Examination of Solid Specimens in a High Resolution SEM Having a Condenser-Objective Lens
1974 ◽
Vol 32
◽
pp. 314-315
Keyword(s):
The theoretical resolution of the surface SEM is limited by four factors: A lower limit is imposed on the beam diameter by the aberrations of the focussing lens. The brightness of the electron gun determines, for a specified beam current, how closely this limit can be approached. The required beam current is determined by signal-to-noise ratio (SNR) considerations based on the required information content of the image and the signal conversion efficiency and the background conversion efficiency between the incident electron beam and the noise bottleneck of the system. With sone types of image contrast a limit is also imposed by the size of the region which is needed to contain the relevent electron/specimen interaction.
2021 ◽
Vol 2077
(1)
◽
pp. 012022
1973 ◽
Vol 31
◽
pp. 444-445
Keyword(s):
1968 ◽
Vol 4
(4)
◽
pp. 634-639
◽
Keyword(s):
Keyword(s):
2014 ◽
Vol 960-961
◽
pp. 877-880
Keyword(s):
Keyword(s):
2020 ◽