Effect of Lasing Energy on Optical and Structural Properties of (ZnS) Nanostructured Thin Films for Solar Cell Applications

2020 ◽  
Vol 18 (5) ◽  
pp. 29-34
Author(s):  
Wasan M. Mohamed
2006 ◽  
Vol 39 (1-4) ◽  
pp. 267-274 ◽  
Author(s):  
S. Larcheri ◽  
C. Armellini ◽  
F. Rocca ◽  
A. Kuzmin ◽  
R. Kalendarev ◽  
...  

2012 ◽  
Vol 576 ◽  
pp. 577-581 ◽  
Author(s):  
N.D.M. Sin ◽  
Mohamad Hafiz Mamat ◽  
Mohamed Zahidi Musa ◽  
S. Ahmad ◽  
A. Abdul Aziz ◽  
...  

The effect of RF power on the formation and morphology evolution of ZnO nanostructured thin films deposited by magnetron sputtering are presented. This project focused on electrical, optical and structural properties of ZnO thin films. The effect of variation of RF power at 50 watt-250 watt at 200 °C on glass substrate of the ZnO thin films was investigated. The thin films were examined for electrical properties and optical properties using two point probe current-voltage (I-V) measurement (Keithley 2400) and UV-Vis-NIR spectrophotometer (JASCO 670) respectively. The structural properties were characterized using field emission scanning electron microscope (FESEM) (JEOL JSM 7600F) and atomic force microscope (AFM) (Park System XE-100). The IV measurement indicated that at RF power 200 watt the conductivity of ZnO thin film show the highest. All films show high UV absorption properties using UV-VIS spectrophotometer (JASCO 670). The root means square (rms) roughness for ZnO thin film were about 4 nm measured using AFM. The image form FESEM observed that transformation of structure size started to change as the RF power increase.


2016 ◽  
Vol 22 (4) ◽  
pp. 854-858 ◽  
Author(s):  
S. R. Rondiya ◽  
V. S. Waman ◽  
A. V. Rokade ◽  
A. H. Mayabadi ◽  
A. S Pawbake ◽  
...  

RSC Advances ◽  
2016 ◽  
Vol 6 (73) ◽  
pp. 68819-68826 ◽  
Author(s):  
Wassila Saidi ◽  
Nasreddine Hfaidh ◽  
Mohammed Rasheed ◽  
Mihaela Girtan ◽  
Adel Megriche ◽  
...  

TiO2–B2O3sol–gel thin films were prepared using titanium(iv) isopropoxide as a Ti source and boric acid (H3BO3) as B precursor.


2011 ◽  
Vol 216 ◽  
pp. 266-270
Author(s):  
Bao Yu Xu ◽  
Hui Dong Yang ◽  
Bo Huang ◽  
Jun Dai Shi

The SiC thin films as the window layer was prepared by PECVD technology in this article, investigated the influence of hydrogen dilution on the optical and micro-structural properties of SiC thin films, Analyzed optical band-gap,deposition rate and surface morphology under different hydrogen dilution ratio, found the optimal growth craft under the same conditions. The results showed that the optical band-gap of the window layer achieved the widest 2.2ev when hydrogen dilution rate was 6.25.


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