A Type of Geiger-Müller Counter Suitable for the Measurement of Diffracted Mo K X-Rays

1991 ◽  
Vol 6 (3) ◽  
pp. 126-129
Author(s):  
Donald P. LeGalley
Keyword(s):  
Reliable Method ◽  
X Rays ◽  
X Ray ◽  
Geiger Muller Counter ◽  
Counter Circuit ◽  
Diffraction Patterns ◽  
Proper Values ◽  
Design And Construction

The design and construction of Geiger-Müller counters which will respond reliably to Mo K x-rays is described. The impulses are amplified and recorded mechanically with the aid of a thyratron circuit. The amplifying and counting circuit, and the counting mechanism, are also described. The time of recovery of the counters has been determined by the use of an oscillograph and found to be less than 0.001 sec. when the proper values are used for the resistance and capacitance of the counter circuit. It is shown that for counting rates up to 600 per minute there is less than a 1 percent correction due to the fact that the impulses are random in nature. Several fundamental tests are described, which have been applied to the counter and the circuit. These tests have shown the counter and the circuit to be a reliable method of measuring x-ray intensities. Graphs are shown of the diffraction patterns of NaCl and KC1 taken by means of the counters. These graphs duplicate the well-known diffraction patterns of these materials, thus giving additional evidence of the reliability of the counters.

Morphological and synchrotron X-ray microdiffraction studies of large columnar CVD diamond crystallites

1999 ◽  
Vol 32 (5) ◽  
pp. 924-933 ◽  
Author(s):  
A. R. Lang ◽  
A. P. W. Makepeace ◽  
J. E. Butler
Keyword(s):  
Vapour Deposition ◽  
Chemical Vapour ◽  
Coarse Grained ◽  
X Rays ◽  
Small Cross Section ◽  
X Ray ◽  
Chemical Vapour Deposition Diamond ◽  
Core Column ◽  
Diffraction Patterns ◽  
Goniometric Measurements

Optical microscopic and goniometric measurements were combined with microradiography, diffraction-pattern analysis and topography to study a 2 mm thick [001]-texture CVD (chemical vapour deposition) diamond film that had developed a coarse-grained structure composed of separate columnar crystallites. Individual columns were capped by large (001) facets, with widths up to 0.5 mm, and which were smooth but not flat, whereas the column sides were morphologically irregular. The refractive deviation of X-rays transmitted through the crystallites was exploited for delineating facet edges, thereby facilitating the controlled positioning of small-cross-section X-ray beams used for recording diffraction patterns from selected volumes in two representative crystallites. Their structure consisted of a [001]-axial core column surrounded by columns in twin orientation with respect to the core. The diamond volume directly below the (001) facets was free from low-angle boundaries, and no dislocation outcrops on the facets were detected. Significant elastic deformation of this volume was only present close to the facet periphery, where misorientations reached a few milliradians. Lattice imperfection was high in the twins, with ∼1° misorientations.

scholarly journals Hard X-ray polarizer to enable simultaneous three-dimensional nanoscale imaging of magnetic structure and lattice strain

2016 ◽  
Vol 23 (5) ◽  
pp. 1210-1215 ◽  
Author(s):  
Jonathan Logan ◽  
Ross Harder ◽  
Luxi Li ◽  
Daniel Haskel ◽  
Pice Chen ◽  
...  
Keyword(s):  
Magnetic Circular Dichroism ◽  
Three Dimensional ◽  
Control Sample ◽  
Magnetic Ordering ◽  
X Rays ◽  
Diffractive Imaging ◽  
X Ray ◽  
Coherent Diffractive Imaging ◽  
Diffraction Patterns ◽  
A New Technique

Recent progress in the development of dichroic Bragg coherent diffractive imaging, a new technique for simultaneous three-dimensional imaging of strain and magnetization at the nanoscale, is reported. This progress includes the installation of a diamond X-ray phase retarder at beamline 34-ID-C of the Advanced Photon Source. The performance of the phase retarder for tuning X-ray polarization is demonstrated with temperature-dependent X-ray magnetic circular dichroism measurements on a gadolinium foil in transmission and on a Gd5Si2Ge2crystal in diffraction geometry with a partially coherent, focused X-ray beam. Feasibility tests for dichroic Bragg coherent diffractive imaging are presented. These tests include (1) using conventional Bragg coherent diffractive imaging to determine whether the phase retarder introduces aberrations using a nonmagnetic gold nanocrystal as a control sample, and (2) collecting coherent diffraction patterns of a magnetic Gd5Si2Ge2nanocrystal with left- and right-circularly polarized X-rays. Future applications of dichroic Bragg coherent diffractive imaging for the correlation of strain and lattice defects with magnetic ordering and inhomogeneities are considered.

