Paramagnetic properties and hydrogen-related structural relaxation effects in magnetron-sputtered a-C:H thin films

The bidimensionnal character of thin magnetic films deposited on single-crystal substrates, together with the occurrence of singular crystallographic structures, often confer on these systems electronic properties that cannot be found in bulk solids. For example, thin Ni layers deposited on Cu(001) present a perpendicular magnetic anisotropy in a very wide thickness range. We will show that this can be explained by a distorted structure of Ni, originating from the strain induced by the epitaxy on the Cu substrate. In this field of 2D magnetism, nanostructures are now investigated. Thin Fe layers on MgO(001) were cut into stripes by the "atomic saw" method: a compression of the substrate induces a dislocation slipping which saws both the substrate and the Fe film in regular and separated ribbons. The observed perpendicular to the stripes magnetization easy axis will be explained by a structural relaxation occurring during the structuration process. In these two studies, a precise structural characterization and simple magnetoelastic models allow one to describe the magnetic behaviors of these systems.

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Phase stability and stress relaxation effects of cubic boron nitride thin films under 350 keV ion irradiation

Diamond and Related Materials ◽

10.1016/s0925-9635(96)00616-4 ◽

1997 ◽

Vol 6 (5-7) ◽

pp. 621-625 ◽

Cited By ~ 58

Author(s):

P. Widmayer ◽

P. Ziemann ◽

S. Ulrich ◽

H. Ehrhardt

Keyword(s):

Thin Films ◽

Stress Relaxation ◽

Boron Nitride ◽

Phase Stability ◽

Ion Irradiation ◽

Cubic Boron Nitride ◽

Relaxation Effects

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Statistical and scaling behavior of structural relaxation effects in phase-change memory (PCM) devices

2009 IEEE International Reliability Physics Symposium ◽

10.1109/irps.2009.5173236 ◽

2009 ◽

Cited By ~ 17

Author(s):

Mattia Boniardi ◽

Daniele Ielmini ◽

Simone Lavizzari ◽

Andrea L. Lacaita ◽

Andrea Redaelli ◽

...

Keyword(s):

Phase Change ◽

Structural Relaxation ◽

Phase Change Memory ◽

Scaling Behavior ◽

Relaxation Effects ◽

Change Memory

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Determination of Strain Distributions in Aluminum Thin Films as a Function of Temperature by the use of Synchrotron Grazing Incidence X-Ray Scattering

MRS Proceedings ◽

10.1557/proc-239-227 ◽

1991 ◽

Vol 239 ◽

Cited By ~ 8

Author(s):

Ramnath Venkatraman ◽

Paul R. Besser ◽

Sean Brennan ◽

John C. Bravman

Keyword(s):

Thin Films ◽

Room Temperature ◽

Grazing Incidence ◽

Surface Relaxation ◽

Line Broadening ◽

X Ray ◽

Relaxation Effects ◽

X Ray Scattering ◽

Ray Scattering

ABSTRACTWe have measured elastic strain distributions with depth as a function of temperature in Al thin films of various thicknesses on oxidized silicon using synchrotron grazing incidence X-ray scattering (GIXS). Disregarding minor surface relaxation effects that depend on the film thickness, it is shown that there are no gross strain gradients in these films in the range of temperatures (between room temperature and 400°C) considered. We also observe X-ray line broadening effects, suggesting an accumulation of dislocations on cooling the films, and their annealing out as the films are reheated.

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Stabilized jellium model and structural relaxation effects on the fragmentation energies of ionized silver clusters

Canadian Journal of Physics ◽

10.1139/p04-004 ◽

2004 ◽

Vol 82 (3) ◽

pp. 239-247 ◽

Cited By ~ 6

Author(s):

M Payami

Keyword(s):

Experimental Data ◽

Structural Relaxation ◽

Fission Barrier ◽

Silver Clusters ◽

Jellium Model ◽

Dynamical Processes ◽

Dissociation Energies ◽

Barrier Heights ◽

Relaxation Effects ◽

Ag Clusters

Using the stabilized jellium model (SJM) in two schemes of "relaxed" and "rigid", we calculate the dissociation energies and the fission-barrier heights for the binary fragmentations of singly-ionized and doubly-ionized Ag clusters. In the calculations, we assume spherical geometries for the clusters. Comparison of the fragmentation energies in the two schemes show differences that are significant. This result reveals the advantages of the relaxed SJM over the rigid SJM in dynamical processes such as fragmentation. Comparing the relaxed SJM results and experimental data on fragmentation energies, it is possible to predict the sizes of the clusters just before their fragmentations. PACS Nos.: 36.40.Qv, 36.40.c, 36.40.Wa

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