High Spatial Resolution Compositional Analysis at Interfaces

1980 ◽  
Vol 38 ◽  
pp. 356-359
Author(s):  
John B. Vander Sande ◽  
Thomas F. Kelly ◽  
Douglas Imeson
Keyword(s):  
Electron Microscope ◽  
High Spatial Resolution ◽  
Compositional Analysis ◽  
Scanning Transmission Electron Microscope ◽  
Thin Specimen ◽  
X Ray ◽  
Volume Of Interest ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Electron Energy Loss

In the scanning transmission electron microscope (STEM) a fine probe of electrons is scanned across the thin specimen, or the probe is stationarily placed on a volume of interest, and various products of the electron-specimen interaction are then collected and used for image formation or microanalysis. The microanalysis modes usually employed in STEM include, but are not restricted to, energy dispersive X-ray analysis, electron energy loss spectroscopy, and microdiffraction.

Correlative electron and X-ray microscopy: probing chemistry and bonding with high spatial resolution

Nanoscale ◽  
2015 ◽  
Vol 7 (5) ◽  
pp. 1534-1548 ◽  
Author(s):  
Angela E. Goode ◽  
Alexandra E. Porter ◽  
Mary P. Ryan ◽  
David W. McComb
Keyword(s):  
Electron Microscope ◽  
Energy Loss ◽  
Transmission Electron Microscope ◽  
High Spatial Resolution ◽  
Scanning Transmission Electron Microscope ◽  
X Ray ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Electron Energy Loss ◽  
X Ray Absorption

Benefits and challenges of correlative spectroscopy: electron energy-loss spectroscopy in the scanning transmission electron microscope (STEM-EELS) and X-ray absorption spectroscopy in the scanning transmission X-ray microscope (STXM-XAS).

Efforts to improve the quantification of EDX analyses, particularly for the light elements

1991 ◽  
Vol 49 ◽  
pp. 716-717
Author(s):  
G. L'Espérance
Keyword(s):  
Scanning Transmission Electron Microscope ◽  
Light Elements ◽  
Thin Specimen ◽  
Complementary Technique ◽  
X Ray ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Edx Analyses ◽  
Electron Energy Loss ◽  
Detection And Quantification

The attachment of a Si(Li) energy dispersive X-ray (EDX) detector to a (scanning) transmission electron microscope ((S)TEM) is widely used to carry out quantitative determinations of elemental composition of a localized region of a thin specimen. Although the principles of the technique first proposed by Cliff and Lorimer have been established for some time, there are still a large number of sources of errors. In addition, EDX analyses have been generally restricted until recently to elements with an atomic number (Z) larger than that of sodium (Z > 10) so that electron energy loss spectroscopy (EELS) was the preferred technique for the detection of light elements in an AEM. The relatively recent advent of ultra-thin window (UTW) detectors has offered an alternative (and often complementary) technique to EELS for the analysis of light elements with additional difficulties in the detection and quantification. This paper presents some results of investigations made to improve the quantification of EDX data. Particular attention is given to the detection and quantification of data from light elements on a routine and reproducible basis.

Nanochemistry of Ceria Abrasive Particles

2004 ◽  
Vol 818 ◽  
Author(s):  
Shelley R. Gilliss ◽  
James Bentley ◽  
C. Barry
Keyword(s):  
Electron Microscope ◽  
Scanning Transmission Electron Microscope ◽  
White Line ◽  
Abrasive Particles ◽  
Transmission Electron ◽  
Line Intensity Ratio ◽  
Cerium Ion ◽  
Scanning Transmission ◽  
Electron Energy Loss ◽  
Rare Earth Impurities

AbstractSurfaces of ceria (CeO2) particles have been studied by electron energy-loss spectroscopy in a field-emission gun scanning transmission electron microscope. All the ceria particles analyzed contained Ce3+ at the surface. Rare-earth impurities such as La were enriched at the surface and were observed for particles ranging from tens to hundreds of nanometers in size. The oxidation state of the cerium ion is measured from the Ce M5/M4white-line intensity ratio.

Experimental verification of the need for either jj or intermediate coupling in the 5f states of plutonium

2003 ◽  
Vol 802 ◽  
Author(s):  
K. T. Moore ◽  
M. A. Wall ◽  
A. J. Schwartz ◽  
B. W. Chung ◽  
J. G. Tobin ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Electron Microscope ◽  
Synchrotron Radiation ◽  
Single Phase ◽  
High Spatial Resolution ◽  
Intermediate Coupling ◽  
X Ray ◽  
Transmission Electron ◽  
Electron Energy Loss ◽  
X Ray Absorption

ABSTRACTHere, we demonstrate the power of electron energy-loss spectroscopy (EELS) in a transmission electron microscope (TEM) to investigate the electronic structure plutonium. Using EELS, TEM, and synchrotron-radiation-based X-ray absorption spectroscopy (XAS), we provide the first experimental evidence that Russell-Saunders (LS) coupling fails for the 5f states of Pu. These results support the assumption that only the use of jj or intermediate coupling is appropriate for the 5f states of Pu. EELS experiments were performed in a TEM and are coupled with image and diffraction data, therefore, the measurements are completely phase specific. It is shown that EELS in a TEM may be used to circumvent the difficulty of producing single-phase or single-crystal samples due to its high spatial resolution.

Quantitative Analysis of Atomic-Resolution X-ray Maps in an Aberration- Corrected Scanning Transmission Electron Microscope with a Large Solid- Angle Detector

2012 ◽  
Vol 18 (S2) ◽  
pp. 974-975 ◽  
Author(s):  
M. Watanabe ◽  
A. Yasuhara ◽  
E. Okunishi
Keyword(s):  
Electron Microscope ◽  
Quantitative Analysis ◽  
Transmission Electron Microscope ◽  
Solid Angle ◽  
Scanning Transmission Electron Microscope ◽  
Atomic Resolution ◽  
X Ray ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Aberration Corrected

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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