Optical and structural characterization of Tm2O3, TmN, and TmOxNy thin films grown by direct-current reactive magnetron sputtering
2014 ◽
Vol 10
(5)
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pp. 887-892
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2016 ◽
Vol 26
(4)
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pp. 889-894
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Vol 13
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pp. 314-320
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1999 ◽
Vol 17
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pp. 3317-3321
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2018 ◽
Vol 54
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pp. 1434-1442
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2008 ◽
Vol 254
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pp. 4396-4400
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