On the extraction of the external drain and source resistors and effective channel length in Si-MOSFET
1995 ◽
Vol 42
(8)
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pp. 1461-1466
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2000 ◽
Vol 44
(7)
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pp. 1187-1189
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2019 ◽
Vol 50
(1)
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pp. 874-877
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