Characterization of Biodegradation of Fiber Cement Shingles by Scytonema Sp. Using Optical and Scanning Electron Microscopy

2001 ◽  
Vol 7 (S2) ◽  
pp. 472-473
Author(s):  
Barbara A. Reine ◽  
Colin Murphy
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Optical Microscopy ◽  
Visual Inspection ◽  
The Arctic ◽  
New Material ◽  
The Antarctic ◽  
Scanning Electron

Fiber cement roofing shingles from condominiums in Hawaii were examined for deterioration using optical and scanning electron microscopy. The product has a 50 year warranty and had been in service since 1994. Shingle samples were taken in August and September, 2000 after a growing volume of reports of roofing deterioration were received by the condominium association. Close-up visual inspection confirmed that the roof areas showing deterioration were covered with a black growth. Roofing samples from areas exhibiting deterioration, areas with no deterioration, and new material were compared by microscopy.Examination of the black growth by optical microscopy revealed it to be primarily the Cyanobacterium, Scytonema sp.This is a filamentous organism found from the Arctic to the Antarctic, and is common to Oahu and Maui.’ Other organisms observed to be present are Chroococus sp., Gloeocapsa sp., Aphanocapsa sp., Oscillatoria sp.,a very few Trebouxia sp.and lichens.

scholarly journals PRELIMINARY CHARACTERIZATION OF A CONTEMPORARY TEXTILE ART PIECE

2019 ◽  
Vol 2019 ◽  
pp. 212-215
Author(s):  
Elena-Cornelia MITRAN ◽  
Irina-Mariana SANDULACHE ◽  
Lucia-Oana SECAREANU ◽  
Ovidiu IORDACHE ◽  
Elena PERDUM ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Optical Microscopy ◽  
Present Article ◽  
Cotton Yarn ◽  
Lower Edge ◽  
Colored Cotton ◽  
Destructive Methods ◽  
Scanning Electron

The present article aims to make a preliminary analyze regarding the fibrous composition of an "opreg"(part of a female folk costume composed of a richly decorated piece of fabric and long fringes applied on the lower edge) from the modern-contemporary period, using two micro-destructive methods: Scanning Electron Microscopy (SEM) and optical microscopy. In order to have a better understanding and a precise result, different fibres from the opreg were analyzed- brightly colored cotton yarn (green, pink, lilac) together with synthetic silver and gold composite yarns (lurex). Hand-made textiles have a very important meaning for our history, therefore it is imperious to know what kind of fibres were used in order to be able to create an adequate environment to preserve them. Further analyzes will be carried out in order to have a more detailed image about opreg characteristics and how it was obtained.

Characterization of atmospheric aerosols in the Antarctic region using Raman Spectroscopy and Scanning Electron Microscopy

2022 ◽  
Vol 266 ◽  
pp. 120452
Author(s):  
César Marina-Montes ◽  
Luis V. Pérez-Arribas ◽  
Jesús Anzano ◽  
Silvia Fdez-Ortiz de Vallejuelo ◽  
Julene Aramendia ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Raman Spectroscopy ◽  
Atmospheric Aerosols ◽  
Antarctic Region ◽  
The Antarctic ◽  
Scanning Electron

scholarly journals Characterization of Pipe Bomb Fragments using Optical Microscopy and Scanning Electron Microscopy

2010 ◽  
Vol 16 (S2) ◽  
pp. 1570-1571
Author(s):  
MJ Platek ◽  
OJ Gregory ◽  
T Duarte ◽  
J Oxley ◽  
J Smith ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Optical Microscopy ◽  
Scanning Electron

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Characterization Of The film Of Ni-B Electroless on Steel S7, Through Optical Microscopy and Scanning Electron Microscopy.

2019 ◽  
Vol 3 (25) ◽  
pp. 117-122 ◽  
Author(s):  
Carlos Dominguez-Rios ◽  
Roal Torres-Sanchez ◽  
Alfredo Aguilar-Elguezabal
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Optical Microscopy ◽  
Scanning Electron

Digital imaging: When should one take the plunge?

