On Some Testing Specimens for High Resolution SEM
1974 ◽
Vol 32
◽
pp. 556-557
Keyword(s):
In assessing the resolving power of a high resolution scanning electron microscope using field emission tip (Hitachi HFS-2), two types of specimens were found to be of value.Fig. 1a, 1b are two successive exposures of some bright spots found on some thin carbon films. These carbon films were originally prepared for work in a high resolution scanning transmission electron microscope. Spots similar in size and distribution have been detected on micrographs taken in that microscope (Fig. 2).
1974 ◽
Vol 32
◽
pp. 316-317
1992 ◽
Vol 50
(2)
◽
pp. 1608-1609
1987 ◽
Vol 6
(1)
◽
pp. 15-30
◽
1973 ◽
Vol 31
◽
pp. 286-287
◽
1975 ◽
Vol 33
◽
pp. 556-557
1992 ◽
Vol 31
(Part 2, No. 12B)
◽
pp. L1788-L1790
◽
1974 ◽
Vol 32
◽
pp. 404-405
1974 ◽
Vol 32
◽
pp. 422-423