Dependence of the sheet resistance of indium-tin-oxide thin films on grain size and grain orientation determined from X-ray diffraction techniques

The Ag-Ag2S-PbS thin films were co-electrodeposited on indium-tin-oxide (ITO) coated glass substrates from aqueous solutions containing 0.01 M AgNO3, 0.01 M Pb (NO3)2, 0.1 M Na2S2O3, 0.02 M ethylenediaminetetraacetic acid disodium salt, and 0.5 M Na2SO4. X-ray diffraction (XRD), scanning electron microscopy (SEM), and cyclic voltammetry (CV) were used to investigate the Ag-Ag2S-PbS thin films. The X-ray diffraction analysis demonstrated the presence of cubic structure of metallic silver, acanthite Ag2S, and cubic PbS, which is consistent with the CV analysis. The effect of different Ag+/Pb2+ratios on the morphology and composition of the Ag-Ag2S-PbS thin films were also studied.

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Grain-size effect on the electrical properties of nanocrystalline indium tin oxide thin films

Materials Science and Engineering B ◽

10.1016/j.mseb.2015.04.011 ◽

2015 ◽

Vol 199 ◽

pp. 37-41 ◽

Cited By ~ 11

Author(s):

Jong Hoon Lee ◽

Young Heon Kim ◽

Sang Jung Ahn ◽

Tae Hwan Ha ◽

Hong Seung Kim

Keyword(s):

Thin Films ◽

Grain Size ◽

Electrical Properties ◽

Size Effect ◽

Tin Oxide ◽

Indium Tin Oxide ◽

Grain Size Effect ◽

Oxide Thin Films

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Noncontact characterization of sheet resistance of indium–tin-oxide thin films by using a near-field microwave microprobe

Thin Solid Films ◽

10.1016/j.tsf.2006.03.047 ◽

2006 ◽

Vol 515 (4) ◽

pp. 1354-1357 ◽

Cited By ~ 8

Author(s):

Soonil Yun ◽

Sunguk Na ◽

Arsen Babajayan ◽

Hyunjung Kim ◽

Barry Friedman ◽

...

Keyword(s):

Thin Films ◽

Sheet Resistance ◽

Tin Oxide ◽

Indium Tin Oxide ◽

Near Field ◽

Oxide Thin Films

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Positron annihilation and X-ray diffraction studies on tin oxide thin films

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/j.nimb.2009.02.058 ◽

2009 ◽

Vol 267 (7) ◽

pp. 1167-1170 ◽

Cited By ~ 5

Author(s):

K. Prabakar ◽

S. Abhaya ◽

R. Krishnan ◽

S. Kalavathi ◽

S. Dash ◽

...

Keyword(s):

Thin Films ◽

Positron Annihilation ◽

Tin Oxide ◽

X Ray Diffraction ◽

Oxide Thin Films ◽

X Ray

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Grazing incidence X-ray scattering study of sol–gel derived indium tin oxide thin films

Thin Solid Films ◽

10.1016/j.tsf.2009.03.047 ◽

2009 ◽

Vol 517 (17) ◽

pp. 5151-5156 ◽

Cited By ~ 7

Author(s):

L.L. Yang ◽

D.T. Ge ◽

X.D. He ◽

F. He ◽

Y.B. Li ◽

...

Keyword(s):

Thin Films ◽

Tin Oxide ◽

Indium Tin Oxide ◽

Sol Gel ◽

Grazing Incidence ◽

Oxide Thin Films ◽

X Ray ◽

X Ray Scattering ◽

Scattering Study ◽

Ray Scattering

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Structural and optical properties of Tin Oxide and Indium doped SnO2 thin films deposited by thermal evaporation technique

JOURNAL OF ADVANCES IN PHYSICS ◽

10.24297/jap.v12i3.45 ◽

2016 ◽

Vol 12 (3) ◽

pp. 4394-4399

Author(s):

Sura Ali Noaman ◽

Rashid Owaid Kadhim ◽

Saleem Azara Hussain

Keyword(s):

Thin Films ◽

Optical Properties ◽

Tin Oxide ◽

Thermal Evaporation ◽

Pure Sno2 ◽

X Ray Diffraction ◽

Structural And Optical Properties ◽

X Ray ◽

Evaporation Technique ◽

Sno2 Thin Films

Tin Oxide and Indium doped Tin Oxide (SnO2:In) thin films were deposited on glass and SiliconÂ substratesÂ byÂ thermal evaporation technique.Â X-ray diffraction pattern of Â pure SnO2 and SnO2:In thin films annealed at 650oC and the results showedÂ that the structure have tetragonal phase with preferred orientation in (110) plane. AFM studies showed an inhibition of grain growth with increase in indium concentration. SEM studies of pureÂ SnO2 and Â Indium doped tin oxide (SnO2:In) ) thin films showed that the films with regular distribution of particles and they have spherical shape.Â Optical properties such asÂ Transmission , optical band-gap have been measured and calculated.

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