Distribution of Cilia in the Rat Nephron Studied by Scanning Electron Microscopy

1974 ◽  
Vol 32 ◽  
pp. 278-279
Author(s):  
V. R. Mumaw ◽  
B. L. Munger
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Surface Topography ◽  
Freeze Fracture ◽  
Renal Epithelium ◽  
Transmission Electron ◽  
Scanning Electron

The use of the scanning electron microscope (SEM) has become a very useful tool complimenting studies done by transmission electron microscopy (TEM). The presence of cilia in the renal epithelium have been noted by various investigators and described by Latta. The present study utilizing the SEM and a freeze fracture technique demonstrates the regularity of cilia as well as the surface topography of the renal epithelium in a fractured profile.

Trophozoites of Pathogenic Naegleria: Scanning Electron Microscope Study

1975 ◽  
Vol 33 ◽  
pp. 652-653
Author(s):  
A. Julio Martinez ◽  
E. Clifford Nelson ◽  
Doris G. Fultz ◽  
Ragnit Geeraets
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Electron Microscope Study ◽  
Plastic Film ◽  
Scanning Electron Microscope Study ◽  
Transmission Electron ◽  
Scanning Electron

Scanning electron microscopy (SEM) can serve as a valuable supplement to transmission electron microscopy (TEM) in the study of pathogenic protozoa. Details of overall form and structure of surface and organelles which may have a role in pathogenicity may be revealed. TEM studies on Naegleria have contributed much to understanding the extraordinary virulence of this ameba, but some remaining questions may be resolved by SEM. This report describes a technique which has proven useful in preparing SEM specimens. Naegleria ameba trophozoites adhere strongly to the surface on which they are growing. In culture tubes, amebae will multiply on the wall. Naegleria tends to grow from the top of the fluid downward and may multiply until a solid monolayer develops. If a strip of plastic film is introduced, the growth on the strip can be observed by direct microscope viewing through the wall of the tube.

STEM (Scanning Transmission Electron Microscopy) in a SEM (Scanning Electron Microscope) for Failure Analysis and Metrology

2002 ◽  
Author(s):  
William E. Vanderlinde
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Material Structure ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Scanning Electron ◽  
Thin Samples

Abstract Recent developments in transmission electron microscopy (TEM) sample preparation have greatly reduced the time and cost for preparing thin samples. In this paper, a method is demonstrated for viewing thin samples in transmission in an unmodified scanning electron microscope (SEM) using an easily constructed sample holder. Although not a substitute for true TEM analysis, this method allows for spatial resolution that is superior to typical SEM imaging and provides image contrast from material structure that is typical of TEM images. Furthermore, the method can produce extremely high resolution x-ray maps that are typically produced only by scanning transmission electron microscope (STEM) systems.

Electron Tomography of HEK293T Cells Using Scanning Electron Microscope–Based Scanning Transmission Electron Microscopy

2012 ◽  
Vol 18 (5) ◽  
pp. 1037-1042 ◽  
Author(s):  
Yun-Wen You ◽  
Hsun-Yun Chang ◽  
Hua-Yang Liao ◽  
Wei-Lun Kao ◽  
Guo-Ji Yen ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Scanning Transmission Electron Microscopy ◽  
Electron Tomography ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
3D Volume ◽  
Scanning Electron

AbstractBased on a scanning electron microscope operated at 30 kV with a homemade specimen holder and a multiangle solid-state detector behind the sample, low-kV scanning transmission electron microscopy (STEM) is presented with subsequent electron tomography for three-dimensional (3D) volume structure. Because of the low acceleration voltage, the stronger electron-atom scattering leads to a stronger contrast in the resulting image than standard TEM, especially for light elements. Furthermore, the low-kV STEM yields less radiation damage to the specimen, hence the structure can be preserved. In this work, two-dimensional STEM images of a 1-μm-thick cell section with projection angles between ±50° were collected, and the 3D volume structure was reconstructed using the simultaneous iterative reconstructive technique algorithm with the TomoJ plugin for ImageJ, which are both public domain software. Furthermore, the cross-sectional structure was obtained with the Volume Viewer plugin in ImageJ. Although the tilting angle is constrained and limits the resulting structural resolution, slicing the reconstructed volume generated the depth profile of the thick specimen with sufficient resolution to examine cellular uptake of Au nanoparticles, and the final position of these nanoparticles inside the cell was imaged.

Paraliomyces lentiferus: an ultrastructural study of a little-known marine ascomycete

1992 ◽  
Vol 70 (11) ◽  
pp. 2223-2232 ◽  
Author(s):  
S. J. Read ◽  
S.-Y. Hsieh ◽  
E. B. G. Jones ◽  
S. T. Moss ◽  
H. S. Chang
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Ultrastructural Study ◽  
Republic Of China ◽  
Mucilaginous Sheath ◽  
Transmission Electron ◽  
Scanning Electron

A collection of Paraliomyces lentiferus from Taiwan, Republic of China, is compared with that of the type description and examined at both scanning and transmission electron microscope levels as part of our review of the taxonomy of the marine Ascomycotina. Particular attention was devoted to the structure of the ascospore appendage. The ascospore wall comprises a mesosporium, an episporium, and a mucilaginous sheath (exosporium?) In addition, there is a single, gelatinous, lateral appendage adjacent to the central septum. The appendage comprises electron-opaque fibrils that in immature ascospores are connected to the ascospore wall via fine electron-opaque strands and larger electron-opaque aggregates of material. The origin of the appendage is discussed. Key words: ascospore, attachment, marine ascomycete, scanning electron microscopy, spore appendage, transmission electron microscopy.

