scholarly journals Influence of composition and structural properties in the tribological behaviour of magnetron sputtered Ti–Si–C nanostructured thin films, prepared at low temperature

Wear ◽  
2010 ◽  
Vol 268 (3-4) ◽  
pp. 552-557 ◽  
Author(s):  
D. Munteanu ◽  
C. Ionescu ◽  
C. Olteanu ◽  
A. Munteanu ◽  
F. Davin ◽  
...  
Keyword(s):  
Thin Films ◽  
Low Temperature ◽  
Structural Properties ◽  
Tribological Behaviour ◽  
Nanostructured Thin Films

Structural properties of low-temperature grown ZnO thin films determined by X-ray diffraction and X-ray absorption spectroscopy

2011 ◽  
Vol 519 (13) ◽  
pp. 4366-4370 ◽  
Author(s):  
Chung-Jong Yu ◽  
Nark-Eon Sung ◽  
Han-Koo Lee ◽  
Hyun-Joon Shin ◽  
Young-Duck Yun ◽  
...  
Keyword(s):  
Thin Films ◽  
Low Temperature ◽  
Structural Properties ◽  
Absorption Spectroscopy ◽  
Zno Thin Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
X Ray Absorption

X-ray studies on optical and structural properties of ZnO nanostructured thin films

2006 ◽  
Vol 39 (1-4) ◽  
pp. 267-274 ◽  
Author(s):  
S. Larcheri ◽  
C. Armellini ◽  
F. Rocca ◽  
A. Kuzmin ◽  
R. Kalendarev ◽  
...  
Keyword(s):  
Thin Films ◽  
Structural Properties ◽  
X Ray ◽  
Nanostructured Thin Films

Effect of RF Power on the Formation and Morphology Evolution of ZnO Nanostructured Thin Films

2012 ◽  
Vol 576 ◽  
pp. 577-581 ◽  
Author(s):  
N.D.M. Sin ◽  
Mohamad Hafiz Mamat ◽  
Mohamed Zahidi Musa ◽  
S. Ahmad ◽  
A. Abdul Aziz ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Structural Properties ◽  
Zno Thin Films ◽  
Morphology Evolution ◽  
Zno Thin Film ◽  
Rf Power ◽  
Nanostructured Thin Films ◽  
Atomic Force ◽  
Current Voltage

The effect of RF power on the formation and morphology evolution of ZnO nanostructured thin films deposited by magnetron sputtering are presented. This project focused on electrical, optical and structural properties of ZnO thin films. The effect of variation of RF power at 50 watt-250 watt at 200 °C on glass substrate of the ZnO thin films was investigated. The thin films were examined for electrical properties and optical properties using two point probe current-voltage (I-V) measurement (Keithley 2400) and UV-Vis-NIR spectrophotometer (JASCO 670) respectively. The structural properties were characterized using field emission scanning electron microscope (FESEM) (JEOL JSM 7600F) and atomic force microscope (AFM) (Park System XE-100). The IV measurement indicated that at RF power 200 watt the conductivity of ZnO thin film show the highest. All films show high UV absorption properties using UV-VIS spectrophotometer (JASCO 670). The root means square (rms) roughness for ZnO thin film were about 4 nm measured using AFM. The image form FESEM observed that transformation of structure size started to change as the RF power increase.

Optoelectronic and low temperature thermoelectric studies on nanostructured thin films of silver gallium selenide

2014 ◽  
Author(s):  
Rajani Jacob ◽  
Rachel Reena Philip ◽  
Sheeba Nazer ◽  
Anitha Abraham ◽  
Sinitha B. Nair ◽  
...  
Keyword(s):  
Thin Films ◽  
Low Temperature ◽  
Gallium Selenide ◽  
Nanostructured Thin Films
Sign in / Sign up

Export Citation Format

Share Document