DISVAR93: A software package for determining systematic effects in X-ray powder diffractometry

1995 ◽  
Vol 10 (2) ◽  
pp. 104-111 ◽  
Author(s):  
G. Berti ◽  
S. Giubbili ◽  
E. Tognoni
Keyword(s):  
Software Package ◽  
User Interaction ◽  
Diffraction Theory ◽  
Data Uncertainty ◽  
User Requirements ◽  
Main Menu ◽  
Additive Property ◽  
X Ray ◽  
Systematic Effects ◽  
Xrpd Patterns

DISVAR93 is a collection of programs devised to process XRPD patterns with the aim of determining the parameters of systematic instrumentation and sample effects. These effects have an influence on data uncertainty and also accuracy of the adopted models describing diffraction phenomena. Such modeling is carried out through the mathematical X-ray powder-diffraction theory, while parameter optimization is achieved by using the additive property of X2 and constraining the models to converge simultaneously to the same minimum in a restrained Hilbert's space. The package has been designed to allow both user interaction as well as automatic linking of programs managed by one main menu and offer several options to satisfy individual user requirements.

X-ray diffraction properties of curved crystal diffractors

1992 ◽  
Vol 50 (2) ◽  
pp. 1734-1735
Author(s):  
W. Z. Chang ◽  
D. B. Wittry
Keyword(s):  
Diffraction Theory ◽  
X Rays ◽  
Diffraction Image ◽  
X Ray Diffraction ◽  
Rocking Curve ◽  
X Ray ◽  
Bent Crystal ◽  
Diffraction Geometry ◽  
Crystal Parameter ◽  
Quantitative Procedure

Since Du Mond and Kirkpatrick first discussed the principle of a bent crystal spectrograph in 1930, curved single crystals have been widely utilized as spectrometric monochromators as well as diffractors for focusing x rays diverging from a point. Curved crystal diffraction theory predicts that the diffraction parameters - the rocking curve width w, and the peak reflection coefficient r of curved crystals will certainly deviate from those of their flat form. Due to a lack of curved crystal parameter data in current literature and the need for optimizing the choice of diffraction geometry and crystal materials for various applications, we have continued the investigation of our technique presented at the last conference. In the present abstract, we describe a more rigorous and quantitative procedure for measuring the parameters of curved crystals.The diffraction image of a singly bent crystal under study can be obtained by using the Johann geometry with an x-ray point source.

Computer programs for the calculation of x-ray intensities emitted by elements in multi-layer structures

1990 ◽  
Vol 48 (2) ◽  
pp. 216-217
Author(s):  
G.F. Bastin ◽  
H.J.M. Heijligers ◽  
J.M. Dijkstra
Keyword(s):  
Software Package ◽  
Light Element ◽  
Matrix Correction ◽  
Excellent Performance ◽  
Element Analysis ◽  
X Ray ◽  
Know How ◽  
Accurate Knowledge ◽  
Layer Structures ◽  
Bulk Matrix

For the calculation of X-ray intensities emitted by elements present in multi-layer systems it is vital to have an accurate knowledge of the x-ray ionization vs. mass-depth (ϕ(ρz)) curves as a function of accelerating voltage and atomic number of films and substrate. Once this knowledge is available the way is open to the analysis of thin films in which both the thicknesses as well as the compositions can usually be determined simultaneously.Our bulk matrix correction “PROZA” with its proven excellent performance for a wide variety of applications (e.g., ultra-light element analysis, extremes in accelerating voltage) has been used as the basis for the development of the software package discussed here. The PROZA program is based on our own modifications of the surface-centred Gaussian ϕ(ρz) model, originally introduced by Packwood and Brown. For its extension towards thin film applications it is required to know how the 4 Gaussian parameters α, β, γ and ϕ(o) for each element in each of the films are affected by the film thickness and the presence of other layers and the substrate.

