Electron Diffraction by an Optical Grating

1969 ◽  
Vol 27 ◽  
pp. 154-155
Author(s):  
G. H. Curtis ◽  
R. P. Ferrier
Keyword(s):  
Electron Microscopy ◽  
Electron Diffraction ◽  
Small Angle ◽  
Diffraction Gratings ◽  
Image Contrast ◽  
Optical Diffraction ◽  
Diffraction Angle ◽  
Optical Grating ◽  
Carbon Replicas

Carbon replicas of optical diffraction gratings can be used, not only for magnification calibration in electron microscopy, but also as angular standards in small-angle electron diffraction. These replicas are usually shadowed with a heavy material to improve image contrast, but we acquired some unshadowed samples (kindly supplied by Mr. R.H. Alderson of AEI Ltd,) for the experiments described below. The gratings are cross-ruled with 2,160 lines per mm to give a spacing of 463 nm and a diffraction angle of about 9 microradians at U=80KV.

scholarly journals Elektronenoptische Untersuchungen an Tellur

1968 ◽  
Vol 23 (4) ◽  
pp. 530-532
Author(s):  
P. Klein ◽  
K. Kleinhenz
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Diffraction ◽  
Single Crystals ◽  
Small Angle ◽  
Reciprocal Lattice ◽  
Image Plane ◽  
Diffraction Image ◽  
Transmission Electron ◽  
Bulk Single Crystals

Starting from bulk single crystals, tellurium has been prepared for transmission electron microscopy. The foil orientation was {101̅0} , two planes of the reciprocal lattice being projected into the electron diffraction image plane. Dislocations and small angle grain boundaries were observed and could be explained by considering glide on {101̅0} and (0001). Hints for a “rhombohedral” view of the tellurium lattice were found.

On the interpretation of electron diffraction patterns from materials containing planar boundaries: the intergrowth tungsten bronzes

1990 ◽  
Vol 429 (1876) ◽  
pp. 91-117 ◽  
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Electron Diffraction ◽  
High Resolution Electron Microscopy ◽  
Optical Diffraction ◽  
General Interest ◽  
Transmission Electron ◽  
Resolution Electron ◽  
Resolution Imaging ◽  
Diffraction Patterns

Materials containing planar boundaries are of general interest and complete understanding of their structures is important. When direct imaging of the boundaries by, for instance, high-resolution electron microscopy, is impracticable, details of their structure and arrangement may be obtained from electron diffraction patterns. Such patterns are discussed in terms of those from intergrowth tungsten bronzes as specific examples. Fourier-transform calculations for proposed structures have been made to establish, in conjunction with optical-diffraction analogues, the features of the far-field diffraction patterns. These results have been compared with diffraction patterns obtained experimentally by transmission electron microscopy. The aim of the study, to show that the arrangement of the boundaries in these complicated phases can be deduced from their diffraction patterns without the need for high-resolution imaging, has been achieved. The steps to be taken to make these deductions are set out.

scholarly journals Rotary replication for freeze-etching.

1977 ◽  
Vol 72 (1) ◽  
pp. 47-56 ◽  
Author(s):  
L H Margaritis ◽  
A Elgsaeter ◽  
D Branton
Keyword(s):  
Electron Microscopy ◽  
Electron Diffraction ◽  
Optical Diffraction ◽  
Subunit Structure ◽  
Erythrocyte Ghosts ◽  
Chloroplast Membranes ◽  
Freeze Etching ◽  
Conventional Electron Microscopy

Rotary replication has been adapted to freeze-etching and evaluated using T4 polyheads, erythrocyte ghosts, and chloroplast membranes. Conventional electron microscopy, electron diffraction, and optical diffraction and filtering indicate that platinum-carbon rotary replication renders radially symmetrical contrast and 25 A resolution to freeze-etched specimens so as to clarify subunit structure not normally evident in unidirectional shadow replicas.

Electron Diffraction and TEM Studies of Y1Ba2Cu3O7−x

1987 ◽  
Vol 99 ◽  
Author(s):  
R. Pérez ◽  
J. G. Pérez-Ramírez ◽  
M. Avalos ◽  
J. Reyes ◽  
L. Martinez ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Diffraction ◽  
Optical Microscopy ◽  
Image Contrast ◽  
Zone Axis ◽  
Twin Boundaries ◽  
Boundary Area ◽  
Transmission Electron ◽  
The Common

ABSTRACTOptical microscopy and transmission electron microscopy show that most of the crystalline grains in Y1Ba2Cu3O7−x superconducting specimens have large number of twins. These bands of different image contrast have similar microdiffraction patterns. However the diffraction conditions are different and correspond to different tilts of the crystalline grains along one of the zone axis. HREM images of these twin boundaries indicate that the boundary area has appreciable dimensions and both matrix and twin crystals show the existence of a superstructure with double of the common periodicity obtained under [001] diffraction conditions.

Transmission Electron Microscopy Studies of NiFe/Cu/Co/Cu on Si.

