scholarly journals Hard X-ray In-situ Full-field Microscopy for Material Science Applications.

2018 ◽  
Vol 24 (S2) ◽  
pp. 552-553 ◽  
Author(s):  
Irina Snigireva ◽  
Ken Vidar Falch ◽  
Daniele Casari ◽  
Marco Di Michiel ◽  
Carsten Detlefs ◽  
...  
Keyword(s):  
2018 ◽  
Vol 167 ◽  
pp. 03001 ◽  
Author(s):  
Przemyslaw Wachulak ◽  
Alfio Torrisi ◽  
Mesfin Ayele ◽  
Andrzej Bartnik ◽  
Joanna Czwartos ◽  
...  

In this work we present three experimental, compact desk-top imaging systems: SXR and EUV full field microscopes and the SXR contact microscope. The systems are based on laser-plasma EUV and SXR sources based on a double stream gas puff target. The EUV and SXR full field microscopes, operating at 13.8 nm and 2.88 nm wavelengths are capable of imaging nanostructures with a sub-50 nm spatial resolution and short (seconds) exposure times. The SXR contact microscope operates in the “water-window” spectral range and produces an imprint of the internal structure of the imaged sample in a thin layer of SXR sensitive photoresist. Applications of such desk-top EUV and SXR microscopes, mostly for biological samples (CT26 fibroblast cells and Keratinocytes) are also presented. Details about the sources, the microscopes as well as the imaging results for various objects will be presented and discussed. The development of such compact imaging systems may be important to the new research related to biological, material science and nanotechnology applications.


2016 ◽  
Vol 52 (6) ◽  
pp. 3497-3507 ◽  
Author(s):  
Ken Vidar Falch ◽  
Daniele Casari ◽  
Marco Di Michiel ◽  
Carsten Detlefs ◽  
Anatoly Snigireva ◽  
...  

2001 ◽  
Vol 678 ◽  
Author(s):  
Th. Schedel-Niedrig ◽  
M. Hävecker ◽  
A. Knop-Gericke ◽  
P. Reinke ◽  
R. Schlögl ◽  
...  

AbstractAn instrument equipped with total electron yield detectors was designed and constructed for in situ X-ray absorption spectroscopy (XAS) investigations in the soft X-ray range (100 eV ≤ hν ≤ 1000 eV) at elevated pressures (mbar range) and sample temperatures (T ≤ 1000 K) [1]. This allows, for the first time, XAS studies in a surface-sensitive mode of the light elements (Z = 3-15). Furthermore, the gas phase XAS and the surface-related XAS of the solid state phase can be collected simultaneously in order to correlate the gas/solid reaction rate with the surface electronic structure under working conditions in a flow-through mode.The novel experimental tool represents a contribution to the experimental overcoming of the “pressure gap” in material science. In this work examples are presented belonging to the field of heterogeneous catalysis [2-4] and to the reactivity of diamond surfaces [5]. Additionally, prospects for in situ studies in material science will be given.


2015 ◽  
Vol 21 (2) ◽  
pp. 290-297 ◽  
Author(s):  
Andrew M. Kiss ◽  
William M. Harris ◽  
Arata Nakajo ◽  
Steve Wang ◽  
Joan Vila-Comamala ◽  
...  

AbstractThe oxidation of nickel powder under a controlled gas and temperature environment was studied using synchrotron-based full-field transmission X-ray microscopy. The use of this technique allowed for the reaction to be imaged in situ at 55 nm resolution. The setup was designed to fit in the limited working distance of the microscope and to provide the gas and temperature environments analogous to solid oxide fuel cell operating conditions. Chemical conversion from nickel to nickel oxide was confirmed using X-ray absorption near-edge structure. Using an unreacted core model, the reaction rate as a function of temperature and activation energy were calculated. This method can be applied to study many other chemical reactions requiring similar environmental conditions.


2013 ◽  
Vol 102 (5) ◽  
pp. 053902 ◽  
Author(s):  
Andrew M. Kiss ◽  
William M. Harris ◽  
Steve Wang ◽  
Joan Vila-Comamala ◽  
Alex Deriy ◽  
...  

2014 ◽  
Vol 629-630 ◽  
pp. 121-129
Author(s):  
Chen Chun ◽  
Ya Mei Zhang ◽  
Rui Xing Wang ◽  
Jie Yang

Scanning electron microscope, differential thermal analysis, thermo-gravimetric analysis, fluorescent analysis and X-ray CT et.al. have become usual means used in the research of concrete material science. This paper proposed a new method to evaluate the causes of cracking of in-situ concrete based on the investigation by using these comprehensive technologies for analysis of micro-structure. The proposed new method is more reliable and objective than the traditional method which is mainly based on experience and chemical analysis. A case investigation using the new method to explore the causes of cracking in a real project was introduced.


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