Highlights in the history of X-ray topography1

1995 ◽  
Vol 210 (6) ◽  
Author(s):  
A. R. Lang
Keyword(s):  
Magnetic Domain ◽  
Diffraction Theory ◽  
Dislocation Loops ◽  
X Ray Diffraction ◽  
X Ray ◽  
Domain Structures ◽  
Structure Factors ◽  
History Of ◽  
Dislocation Sources ◽  
Non Destructive

AbstractX-ray topography provides a non-destructive method of mapping point-by-point variations in orientation and reflecting power within crystals. The discovery, made by several workers independently, that in nearly perfect crystals it was possible to detect individual dislocations by X-ray diffraction contrast started an epoch of rapid exploitation of X-ray topography as a new, general method for assessing crystal perfection. Another discovery, that of X-ray Pendellösung, led to important theoretical developments in X-ray diffraction theory and to a new and precise method for measuring structure factors on an absolute scale. Other highlights picked out for mention are studies of Frank-Read dislocation sources, the discovery of long dislocation helices and lines of coaxial dislocation loops in aluminium, of internal magnetic domain structures in Fe-3 wt.% Si, and of stacking faults in silicon and natural diamonds.

A General-Purpose Software for Menu Design of CAD Projects

1993 ◽  
Author(s):  
Y. C. Pao
Keyword(s):  
Software Package ◽  
Computer Programs ◽  
General Purpose ◽  
Final Report ◽  
Sample Design ◽  
Main Menu ◽  
Sample Application ◽  
User Friendly ◽  
Four Bar Linkage ◽  
General Purpose Software

Abstract A software package MenuCAD has been developed for the general need of designing menu-driven, user-friendly CAD computer programs. The main menu is formatted similar to the major contents in the final report of the design project including Contents, Analysis, Sample Design Cases, Illustrations and Tables, References, and Program Listings. Sub-menus are further divided into items delineating the steps involved in the design. Screen help messages are provided for design of the main menu and sub-menus interactively and for applying the arrow keys on the keyboard to select a sub-menus and a particular item in the sub-menu in order to execute a desired design step. MenuCAD builds the framework, its user has to supplement with a subroutine ExecItem for describing the special features and for directing how each design step should be executed in the project. A CAD design of four-bar linkage project is presented as a sample application of this package.

SEDEM, a Software Package for EXAFS Data Extraction and Modelling

1998 ◽  
Vol 5 (5) ◽  
pp. 1287-1297 ◽  
Author(s):  
Daniel Aberdam
Keyword(s):  
Software Package ◽  
Data Extraction ◽  
Direct Determination ◽  
Energy Shift ◽  
Waller Factor ◽  
Gradient Algorithm ◽  
Least Mean Square ◽  
Exafs Data ◽  
X Ray ◽  
Fourier Filtering

A software package for extended X-ray absorption fine structure (EXAFS) data extraction and modelling, running on DOS- or Windows-operated PCs, is described. This package is written with the aim of giving the user a tool to undertake all steps of data processing and modelling, rather than making use of the most recent programming facilities. However, it remains easy to use, and self-explanatory to those who have already worked with EXAFS. It is divided into two main executable pieces of software. The first one is used to extract the EXAFS k n χ(k) function from the data and isolate the shell contributions by Fourier filtering. A tool to sum the spectra before EXAFS extraction is provided. The second one is designed to model the EXAFS spectra or the shell contributions, using amplitude and phase data either from McKale's tables, computed from the FEFF program or extracted from experimental reference spectra. This modelling program allows either an optimization of the simulation by a least-mean-square gradient algorithm, with a statistical evaluation of the result of optimization, or, in the case of a single shell, a direct determination of the four main parameters (neighbour distance and number, energy shift and Debye–Waller factor) by decorrelation of the phase and amplitude. In the presence of anharmonicity, the cumulant expansion of the radial distribution of distances is obtained from the phase and amplitude decorrelation. This package is in use at the Collaborative Research Group on Interfaces (CRG-IF) bending-magnet #32 X-ray line (BM-32) at the European Synchrotron Radiation Facility (ESRF) in Grenoble, France.

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