An attempt to get an EEL filter image of biological sections using a spectrometer and a scanning device

1990 ◽  
Vol 48 (2) ◽  
pp. 22-23
Author(s):  
Yutaka Futaesaku ◽  
Kachiko Sekiya ◽  
Michiko Ono ◽  
Atsushi Nakamura ◽  
Yoshiko Nakamura ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Osmium Tetroxide ◽  
Cultured Cells ◽  
Scanning Transmission Electron Microscope ◽  
Light Elements ◽  
Combined System ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Ultrathin Sections ◽  
Electron Energy Loss

An amount of light elements contained in biological specimens is barely a few, so that the detection of them in the ultrathin sections is imposible. An analysis of electron energy loss (EEL) filter image is an ideal to detect such as phosphorus including in the sections. CEM-902 is a commercially available electron microscope to use for a such purpose. The authers attempted to get EEL filter images using the combined system of a conventional scanning transmission electron microscope (STEM) with EELS analyzer.The cultured cells with calcified substances and the liver, kidney, thyroid gland were used for biological specimens. There were fixed with 2.5% glutaraldehyde and with or without 1% osmium tetroxide, and then embedded in epoxy resin. 40 run thick sections were analyzed without any staining and carbon coating using a Carl Zeiss CEM-902 or a JEOL 2000EX with a EELS analyzer and a Tracor-Northern TN-5500, and with a Gatan cryo-transfer holder.

High Spatial Resolution Compositional Analysis at Interfaces

1980 ◽  
Vol 38 ◽  
pp. 356-359
Author(s):  
John B. Vander Sande ◽  
Thomas F. Kelly ◽  
Douglas Imeson
Keyword(s):  
Electron Microscope ◽  
High Spatial Resolution ◽  
Compositional Analysis ◽  
Scanning Transmission Electron Microscope ◽  
Thin Specimen ◽  
X Ray ◽  
Volume Of Interest ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Electron Energy Loss

In the scanning transmission electron microscope (STEM) a fine probe of electrons is scanned across the thin specimen, or the probe is stationarily placed on a volume of interest, and various products of the electron-specimen interaction are then collected and used for image formation or microanalysis. The microanalysis modes usually employed in STEM include, but are not restricted to, energy dispersive X-ray analysis, electron energy loss spectroscopy, and microdiffraction.

Nanochemistry of Ceria Abrasive Particles

2004 ◽  
Vol 818 ◽  
Author(s):  
Shelley R. Gilliss ◽  
James Bentley ◽  
C. Barry
Keyword(s):  
Electron Microscope ◽  
Scanning Transmission Electron Microscope ◽  
White Line ◽  
Abrasive Particles ◽  
Transmission Electron ◽  
Line Intensity Ratio ◽  
Cerium Ion ◽  
Scanning Transmission ◽  
Electron Energy Loss ◽  
Rare Earth Impurities

AbstractSurfaces of ceria (CeO2) particles have been studied by electron energy-loss spectroscopy in a field-emission gun scanning transmission electron microscope. All the ceria particles analyzed contained Ce3+ at the surface. Rare-earth impurities such as La were enriched at the surface and were observed for particles ranging from tens to hundreds of nanometers in size. The oxidation state of the cerium ion is measured from the Ce M5/M4white-line intensity ratio.

Optimization of Acquisition Parameters for Atomic-Column Electron Energy-Loss Spectrum Imaging in a JEM-2200FS Aberration-Corrected Scanning Transmission Electron Microscope

2008 ◽  
Vol 14 (S2) ◽  
pp. 1400-1401 ◽  
Author(s):  
M Watanabe ◽  
M Kanno ◽  
D Ackland ◽  
CJ Kiely ◽  
DB Williams
Keyword(s):  
Electron Microscope ◽  
New Mexico ◽  
Energy Loss ◽  
Scanning Transmission Electron Microscope ◽  
Atomic Column ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Spectrum Imaging ◽  
Electron Energy Loss ◽  
Aberration Corrected

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

ELECTRON ENERGY LOSS SPECTROSCOPY AND ANNULAR DARK FIELD IMAGING AT A NANOMETER RESOLUTION IN A SCANNING TRANSMISSION ELECTRON MICROSCOPE

2000 ◽  
Vol 07 (04) ◽  
pp. 475-494 ◽  
Author(s):  
O. STÉPHAN ◽  
A. GLOTER ◽  
D. IMHOFF ◽  
M. KOCIAK ◽  
C. MORY ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Energy Loss ◽  
Electron Energy ◽  
Transmission Electron Microscope ◽  
Electron Energy Loss Spectroscopy ◽  
Scanning Transmission Electron Microscope ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Electron Energy Loss

The basics of electron energy loss spectroscopy (EELS) performed in the context of a scanning transmission electron microscope are described. This includes instrumentation, information contained in an EELS spectrum, data acquisition and processing, and some illustrations by a few examples.

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