Electron Microscope Provided with a Six-Stage Image Forming Lens System

The image forming lens system of an electron microscope used for medical and biological applications has to meet the following requirements: (1) minimum off-axis aberration and distortion, (2) eliminated image rotation and focus deviation over wide magnification range, and (3) a wide field of view at low magnification. We have developed a new type of electron microscope which has a six-stage image forming lens system to satisfy the above requirements.The present paper describes the features of the electron microscope and also gives some application data for biological fields obtained with this instrument. The electron optical system is designed to provide a wide magnification range of 50x to l,000,000x by using a high resolution side entry goniometer with tilting facility of ±25°. Fig.l shows typical ray diagrams formed by the six-stage image forming system. The system consists of a dual objective (objective lens; OL and objective mini-lens; OM), triple intermediate lens (IL1, IL2 and IL3) and single projector lens (PL).

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Design of Zoom Lens System with Movable Components Including Large Aperture and with Ultra-Wide Field of View

Laser & Optoelectronics Progress ◽

10.3788/lop202158.0708001 ◽

2021 ◽

Vol 58 (7) ◽

pp. 0708001

Author(s):

沈志娟 Shen Zhijuan ◽

林海峰 Lin Haifeng ◽

曹一青 Cao Yiqing

Keyword(s):

Field Of View ◽

Zoom Lens ◽

Wide Field ◽

Lens System ◽

Large Aperture ◽

Wide Field Of View

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Contact problems between optical lenses and shrink fitter for a new type of laser microscope with a wide field of view

Computer Methods and Experimental Measurements for Surface Effects and Contact Mechanics VIII ◽

10.2495/secm070101 ◽

2007 ◽

Cited By ~ 2

Author(s):

I. Nitta ◽

A. Kanno

Keyword(s):

Contact Problems ◽

Field Of View ◽

Wide Field ◽

Wide Field Of View ◽

New Type

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Study of a New Type of Laser Microscope with Wide Field of View Using a Shrink Fitter

Journal of the Japan Society for Precision Engineering ◽

10.2493/jjspe.73.1226 ◽

2007 ◽

Vol 73 (11) ◽

pp. 1226-1232 ◽

Cited By ~ 3

Author(s):

Isami NITTA ◽

Akihiro KANNO ◽

Michiya OKAMOTO ◽

Yasushi NAGAOKA

Keyword(s):

Field Of View ◽

Wide Field ◽

Wide Field Of View ◽

New Type

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Optical System Design of a Wide Field-of-View Camera for the Characterization of Earth’s Reflected Solar Radiation

Remote Sensing ◽

10.3390/rs12162556 ◽

2020 ◽

Vol 12 (16) ◽

pp. 2556

Author(s):

Luca Schifano ◽

Lien Smeesters ◽

Francis Berghmans ◽

Steven Dewitte

Keyword(s):

Solar Radiation ◽

Field Of View ◽

Opening Angle ◽

Wide Field ◽

Lens System ◽

Optical System Design ◽

Cmos Sensor ◽

Wide Field Of View ◽

Commercial Off The Shelf

We report on the conceptual design of a new wide field-of-view shortwave camera, for measuring Earth’s reflected solar radiation. The camera comprises a commercial-off-the-shelf CMOS sensor, and a custom-designed wide field-of-view lens system with an opening angle of 140°. The estimated effective nadir resolution is 2.2 km. The simulated stand-alone random error of the broadband albedo is 3%. The camera is suited for integration within 1U of a CubeSat.

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A Field Emission System For Transmission Electron Microscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100071934 ◽

1973 ◽

Vol 31 ◽

pp. 298-299

Author(s):

Michel Troyonal ◽

Huei Pei Kuoal ◽

Benjamin M. Siegelal

Keyword(s):

Electron Microscope ◽

Field Emission ◽

Optical System ◽

High Vacuum ◽

Ultra High Vacuum ◽

Objective Lens ◽

Electron Optical System ◽

Cross Sectional ◽

Transmission Electron ◽

Emission System

A field emission system for our experimental ultra high vacuum electron microscope has been designed, constructed and tested. The electron optical system is based on the prototype whose performance has already been reported. A cross-sectional schematic illustrating the field emission source, preaccelerator lens and accelerator is given in Fig. 1. This field emission system is designed to be used with an electron microscope operated at 100-150kV in the conventional transmission mode. The electron optical system used to control the imaging of the field emission beam on the specimen consists of a weak condenser lens and the pre-field of a strong objective lens. The pre-accelerator lens is an einzel lens and is operated together with the accelerator in the constant angular magnification mode (CAM).

