Co-Electrodeposition and Characterization of Ag-Ag2S-PbS Thin Films on Indium-Tin-Oxide Coated Glass
2014 ◽
Vol 900
◽
pp. 397-400
◽
Keyword(s):
X Ray
◽
The Ag-Ag2S-PbS thin films were co-electrodeposited on indium-tin-oxide (ITO) coated glass substrates from aqueous solutions containing 0.01 M AgNO3, 0.01 M Pb (NO3)2, 0.1 M Na2S2O3, 0.02 M ethylenediaminetetraacetic acid disodium salt, and 0.5 M Na2SO4. X-ray diffraction (XRD), scanning electron microscopy (SEM), and cyclic voltammetry (CV) were used to investigate the Ag-Ag2S-PbS thin films. The X-ray diffraction analysis demonstrated the presence of cubic structure of metallic silver, acanthite Ag2S, and cubic PbS, which is consistent with the CV analysis. The effect of different Ag+/Pb2+ratios on the morphology and composition of the Ag-Ag2S-PbS thin films were also studied.