X-Ray Diffraction

2021 ◽  
pp. 408-480
Author(s):  
Kannan M. Krishnan
Keyword(s):  
Point Group ◽  
Polycrystalline Materials ◽  
X Rays ◽  
X Ray Diffraction ◽  
Symmetry Point Group ◽  
X Ray ◽  
Atomic Scattering ◽  
Scattering Factor ◽  
Diffraction Patterns ◽  
Lattice Planes

X-rays diffraction is fundamental to understanding the structure and crystallography of biological, geological, or technological materials. X-rays scatter predominantly by the electrons in solids, and have an elastic (coherent, Thompson) and an inelastic (incoherent, Compton) component. The atomic scattering factor is largest (= Z) for forward scattering, and decreases with increasing scattering angle and decreasing wavelength. The amplitude of the diffracted wave is the structure factor, F hkl, and its square gives the intensity. In practice, intensities are modified by temperature (Debye-Waller), absorption, Lorentz-polarization, and the multiplicity of the lattice planes involved in diffraction. Diffraction patterns reflect the symmetry (point group) of the crystal; however, they are centrosymmetric (Friedel law) even if the crystal is not. Systematic absences of reflections in diffraction result from glide planes and screw axes. In polycrystalline materials, the diffracted beam is affected by the lattice strain or grain size (Scherrer equation). Diffraction conditions (Bragg Law) for a given lattice spacing can be satisfied by varying θ or λ — for study of single crystals θ is fixed and λ is varied (Laue), or λ is fixed and θ varied to study powders (Debye-Scherrer), polycrystalline materials (diffractometry), and thin films (reflectivity). X-ray diffraction is widely applied.

The Use of 2-D Detector Utilizing Laser-Stimulated Luminescence for X-ray Diffraction Studies on Mechanical Behaviour of Materials

1989 ◽  
Vol 33 ◽  
pp. 389-396 ◽  
Author(s):  
Y. Yoshioka ◽  
T. Shinkai ◽  
S. Ohya
Keyword(s):  
Fracture Analysis ◽  
X Rays ◽  
Large Reduction ◽  
X Ray Diffraction ◽  
Crystalline Materials ◽  
X Ray ◽  
Material Evaluation ◽  
Position Sensitive ◽  
Diffraction Patterns ◽  
Position Sensitive Detectors

The development of linear position-sensitive detectors (PSD) has resulted in a large reduction of data acquisition times in the field of x-ray stress analysis. However, we also require two-dimensional (2-D) diffraction patterns for material evaluation. Especially, the microbeam x-ray diffraction technique gives valuable information on the structure of crystalline materials and this technique has been applied to fracture analysis by x-rays. Many kinds of 2-D PSD have been developed that have insufficient spatial resolution. So x-ray film has still been used as a 2-D detector, but it requires relatively long exposure times and then the process after exposure is very troublesome.

The Atomic Order in Guinier-Preston Zones of Aluminum-Silver Alloys

1963 ◽  
Vol 7 ◽  
pp. 1-13 ◽  
Author(s):  
Volkmar Gerold ◽  
Heinz Auer ◽  
Winfried Merz
Keyword(s):  
Room Temperature ◽  
Three Dimensional ◽  
Miscibility Gap ◽  
X Rays ◽  
Atomic Order ◽  
Zone Size ◽  
X Ray ◽  
Angle Scattering ◽  
Diffraction Patterns ◽  
Step Quenching

AbstractThe formation of the spherical Guinier—Preston zones in an aluminum-silver alloy is governed by a metastable miscibility gap, which consists of two different sections. The lower section occurs below 170°C (η state), the higher section up to 420°C (∊ state). The zones in the two sections differ in their silver concentration and in their atomic order. To prove the change in order, a combination of X-ray small-angle scattering and electric resistivity measurements was used. As the resistivity depends on the zone size and the atomic order, the change in order can be found when the zone size is known. This size was measured by the X-ray technique. To complete the results, X-rays ingle-crystal diffraction patterns with monochromatic radiation were taken at different stages. According to these patterns, three different states must be distinguished.The η′ state exists at room temperature after quenching from 550°C. The silver atoms prefer a layered arrangement in the zones, which is not very stable. It is destroyed after short annealings above 100°C. The η state is developed during annealing below 170°C. A three-dimensional atomic order is built up with increasing zone size, which results in a marked decrease in the resistivity. For the ∊ state (above 170°C), a nearly random atomic distribution exists. Step-quenching experiments prove that the ordered η state can also be developed at room temperature.

