEM observed that transformation of structure size started to change as the RF power increase.

Effective role of deposition duration on the growth of V2O5 nanostructured thin films

2016 ◽  
Author(s):  
Rabindar Kumar Sharma ◽  
Sujit Kumar Saini ◽  
Megha Singh ◽  
G. B. Reddy
Keyword(s):  
Thin Films ◽  
Nanostructured Thin Films ◽  
Effective Role ◽  
Deposition Duration

Role of Nd/Ba substitution on the growth mode and on the structural properties of Nd-rich Re1(NdxBa2−x)Cu3O7−δ (Re=Nd, Y) thin films

2002 ◽  
Vol 372-376 ◽  
pp. 675-678 ◽  
Author(s):  
M. Salluzzo ◽  
C. Aruta ◽  
G. Ausanio ◽  
S. Bals ◽  
A. D'Agostino ◽  
...  
Keyword(s):  
Thin Films ◽  
Structural Properties ◽  
Growth Mode ◽  
Ba Substitution
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