CORRELATIONS BETWEEN STRUCTURE AND MAGNETISM IN THIN FILMS AND NANOSTRUCTURES

1999 ◽  
Vol 06 (05) ◽  
pp. 753-761 ◽  
Author(s):  
P. LE FÈVRE ◽  
H. MAGNAN ◽  
A. MIDOIR ◽  
D. CHANDESRIS ◽  
H. JAFFRÈS ◽  
...  
Keyword(s):  
Thin Films ◽  
Structural Characterization ◽  
Structural Relaxation ◽  
Easy Axis ◽  
Perpendicular Magnetic Anisotropy ◽  
Magnetic Films ◽  
Bulk Solids ◽  
Thin Magnetic Films ◽  
Distorted Structure ◽  
Crystallographic Structures

The bidimensionnal character of thin magnetic films deposited on single-crystal substrates, together with the occurrence of singular crystallographic structures, often confer on these systems electronic properties that cannot be found in bulk solids. For example, thin Ni layers deposited on Cu(001) present a perpendicular magnetic anisotropy in a very wide thickness range. We will show that this can be explained by a distorted structure of Ni, originating from the strain induced by the epitaxy on the Cu substrate. In this field of 2D magnetism, nanostructures are now investigated. Thin Fe layers on MgO(001) were cut into stripes by the "atomic saw" method: a compression of the substrate induces a dislocation slipping which saws both the substrate and the Fe film in regular and separated ribbons. The observed perpendicular to the stripes magnetization easy axis will be explained by a structural relaxation occurring during the structuration process. In these two studies, a precise structural characterization and simple magnetoelastic models allow one to describe the magnetic behaviors of these systems.

Micromagnetic Simulations Of Domain Structures In Thin Films And Bulk Hard Magnets

1999 ◽  
Vol 5 (S2) ◽  
pp. 36-37
Author(s):  
Zhi-Xiong Cai ◽  
Yimei Zhu
Keyword(s):  
Thin Films ◽  
Magnetic Materials ◽  
Domain Structure ◽  
Easy Axis ◽  
Magnetic Thin Films ◽  
Magnetic Films ◽  
Electron Holography ◽  
Bulk Materials ◽  
Hard Magnetic Materials ◽  
Domain Structures

The shape anisotropy of a magnetic thin film competes with the easy-axis anisotropy, which gives rise to different domain structures compared to the bulk magnetic materials. Recent Lorentz microscope and electron holography and differential-phase-contrast experiments show complex domain structures with features not found in bulk materials seen by magneto-optic method.In this report we use micromagnetic simulation techniques to study the effect of thickness on the domain structure of magnetic thin films with various orientations relative to the easy axis and compare with those in the bulk materials. The results of the simulations can be used to compare with the data obtained using electron holography experiments to give us quantitative understanding of the domain structure in hard magnetic materials.We model the magnetic films with an array of dipoles of size 16×l6×Lz, where Lz the thickness of the sample.

The Effect of Oblique Deposition with Small Incidence on Magnetic Properties of Thin Magnetic Films

2014 ◽  
Vol 215 ◽  
pp. 223-226 ◽  
Author(s):  
Boris A. Belyaev ◽  
Andrey V. Izotov ◽  
Platon N. Solovev
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Ferromagnetic Resonance ◽  
Strong Influence ◽  
Small Deviation ◽  
Magnetic Films ◽  
Magnetic Parameters ◽  
Thin Magnetic Films ◽  
Small Incidence ◽  
Oblique Deposition

Using the scanning spectrometer of ferromagnetic resonance it was found that the small deviation of the incidence atoms from the normal during the deposition had a strong influence on magnetic parameters of thin films.