Electrochemical Deposition and Characterization of Cd-Fe-Se Thin Films

2009 ◽  
Vol 68 ◽  
pp. 69-76 ◽  
Author(s):  
S. Thanikaikarasan ◽  
T. Mahalingam ◽  
K. Sundaram ◽  
Tae Kyu Kim ◽  
Yong Deak Kim ◽  
...  
Keyword(s):  
Thin Films ◽  
Hexagonal Structure ◽  
X Rays ◽  
X Ray Diffraction ◽  
X Ray ◽  
Iron Selenide ◽  
Glass Substrates ◽  
Diffraction Patterns ◽  
Cadmium Iron Selenide ◽  
Deposited Films

Cadmium iron selenide (Cd-Fe-Se) thin films were deposited onto tin oxide (SnO2) coated conducting glass substrates from an aqueous electrolytic bath containing CdSO4, FeSO4 and SeO2 by potentiostatic electrodeposition. The deposition potentials of Cadmium (Cd), Iron (Fe), Selenium (Se) and Cadmium-Iron-Selenide (Cd-Fe-Se) were determined from linear cathodic polarization curves. The deposited films were characterized by x-ray diffraction (XRD), scanning electron microscope (SEM), energy dispersive analysis by x-rays (EDX) and optical absorption techniques, respectively. X-ray diffraction patterns shows that the deposited films are found to be hexagonal structure with preferential orientation along (100) plane. The effect of FeSO4 concentration on structural, morphological, compositional and optical properties of the films are studied and discussed in detail.

Nanoscale determination of interatomic distance by ptychography-EXAFS method using advanced Kirkpatrick–Baez mirror focusing optics

2020 ◽  
Vol 27 (2) ◽  
pp. 455-461
Author(s):  
Makoto Hirose ◽  
Kei Shimomura ◽  
Takaya Higashino ◽  
Nozomu Ishiguro ◽  
Yukio Takahashi
Keyword(s):  
Wide Energy Range ◽  
X Rays ◽  
Bulk Materials ◽  
Interatomic Distances ◽  
X Ray ◽  
Combination Technique ◽  
Wide Energy ◽  
Diffraction Patterns ◽  
X Ray Absorption

This work demonstrates a combination technique of X-ray ptychography and the extended X-ray absorption fine structure (ptychography-EXAFS) method, which can determine the interatomic distances of bulk materials at the nanoscale. In the high-resolution ptychography-EXAFS method, it is necessary to use high-intense coherent X-rays with a uniform wavefront in a wide energy range, hence a ptychographic measurement system installed with advanced Kirkpatrick–Baez mirror focusing optics is developed and its performance is evaluated. Ptychographic diffraction patterns of micrometre-size MnO particles are collected by using this system at 139 energies between 6.504 keV and 7.114 keV including the Mn K absorption edge, and then the EXAFS of MnO is derived from the reconstructed images. By analyzing the EXAFS spectra obtained from a 48 nm × 48 nm region, the nanoscale bond lengths of the first and second coordination shells of MnO are determined. The present approach has great potential to elucidate the unclarified relationship among the morphology, electronic state and atomic arrangement of inhomogeneous bulk materials with high spatial resolution.

Protein Crystallography Using Capillary-Focused X-Rays

1996 ◽  
Vol 54 ◽  
pp. 238-239
Author(s):  
D. X. Balaic ◽  
Z. Barnea ◽  
K. A. Nugent ◽  
R. F. Garrett ◽  
J. N. Varghese ◽  
...  
Keyword(s):  
Fluorescence Analysis ◽  
Focal Region ◽  
X Rays ◽  
Glass Capillary ◽  
Synchrotron Source ◽  
X Ray ◽  
Exit Aperture ◽  
Egg White Lysozyme ◽  
Diffraction Patterns ◽  
Focused Beam

