In situ high-temperature x-ray diffraction studies of antimony-doped tin oxide thin films formed by metallo-organic decomposition

1994 ◽  
Vol 29 (5) ◽  
pp. 537-543 ◽  
Author(s):  
T.N. Blanto ◽  
M. Lelental
Keyword(s):  
Thin Films ◽  
High Temperature ◽  
Tin Oxide ◽  
X Ray Diffraction ◽  
Oxide Thin Films ◽  
X Ray ◽  
Organic Decomposition

In situ crystallisation in ZrO2 thin films during high temperature X-ray diffraction

2001 ◽  
Vol 41 (7) ◽  
pp. 995-998 ◽  
Author(s):  
C. Zhao ◽  
G. Roebben ◽  
H. Bender ◽  
E. Young ◽  
S. Haukka ◽  
...  
Keyword(s):  
Thin Films ◽  
High Temperature ◽  
X Ray Diffraction ◽  
X Ray

Positron annihilation and X-ray diffraction studies on tin oxide thin films

2009 ◽  
Vol 267 (7) ◽  
pp. 1167-1170 ◽  
Author(s):  
K. Prabakar ◽  
S. Abhaya ◽  
R. Krishnan ◽  
S. Kalavathi ◽  
S. Dash ◽  
...  
Keyword(s):  
Thin Films ◽  
Positron Annihilation ◽  
Tin Oxide ◽  
X Ray Diffraction ◽  
Oxide Thin Films ◽  
X Ray

scholarly journals Effect of Annealing Ferroelectric HfO2 Thin Films: In Situ, High Temperature X-Ray Diffraction

2018 ◽  
Vol 4 (7) ◽  
pp. 1800091 ◽  
Author(s):  
Min Hyuk Park ◽  
Ching-Chang Chung ◽  
Tony Schenk ◽  
Claudia Richter ◽  
Karl Opsomer ◽  
...  
Keyword(s):  
Thin Films ◽  
High Temperature ◽  
X Ray Diffraction ◽  
X Ray

Structural and optical properties of Tin Oxide and Indium doped SnO2 thin films deposited by thermal evaporation technique

2016 ◽  
Vol 12 (3) ◽  
pp. 4394-4399
Author(s):  
Sura Ali Noaman ◽  
Rashid Owaid Kadhim ◽  
Saleem Azara Hussain
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Tin Oxide ◽  
Thermal Evaporation ◽  
Pure Sno2 ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
X Ray ◽  
Evaporation Technique ◽  
Sno2 Thin Films

Tin Oxide and Indium doped Tin Oxide (SnO2:In) thin films were deposited on glass and Silicon  substrates  by  thermal evaporation technique.  X-ray diffraction pattern of  pure SnO2 and SnO2:In thin films annealed at 650oC and the results showed  that the structure have tetragonal phase with preferred orientation in (110) plane. AFM studies showed an inhibition of grain growth with increase in indium concentration. SEM studies of pure  SnO2 and  Indium doped tin oxide (SnO2:In) ) thin films showed that the films with regular distribution of particles and they have spherical shape.  Optical properties such as  Transmission , optical band-gap have been measured and calculated.

scholarly journals X-ray absorption spectroscopy elucidates the impact of structural disorder on electron mobility in amorphous zinc-tin-oxide thin films

2014 ◽  
Vol 104 (24) ◽  
pp. 242113 ◽  
Author(s):  
Sin Cheng Siah ◽  
Sang Woon Lee ◽  
Yun Seog Lee ◽  
Jaeyeong Heo ◽  
Tomohiro Shibata ◽  
...  
Keyword(s):  
Thin Films ◽  
Absorption Spectroscopy ◽  
Tin Oxide ◽  
Electron Mobility ◽  
Structural Disorder ◽  
Oxide Thin Films ◽  
X Ray ◽  
Zinc Tin Oxide ◽  
The Impact ◽  
X Ray Absorption

scholarly journals In-Situ X-ray Diffraction Measurement for Pure Niobium Metal in High Temperature Hydrogen Atmosphere

2006 ◽  
Vol 70 (6) ◽  
pp. 467-472 ◽  
Author(s):  
Tomonori Nambu ◽  
Nobue Shimizu ◽  
Hisakazu Ezaki ◽  
Hiroshi Yukawa ◽  
Masahiko Morinaga ◽  
...  
Keyword(s):  
High Temperature ◽  
Hydrogen Atmosphere ◽  
Diffraction Measurement ◽  
X Ray Diffraction ◽  
X Ray ◽  
Pure Niobium
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