Magnetic and Structural Analysis of Ultra-Thin Magnetic Films, Multilayers, and Superlattices by Mössbauer Spectroscopy

1993 ◽  
Vol 313 ◽  
Author(s):  
J. Freeland ◽  
D. Keavney ◽  
D. Storm ◽  
J. Calvin Walker
Keyword(s):  
Thin Films ◽  
Mössbauer Spectroscopy ◽  
Structural Analysis ◽  
Sample Preparation ◽  
Mossbauer Spectroscopy ◽  
Magnetic Films ◽  
Mößbauer Spectroscopy ◽  
Thin Magnetic Films ◽  
Magnetic Transport

In the study of thin films and surfaces as well as the examination of superlattices, the careful characterization of these systems including their structural, Magnetic, transport, and other properties has been absolutely crucial to the advancement of the field. As Means of sample preparation have progressed, techniques for evaluating the flatness, continuity, crystallinity, etc. of thin films and surfaces have become ever more necessary to understand the resulting magnetic and electronic properties. Because iron is often a constituent of Magnetic thin films and because the isotope 57Fe shows a strong Mossbauer Effect over a wide temperature range the technique of Mossbauer Spectroscopy offers much to the study of surfaces, thin films, and superlattices.

Transmission Electron Microscopy studies of texture of Cr underlayer of magnetic recording hard disk

1991 ◽  
Vol 49 ◽  
pp. 580-581
Author(s):  
L. Tang ◽  
G. Thomas ◽  
M. R. Khan ◽  
S. L. Duan
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
Magnetic Recording ◽  
Magnetic Thin Films ◽  
Magnetic Films ◽  
Substrate Bias ◽  
Epitaxial Relationship ◽  
Transmission Electron

Cr thin films are often used as underlayers for Co alloy magnetic thin films, such as Co1, CoNi2, and CoNiCr3, for high density longitudinal magnetic recording. It is belived that the role of the Cr underlayer is to control the growth and texture of the Co alloy magnetic thin films, and, then, to increase the in plane coercivity of the films. Although many epitaxial relationship between the Cr underlayer and the magnetic films, such as ﹛1010﹜Co/ {110﹜Cr4, ﹛2110﹜Co/ ﹛001﹜Cr5, ﹛0002﹜Co/﹛110﹜Cr6, have been suggested and appear to be related to the Cr thickness, the texture of the Cr underlayer itself is still not understood very well. In this study, the texture of a 2000 Å thick Cr underlayer on Nip/Al substrate for thin films of (Co75Ni25)1-xTix dc-sputtered with - 200 V substrate bias is investigated by electron microscopy.

scholarly journals Buffer layer engineering of L10 FePd thin films with large perpendicular magnetic anisotropy

AIP Advances ◽  
2021 ◽  
Vol 11 (2) ◽  
pp. 025106
Author(s):  
Xinjun Wang ◽  
Sergiy Krylyuk ◽  
Daniel Josell ◽  
Delin Zhang ◽  
Deyuan Lyu ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetic Anisotropy ◽  
Buffer Layer ◽  
Perpendicular Magnetic Anisotropy

Structural characterization of V2O5–TiO2 thin films deposited by RF sputtering from a titanium target with vanadium insets

2005 ◽  
Vol 109 (1) ◽  
pp. 47-51 ◽  
Author(s):  
I. Alessandri ◽  
E. Comini ◽  
E. Bontempi ◽  
G. Sberveglieri ◽  
L.E. Depero
Keyword(s):  
Thin Films ◽  
Structural Characterization ◽  
Rf Sputtering ◽  
Tio2 Thin Films ◽  
Titanium Target

scholarly journals The influence of an ultra-high resistivity Ta underlayer on perpendicular magnetic anisotropy in Ta/Pt/Co/Pt heterostructures

RSC Advances ◽  
2020 ◽  
Vol 10 (19) ◽  
pp. 11219-11224
Author(s):  
Wei Zhang ◽  
Xiaoxiong Jia ◽  
Rui Wang ◽  
Huihui Liu ◽  
Zhengyu Xiao ◽  
...  
Keyword(s):  
Thin Films ◽  
Thermal Stability ◽  
Magnetic Anisotropy ◽  
High Stability ◽  
Essential Role ◽  
Perpendicular Magnetic Anisotropy ◽  
Low Energy ◽  
High Resistivity ◽  
Excellent Thermal Stability ◽  
Low Energy Consumption

Thin films with perpendicular magnetic anisotropy (PMA) play an essential role in the development of technologies due to their excellent thermal stability and potential application in devices with high density, high stability, and low energy consumption.

Sign in / Sign up

Export Citation Format

Share Document