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STM studies of crystal growth

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100086179 ◽

1991 ◽

Vol 49 ◽

pp. 374-375

Author(s):

M. G. Lagally

Keyword(s):

Crystal Growth ◽

Molecular Beam ◽

Chemical Vapor ◽

Sputter Deposition ◽

Field Of View ◽

Scanning Tunneling ◽

Wide Field ◽

Tunneling Microscopy ◽

Wide Field Of View ◽

The One

It has been recognized since the earliest days of crystal growth that kinetic processes of all Kinds control the nature of the growth. As the technology of crystal growth has become ever more refined, with the advent of such atomistic processes as molecular beam epitaxy, chemical vapor deposition, sputter deposition, and plasma enhanced techniques for the creation of “crystals” as little as one or a few atomic layers thick, multilayer structures, and novel materials combinations, the need to understand the mechanisms controlling the growth process is becoming more critical. Unfortunately, available techniques have not lent themselves well to obtaining a truly microscopic picture of such processes. Because of its atomic resolution on the one hand, and the achievable wide field of view on the other (of the order of micrometers) scanning tunneling microscopy (STM) gives us this opportunity. In this talk, we briefly review the types of growth kinetics measurements that can be made using STM. The use of STM for studies of kinetics is one of the more recent applications of what is itself still a very young field.

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Electron holography of p-n junctions

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100167330 ◽

1996 ◽

Vol 54 ◽

pp. 974-975

Author(s):

B.G. Frost ◽

D.C. Joy ◽

L.F. Allard ◽

E. Voelkl

Keyword(s):

Electron Beam ◽

Electron Microscope ◽

Field Emission ◽

Ccd Camera ◽

Image Plane ◽

Reference Wave ◽

Field Of View ◽

Control Mode ◽

Objective Lens ◽

Electron Holography

A wide holographic field of view (up to 15 μm in the Hitachi-HF2000) is achieved in a TEM by switching off the objective lens and imaging the sample by the first intermediate lens. Fig.1 shows the corresponding ray diagram for low magnification image plane off-axis holography. A coherent electron beam modulated by the sample in its amplitude and its phase is superimposed on a plane reference wave by a negatively biased Möllenstedt-type biprism.Our holograms are acquired utilizing a Hitachi HF-2000 field emission electron microscope at 200 kV. Essential for holography are a field emission gun and an electron biprism. At low magnification, the excitation of each lens must be appropriately adjusted by the free lens control mode of the microscope. The holograms are acquired by a 1024 by 1024 slow-scan CCD-camera and processed by the “Holoworks” software. The hologram fringes indicate positively and negatively charged areas in a sample by the direction of the fringe bending (Fig.2).

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Comparison of freeze-fractured yeast replicas using conventional TEM and low-voltage field-emission SEM

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100152343 ◽

1989 ◽

Vol 47 ◽

pp. 74-75

Author(s):

William P. Wergin ◽

Eric F. Erbe ◽

Terrence W. Reilly

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Field Emission ◽

Low Voltage ◽

Objective Lens ◽

Specimen Preparation ◽

Lens System ◽

Air Drying ◽

Preparation Techniques ◽

Scanning Electron

Although the first commercial scanning electron microscope (SEM) was introduced in 1965, the limited resolution and the lack of preparation techniques initially confined biological observations to relatively low magnification images showing anatomical surface features of samples that withstood the artifacts associated with air drying. As the design of instrumentation improved and the techniques for specimen preparation developed, the SEM allowed biologists to gain additional insights not only on the external features of samples but on the internal structure of tissues as well. By 1985, the resolution of the conventional SEM had reached 3 - 5 nm; however most biological samples still required a conductive coating of 20 - 30 nm that prevented investigators from approaching the level of information that was available with various TEM techniques. Recently, a new SEM design combined a condenser-objective lens system with a field emission electron source.

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