Tapered glass capillaries for X-ray beam concentration have been a topic of much interest for the synchrotron X-ray community in recent years. These optics have long held the promise of high-intensity microbeam generation for the “hard” X-ray energies used in crystallography and fluorescence analysis.X-ray concentration is achieved by exploiting the total external reflection property of glass surfaces for glancing angles of incidence. X-rays directed into the entrance aperture of the capillary are reflected toward an exit aperture of smaller dimensions, resulting in an increased X-ray flux per unit area at the exit aperture. Capillary designs with a true geometrical focus beyond the capillary exit are also possible.Our group has recently demonstrated a paraboloidally-tapered glass capillary optic which produced a focused X-ray beam using a monochromatised synchrotron source. The optic was designed to produce a focal region for singly-reflected X-rays at a point 40 mm from the end of the capillary. Such a focal region was observed, with a FWHM intensity gain of two orders of magnitude over the incident X-ray intensity from the channel-cut monochromator. Moreover, this gain was achieved for X-ray energies from 5 to 20 keV. We subsequently used a similar optic to obtain X-ray diffraction patterns from a crystal of hen egg-white lysozyme on image plates. The use of the capillary-focused beam yielded diffraction patterns 70 to 100 times faster than using an unfocused beam from the channel-cut monochromator alone. Placement of the crystal at different positions in the capillary-focused beam demonstrated the focusing of Bragg reflections and diffraction from a small volume of crystal.

A New Position Sensitive Detector for X-Ray Diffractometry

1992 ◽  
Vol 36 ◽  
pp. 617-622
Author(s):  
J. L. Radtke ◽  
D. W. Beard
Keyword(s):  
Position Sensitive Detector ◽  
Data Sets ◽  
X Rays ◽  
Sensitive Detector ◽  
Detector Performance ◽  
X Ray ◽  
Time Quantum ◽  
Position Sensitive ◽  
Diffraction Patterns ◽  
The Impact

AbstractPosition sensitive detectors provide efficient X-ray detection over large solid angles; this capability has revolutionized X-ray diffractometry by reducing data collection time. This paper describes testing of a new single-axis position sensitive detector designed to locate 0.6-2 Angstrom X-rays. Dead time, quantum efficiency, energy resolution, and spatial resolution were measured. Standard powder diffraction patterns were observed with the detector, and data sets are presented. The impact of detector performance parameters on diffraction experiments is discussed.

Developments in Analytical Diffraction Using Isotopic X-Ray Sources

1970 ◽  
Vol 14 ◽  
pp. 139-145
Author(s):  
W. S. Toothacker ◽  
L. E. Preuss
Keyword(s):  
Exposure Time ◽  
Specific Activity ◽  
X Rays ◽  
X Ray Diffraction ◽  
Glass Capillary ◽  
X Ray ◽  
Oak Ridge ◽  
Position Sensitive ◽  
Diffraction Patterns ◽  
Intense Source

AbstractLobov et al., in Leningrad, and workers at this laboratory have been working on the idea of using x rays from radioactive sources for x ray diffraction analysis. The Russians have been using iron-55 produced by the (n, Y) reaction in their work with a small focusing camera which operates in the back reflection region. We have been using iron-55 produced by the (p,n) reaction in conjunction with a small Debye-Scherrer camera. The preliminary work of this laboratory was reported at this conference two years ago. At that time a 13 mCi iron-55 source was used in a two inch diameter Debye-Scherrer camera to obtain x-ray diffraction patterns of LiF. The exposure times were of the order of 120 hours and the reflection from the 200 plane was about 3 degrees wide. Since that time a new and more intense source has been constructed at Oak Ridge National Laboratories. With the new source it was possible to produce LiF diffraction patterns of the same density and resolution as before in a period of less than ten hours.The above mentioned diffraction patterns were made with the LiF powder placed in a 1.0 mm diameter glass capillary. After reduction of the glass capillary diameter to 0.5 mm and appropriate reduction of the collimator width, we were able to improve the resolution considerably with no accompanying reduction in line density. The LiF patterns obtained in this way required an exposure time of about 20 hours and the width of the reflection from the 200 plane has been reduced to about 1.5 degrees.Hence we are able to report a reduction in exposure time from 116 hours to 20 hours and an increase in resolution by a factor of two over the data reported here two years ago. Thus the concept of using x rays from an isotope for powder diffraction has changed from a laboratory curiosity into a technique with practical possibilities. Both sources mentioned above were produced by the (p, n) reaction. The 135 mCi source had a specific activity of about 400 Ci/gm. Since iron-55 sources have been made with specific activities of about 1000 Ci/gm, a considerable decrease in exposure time could be accomplished by using such a source. The application to this work of a position sensitive proportional counter as developed by Semmler will also be discussed.

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