The distribution and fine structure of the integumentary papillae of the cercaria ofHimasthla secunda(Nicoll)

Parasitology ◽  
1970 ◽  
Vol 61 (2) ◽  
pp. 219-227 ◽  
Author(s):  
H. D. Chapman ◽  
R. A. Wilson
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Spatial Distribution ◽  
Fine Structure ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Silver Nitrate ◽  
Light Microscope ◽  
Transmission Electron ◽  
Scanning Electron

The distribution of the integumentary papillae of the cercaria ofHimasthla secundahas been studied by a variety of techniques. Structures stained by silver nitrate and visible under the light microscope correspond in their spatial distribution with papillae observed under the scanning electron microscope. The tegumentary papillae described with the light and scanning electron microscope are correlated with the specialized nerve endings in the tegument as seen in transmission electron microscopy. The ultrastructure of these papillae is examined by conventional transmission electron microscopy and the probability that these structures are sensory is discussed.

Ultrastructural studies on conidiomata, conidiophores, and conidiogenous cells in six lichen-forming Ascomycetes

1984 ◽  
Vol 62 (10) ◽  
pp. 2081-2093 ◽  
Author(s):  
Rosmarie Honegger
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Transmission Electron Microscope ◽  
Developmental Studies ◽  
Ultrastructural Studies ◽  
Transmission Electron ◽  
Conidium Formation ◽  
Scanning Electron

The conidiomata, conidiophores, and conidia of six lichen-forming Ascomycetes were investigated using the scanning electron microscope, and conidium development in two of these species was studied by transmission electron microscopy. Phialidic (micro) conidium formation was observed in the mycobiont of Parmelia tiliacea, Physconia pulverulacea, and Cladonia furcata (Lecanorales), in Lobaria laetevirens (Peltigerales), and in Caloplaca aurantia (Teloschistales). Annellations, first described by Vobis on the basis of light and transmission electron microscope investigations, were also found in scanning electron microscope preparations of macroconidia bearing conidiogenous cells of Lecanactis abietina (Opegraphales). Ultrastructural and developmental studies on conidiophore structure and conidium formation may be of interest for taxonomic and evolutionary considerations in lichen-forming fungi.

scholarly journals Crystallography of Growth Blocks in Spheroidal Graphite

2018 ◽  
Vol 925 ◽  
pp. 54-61 ◽  
Author(s):  
Etienne Brodu ◽  
Emmanuel Bouzy ◽  
Jean Jacques Fundenberger ◽  
Benoit Beausir ◽  
Lydia Laffont ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Electron Backscatter Diffraction ◽  
Spheroidal Graphite ◽  
Transmission Electron ◽  
Competition Process ◽  
Graphite Growth ◽  
Scanning Electron

A better understanding of spheroidal graphite growth is expected in a near future thanks to widespread use of transmission electron microscopy. However, common transmission electron microscopy is quite time consuming and new indexing techniques are being developed, among them is transmission Kikuchi diffraction in a scanning electron microscope, a recent technique derived from electron backscatter diffraction. In the present work, on-axis transmission Kikuchi diffraction in scanning electron microscope, completed by transmission electron microscopy, was used with the objective of producing new observations on the microstructure of spheroidal graphite. This study shows that disorientations between blocks and sectors in spheroidal graphite are quite large in the early growth stage, which may be indicative of a competition process selecting the best orientations for achieving radial growth along thecdirection of graphite.

Studies in the genus Strossmayeria (Helotiales). 5. Conidia and conidiogenesis in Pseudospiropes: a light and electron microscope investigation

1985 ◽  
Vol 63 (2) ◽  
pp. 195-200 ◽  
Author(s):  
Teresita Iturriaga ◽  
Herbert W. Israel
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Light Microscopy ◽  
Exterior Surface ◽  
Electron Microscope Investigation ◽  
Transmission Electron ◽  
Taxonomic Importance ◽  
Scanning Electron

Conidiogenesis and conidial morphology in two Pseudospiropes species, anamorphs of two unnamed Strossmayeria species, were studied using light microscopy and scanning electron microscopy, and for one of these, transmission electron microscopy. Conidiogenesis is clearly holoblastic. In these species there are approximately 10 cells per conidium, the apical and basal ones being darker than the others. A gel surrounds the conidium, and what probably is a gelatinous appendage is seen at its apex. The conidial wall is composed of at least eight layers, the exterior surface being distinctly poroid. There are columnar irregularities in the conidial walls. These morphological features have potential taxonomic importance.

scholarly journals Breaking the Resolution Barrier in the Scanning Electron Microscope

2008 ◽  
Vol 16 (6) ◽  
pp. 28-35
Author(s):  
William Vanderlinde
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Spot Size ◽  
High Magnification ◽  
Transmission Electron ◽  
Very High ◽  
Tem Transmission Electron Microscopy ◽  
Scanning Electron

Everyone always wants better resolution from his or her microscopes. With semiconductor manufacturers now shipping product with sub-100 nm gates, measuring features and defects has become a challenge, even for the scanning electron microscope (SEM). For metrology below 100 nm, some manufacturers have begun routinely using TEM (transmission electron microscopy) which is tedious and expensive. As a microscopist, I find this quite disappointing since, in principle, the SEM should be capable of providing more than enough resolution well below 100 nm. Why is it that SEMs with 1 nm spot size can’t provide adequate resolution for 100 nm gates? It turns out that at very high magnification, SEM resolution is limited by how the electron beam interacts with the sample rather than simply the spot size of the beam.

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