Embedding of reduced pressure-chemical vapor deposition grown Ge nanocrystals in a high quality SiO2 matrix for non-volatile memory applications
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2012 ◽
Vol 717-720
◽
pp. 105-108
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1995 ◽
Vol 34
(Part 1, No. 9A)
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pp. 4736-4740
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2007 ◽
Vol 305
(1)
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pp. 113-121
◽
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