1996 ◽  
Vol 54 ◽  
pp. 602-603
Author(s):  
John F. Mansfield
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Optical Microscopy ◽  
Digital Imaging ◽  
Storage Devices ◽  
Major Benefit ◽  
Transmission Electron ◽  
New Instrument ◽  
Scanning Electron

The current imaging trend in optical microscopy, scanning electron microscopy (SEM) or transmission electron microscopy (TEM) is to record all data digitally. Most manufacturers currently market digital acquisition systems with their microscope packages. The advantages of digital acquisition include: almost instant viewing of the data as a high-quaity positive image (a major benefit when compared to TEM images recorded onto film, where one must wait until after the microscope session to develop the images); the ability to readily quantify features in the images and measure intensities; and extremely compact storage (removable 5.25” storage devices which now can hold up to several gigabytes of data).The problem for many researchers, however, is that they have perfectly serviceable microscopes that they routinely use that have no digital imaging capabilities with little hope of purchasing a new instrument.

Investigation of Die Tilting of Packages with Single and Multi-chips

2018 ◽  
Author(s):  
Lo Chea Wee ◽  
Tan Sze Yee ◽  
Gan Sue Yin ◽  
Goh Cin Sheng
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Electron Beam ◽  
Optical Microscopy ◽  
Device Performance ◽  
Electronic Components ◽  
Area Of Interest ◽  
On Chip ◽  
Scanning Electron

Abstract Advanced package technology often includes multi-chips in one package to accommodate the technology demand on size & functionality. Die tilting leads to poor device performance for all kinds of multi-chip packages such as chip by chip (CbC), chip on chip (CoC), and the package with both CbC and CoC. Traditional die tilting measured by optical microscopy and scanning electron microscopy has capability issue due to wave or electron beam blocking at area of interest by electronic components nearby. In this paper, the feasibility of using profilemeter to investigate die tilting in single and multi-chips is demonstrated. Our results validate that the profilemeter is the most profound metrology for die tilting analysis especially on multi-chip packages, and can achieve an accuracy of <2μm comparable to SEM.

Isolasi Dan Karakterisasi Bentonit Alam Menjadi Nanopartikel Monmorillonit

2018 ◽  
Vol 3 (1) ◽  
pp. 12 ◽  
Author(s):  
Zaimahwati Zaimahwati ◽  
Yuniati Yuniati ◽  
Ramzi Jalal ◽  
Syahman Zhafiri ◽  
Yuli Yetri
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Particle Size ◽  
Surface Morphology ◽  
Average Diameter ◽  
Particle Size Analyzer ◽  
Ft Ir ◽  
Scanning Electron ◽  
Sedimentation Processes

<p>Pada penelitian ini telah dilakukan isolasi dan karakterisasi bentonit alam menjadi nanopartikel montmorillonit. Bentonit alam yang digunakan diambil dari desa Blangdalam, Kecamatan Nisam Kabupaten Aceh Utara.  Proses isolasi meliputi proses pelarutan dengan aquades, ultrasonic dan proses sedimentasi. Untuk mengetahui karakterisasi montmorillonit dilakukan uji FT-IR, X-RD dan uji morfologi permukaan dengan Scanning Electron Microscopy (SEM). Partikel size analyzer untuk menganalisis dan menentukan ukuran nanopartikel dari isolasi bentonit alam. Dari hasil penelitian didapat ukuran nanopartikel montmorillonit hasil isolasi dari bentonit alam diperoleh berdiameter rata-rata 82,15 nm.</p><p><em>In this research we have isolated and characterized natural bentonite into montmorillonite nanoparticles. Natural bentonite used was taken from Blangdalam village, Nisam sub-district, North Aceh district. The isolation process includes dissolving process with aquades, ultrasonic and sedimentation processes.  The characterization of montmorillonite, FT-IR, X-RD and surface morphology test by Scanning Electron Microscopy (SEM). Particle size analyzer to analyze and determine the size of nanoparticles from natural bentonite insulation. From the research results obtained the size of montmorillonite nanoparticles isolated from natural bentonite obtained an average diameter of 82.15 nm.</em></p>

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