1993 ◽  
Vol 313 ◽  
Author(s):  
P. Gautier ◽  
T. Valet ◽  
O. Durand ◽  
J.C. Jacquet ◽  
J.P. Chevalier
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Diffraction ◽  
Small Angle ◽  
Rf Sputtering ◽  
Columnar Structure ◽  
Individual Layer ◽  
Transmission Electron

ABSTRACT(NiFe/Cu/Co/Cu) Multilayers grown on (100) Si by RF sputtering have been studied by transmission electron Microscopy. The samples are found to be polycristalline and are only weakly textured. The period of the multilayers is clearly visible by small angle electron diffraction and Fresnel imaging. The waviness of the layers appears to be related to the columnar structure of the samples. Experimental images with Fresnel contrast are compared with simulations in order to assess the thickness and roughness of each individual layer.

Small-Angle X-ray Scattering and Electron Microscopy Investigation of Silica and Carbon Replicas with Ordered Porosity

Langmuir ◽  
2003 ◽  
Vol 19 (10) ◽  
pp. 4303-4308 ◽  
Author(s):  
Françoise Ehrburger-Dolle ◽  
Isabelle Morfin ◽  
Erik Geissler ◽  
Françoise Bley ◽  
Frédéric Livet ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Small Angle ◽  
X Ray ◽  
X Ray Scattering ◽  
Microscopy Investigation ◽  
Electron Microscopy Investigation ◽  
Carbon Replicas ◽  
Ray Scattering

Approximations in the Dynamical Theory of Electron Diffract

1978 ◽  
Vol 36 (3) ◽  
pp. 218-229
Author(s):  
S.S. Sheinin
Keyword(s):  
Electron Microscopy ◽  
Electron Diffraction ◽  
Quantitative Information ◽  
Dynamical Theory ◽  
Image Contrast ◽  
Academic Interest ◽  
Crystalline Materials ◽  
The Past ◽  
The Subject ◽  
Electron Microscopist

The last twenty years have seen a remarkable development in electron microscopy of crystalline materials. This development has, quite naturally, been stimulated by the continuing quest of the electron microscopist for more information about the structure of his specimens and it is not surprising, therefore, that the more qualitative observations of the past have been supplemented by techniques which permit higher resolution, more quantitative information to be extracted. The fundamental role played by the dynamical theory of electron diffraction in this development requires no emphasis on my part. As is true with all physical theories, however, the dynamical theory itself has been the subject of continued development and investigation. This work is not simply of academic interest but has been an important, and in fact necessary, concomitant of the developments in the electron microscopy of crystals referred to above. The reason for this can be easily understood when it is recalled that the form of the dynamical theory used in image contrast calculations has many approximations embodied in it.

High-resolution electron microscopy of disordered LiFeO2

1984 ◽  
Vol 42 ◽  
pp. 430-431
Author(s):  
Nobuo Tanaka ◽  
J.M. Cowley
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Electron Diffraction ◽  
Diffuse Scattering ◽  
Fine Powder ◽  
High Resolution Electron Microscopy ◽  
Optical Diffraction ◽  
Lithium Ferrite ◽  
Clustering Model ◽  
Resolution Electron

The disordered structure of lithium ferrite (α-LiFeO2) has been investigated in X-ray and electron diffraction techniques. The characteristic short range order (SRO) diffuse scattering was commonly interpreted by the clustering model. The SRO state can be described by interconnecting two kinds of clusters (Fig. 1). Alternatively, it may be interpreted in terms of microdomains of some ordered structures.In the present study, the specimen was investigated with high resolution electron microscopy and optical diffraction technique. The techniquescould give the information about the SRO state in a direct way. The material investigated was α-LiFeO2 in the form of a fine powder dispersed on a holey carbon grid.Fig. 2 shows electron diffraction patterns of the specimen in the <001> and <110> observing directions. The locus of the diffuse scattering does not exactly fit with the formula, cosπh + cosπk + cosπℓ = 0, which was derived from SRO arrangement of Li and Fe ions inside the clusters. This fact suggests the existance of “inter-cluster” ordering.

The use of Electron Microscopy and Electron Diffraction in the Study of Phase Transformations

1982 ◽  
Vol 21 ◽  
Author(s):  
S. Amelinckx ◽  
G. Van Tendeloo ◽  
J. Van Landuyt
Keyword(s):  
Electron Microscopy ◽  
Solid State ◽  
High Resolution ◽  
Electron Diffraction ◽  
Optical Diffraction ◽  
Solid State Electron ◽  
Selected Area Electron Diffraction ◽  
Separate Branch ◽  
Resolution Electron ◽  
Convergent Beam

In recent years a separate branch of electron microscopy, which can conveniently be termed “Solid State Electron Microscopy” has evolved into a discipline of its own, which makes use of a set of techniques such as- diffraction contrast electron microscopy- high resolution transmission electron microscopy- selected area electron diffraction- convergent beam electron diffraction- optical diffraction of high resolution electron micrographsand which allows to provide information on a wide variety of solid state phenomena. With the availability of microscopes with a resolution equal to interatomic distances its field of application has recently been extended greatly.

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