A new technique for measuring the local nitrogen concentration in Gap by means of the scanning electron microscope

The nuclear reaction and optical absorption techniques have been developed to determine the absolute nitrogen doping concentration in GaP crystals/1/.In both cases the data measured are averaged over the doped layer and these methods do not permit to obtain the nitrogen doping profile across the layer.In this work the measurement of the nitrogen concentration in GaP LED structures is carried out with high spatial resolution by using the local cathodoluminescence (CL) data obtained in the scanning electron microscope (SEM).The method is based on determining in CL spectra the degree of the A-line self-absorption by substitutional nitrogen in GaP crystal.lt has been shown recently /2/ that in the temperature range of 77°K - 130°K without self-absorption the peak intensities ratio of A-line and its phonon replication side bands A-LO and A-2L0 in luminescence spectra of GaP should correspond to 1,00 : 0,36 : 0,065.

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A new technique for specimen manipulation in the scanning electron microscope

Journal of Microscopy ◽

10.1111/j.1365-2818.1970.tb02243.x ◽

1970 ◽

Vol 92 (2) ◽

pp. 113-118 ◽

Cited By ~ 3

Author(s):

N. E. Bywater ◽

T. Buckley

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

New Technique ◽

A New Technique ◽

Scanning Electron

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A new technique for the examination of fatigue striations with the scanning electron microscope

Metallography ◽

10.1016/0026-0800(73)90009-8 ◽

1973 ◽

Vol 6 (2) ◽

pp. 176-182

Author(s):

M. Sarracino

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

New Technique ◽

Fatigue Striations ◽

A New Technique ◽

Scanning Electron

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A method for investigation of fluctuations in doping concentration and minority-carrier diffusion length in semiconductors by scanning electron microscope

Microelectronics Reliability ◽

10.1016/0026-2714(77)90094-4 ◽

1977 ◽

Vol 16 (1) ◽

pp. 22-23

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Doping Concentration ◽

Minority Carrier ◽

Diffusion Length ◽

Minority Carrier Diffusion Length ◽

Carrier Diffusion ◽

In Doping ◽

Scanning Electron

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A technique for viewing the same nannofossil specimen in light microscope and scanning electron microscope using standard preparation materials

Journal of Micropalaeontology ◽

10.1144/jm.7.1.53 ◽

1988 ◽

Vol 7 (1) ◽

pp. 53-57 ◽

Cited By ~ 3

Author(s):

Liam T. Gallagher

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Light Microscope ◽

New Technique ◽

Standard Preparation ◽

A New Technique ◽

Scanning Electron

Abstract. A new technique for viewing the same nannofossil specimen under the light microscope and scanning electron microscope is described, in which standard preparation materials are used. The applications of this, and previous techniques, are discussed as well as the relevance of these to the elucidation of taxonomic problems.

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Scanning Electron Microscope-Cathodoluminescence Analysis of Rare-Earth Elements in Magnets

Microscopy and Microanalysis ◽

10.1017/s1431927615015676 ◽

2016 ◽

Vol 22 (1) ◽

pp. 82-86 ◽

Cited By ~ 3

Author(s):

Susumu Imashuku ◽

Kazuaki Wagatsuma ◽

Jun Kawai

Keyword(s):

Rare Earth ◽

Electron Microscope ◽

Hydrochloric Acid ◽

Scanning Electron Microscope ◽

Rare Earth Elements ◽

Luminescence Spectra ◽

Ndfeb Magnet ◽

Ndfeb Magnets ◽

X Ray ◽

Scanning Electron

AbstractScanning electron microscope-cathodoluminescence (SEM-CL) analysis was performed for neodymium–iron–boron (NdFeB) and samarium–cobalt (Sm–Co) magnets to analyze the rare-earth elements present in the magnets. We examined the advantages of SEM-CL analysis over conventional analytical methods such as SEM-energy-dispersive X-ray (EDX) spectroscopy and SEM-wavelength-dispersive X-ray (WDX) spectroscopy for elemental analysis of rare-earth elements in NdFeB magnets. Luminescence spectra of chloride compounds of elements in the magnets were measured by the SEM-CL method. Chloride compounds were obtained by the dropwise addition of hydrochloric acid on the magnets followed by drying in vacuum. Neodymium, praseodymium, terbium, and dysprosium were separately detected in the NdFeB magnets, and samarium was detected in the Sm–Co magnet by the SEM-CL method. In contrast, it was difficult to distinguish terbium and dysprosium in the NdFeB magnet with a dysprosium concentration of 1.05 wt% by conventional SEM-EDX analysis. Terbium with a concentration of 0.02 wt% in an NdFeB magnet was detected by SEM-CL analysis, but not by conventional SEM-WDX analysis. SEM-CL analysis is advantageous over conventional SEM-EDX and SEM-WDX analyses for detecting trace rare-earth elements in NdFeB magnets, particularly dysprosium and terbium.

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