Analytical electron microscope based on scanning transmission electron microscope with wavelength dispersive x-ray spectroscopy to realize highly sensitive elemental imaging especially for light elements
2016 ◽
Vol 28
(1)
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pp. 015904
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2014 ◽
Vol 20
(2)
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pp. 323-329
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1991 ◽
Vol 49
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pp. 698-699
1990 ◽
Vol 48
(2)
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pp. 442-443
1980 ◽
Vol 38
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pp. 356-359
2021 ◽
1977 ◽
Vol 110
(2)
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pp. 107-112
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2014 ◽
Vol 20
(4)
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pp. 1318-1326
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2012 ◽
Vol 18
(S2)
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pp. 974-975
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